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    • 3. 发明授权
    • Phase detection circuits and methods
    • 相位检测电路及方法
    • US09148156B2
    • 2015-09-29
    • US13519302
    • 2010-12-30
    • Farshid AryanfarHae-Chang LeeCarl Werner
    • Farshid AryanfarHae-Chang LeeCarl Werner
    • G01R25/00H03D13/00H03L7/085H03L7/081
    • H03L7/085G01R25/00H03D13/00H03L7/0816
    • A phase detector circuit compares the phases of first and second periodic input signals to generate an output signal. The phase detector includes a circuit that makes two different combinations of the first and the second periodic input signals to generate third and fourth periodic signals. This circuit causes the third periodic signal to be based on a first combination of the first periodic signal and the second periodic signal that imparts a first relative phase shift. The circuit causes the fourth periodic signal to be based on a second combination of the first periodic signal and the second periodic signal to provide a different relative phase shift. The phase detector also includes a comparison circuit that compares a measure of the power of the third periodic signal to a measure of the power of the fourth periodic signal to generate the phase comparison output signal.
    • 相位检测器电路比较第一和第二周期性输入信号的相位以产生输出信号。 相位检测器包括使第一和第二周期性输入信号的两个不同组合产生第三和第四周期信号的电路。 该电路使得第三周期信号基于第一周期信号和施加第一相对相移的第二周期信号的第一组合。 电路使得第四周期信号基于第一周期信号和第二周期信号的第二组合,以提供不同的相对相移。 相位检测器还包括比较电路,其将第三周期信号的功率的测量与第四周期信号的功率的测量进行比较,以产生相位比较输出信号。
    • 4. 发明申请
    • Clock distribution network supporting low-power mode
    • 时钟分配网络支持低功耗模式
    • US20070146038A1
    • 2007-06-28
    • US11318290
    • 2005-12-22
    • Carl WernerEly Tsern
    • Carl WernerEly Tsern
    • G06F1/04
    • G06F1/04
    • A clock distribution network locks a local clock signal to a reference clock signal using a first feedback loop associated with a synchronization circuit (e.g., a PLL or a DLL). The local clock signal can then be selectively distributed to a plurality of clock destination nodes via a clock network. Clock distribution may be disabled as needed to save power. The first feedback loop is active irrespective of whether clock distribution is enabled. The delay through the clock network may drift due to temperature and supply-voltage fluctuations, which introduces phase errors in the distributed clock signals. A second feedback loop is activated when clock distribution is enabled to compensate for this drift.
    • 时钟分配网络使用与同步电路(例如,PLL或DLL)相关联的第一反馈回路将本地时钟信号锁定到参考时钟信号。 然后可以经由时钟网络选择性地将本地时钟信号分配给多个时钟目的地节点。 可根据需要禁用时钟分配以节省电量。 无论时钟分配是否启用,第一个反馈回路都处于活动状态。 通过时钟网络的延迟可能由于温度和电源电压波动而漂移,这引起了分布式时钟信号中的相位误差。 当启用时钟分配来补偿此漂移时,第二个反馈环路被激活。
    • 9. 发明申请
    • Built-in self-testing of multilevel signal interfaces
    • 内置多电平信号接口的自检
    • US20060242483A1
    • 2006-10-26
    • US11433409
    • 2006-05-12
    • Carl WernerJared ZerbeWilliam Stonecypher
    • Carl WernerJared ZerbeWilliam Stonecypher
    • G01R31/28
    • G11C11/56G01R31/31715G11C11/22G11C16/04G11C29/00G11C29/50G11C2029/5004
    • Error detection mechanisms for signal interfaces, including built-in self-test (BIST) mechanisms for testing multilevel signal interfaces. The error detection mechanisms are provided in an integrated circuit (IC) chip that contains at least one of the signal interfaces or are coupled to the interfaces on a printed circuit board (PCB). BIST mechanisms may include, for example, test signal generators and mechanisms for determining whether the test signals generated are accurately transmitted and received by the interface. The BIST mechanisms may check a single input/output interface, a group of interfaces or may operate with a master device that tests a plurality of interfaces by sending test signals for storage by and retrieval from one or more slave memory devices. The error detection mechanisms test memory circuits designed to communicate according to multi-PAM signals over printed circuit boards.
    • 用于信号接口的错误检测机制,包括用于测试多电平信号接口的内置自检(BIST)机制。 误差检测机构提供在集成电路(IC)芯片中,该集成电路(IC)芯片包含至少一个信号接口或耦合到印刷电路板(PCB)上的接口。 BIST机制可以包括例如测试信号发生器和用于确定生成的测试信号是否被接口准确地发送和接收的机制。 BIST机制可以检查单个输入/输出接口,一组接口,或者可以通过发送用于由一个或多个从属存储器设备存储和检索的测试信号来测试多个接口的主设备进行操作。 错误检测机构根据印刷电路板上的多PAM信号测试设计用于通信的存储器电路。