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    • 3. 发明申请
    • Built-in self-testing of multilevel signal interfaces
    • 内置多电平信号接口的自检
    • US20060242483A1
    • 2006-10-26
    • US11433409
    • 2006-05-12
    • Carl WernerJared ZerbeWilliam Stonecypher
    • Carl WernerJared ZerbeWilliam Stonecypher
    • G01R31/28
    • G11C11/56G01R31/31715G11C11/22G11C16/04G11C29/00G11C29/50G11C2029/5004
    • Error detection mechanisms for signal interfaces, including built-in self-test (BIST) mechanisms for testing multilevel signal interfaces. The error detection mechanisms are provided in an integrated circuit (IC) chip that contains at least one of the signal interfaces or are coupled to the interfaces on a printed circuit board (PCB). BIST mechanisms may include, for example, test signal generators and mechanisms for determining whether the test signals generated are accurately transmitted and received by the interface. The BIST mechanisms may check a single input/output interface, a group of interfaces or may operate with a master device that tests a plurality of interfaces by sending test signals for storage by and retrieval from one or more slave memory devices. The error detection mechanisms test memory circuits designed to communicate according to multi-PAM signals over printed circuit boards.
    • 用于信号接口的错误检测机制,包括用于测试多电平信号接口的内置自检(BIST)机制。 误差检测机构提供在集成电路(IC)芯片中,该集成电路(IC)芯片包含至少一个信号接口或耦合到印刷电路板(PCB)上的接口。 BIST机制可以包括例如测试信号发生器和用于确定生成的测试信号是否被接口准确地发送和接收的机制。 BIST机制可以检查单个输入/输出接口,一组接口,或者可以通过发送用于由一个或多个从属存储器设备存储和检索的测试信号来测试多个接口的主设备进行操作。 错误检测机构根据印刷电路板上的多PAM信号测试设计用于通信的存储器电路。
    • 8. 发明申请
    • METHOD AND APPARATUS FOR EVALUATING AND OPTIMIZING A SIGNALING SYSTEM
    • 用于评估和优化信号系统的方法和装置
    • US20060236183A1
    • 2006-10-19
    • US11422474
    • 2006-06-06
    • Jared ZerbePak ChauWilliam Stonecypher
    • Jared ZerbePak ChauWilliam Stonecypher
    • G06F11/00G01R31/28
    • G01R31/31717G01R31/31703G01R31/3183G06F11/221H04B3/32
    • A method and apparatus for evaluating and optimizing a signaling system is described. A pattern of test information is generated in a transmit circuit of the system and is transmitted to a receive circuit. A similar pattern of information is generated in the receive circuit and used as a reference. The receive circuit compares the patterns. Any differences between the patterns are observable. In one embodiment, a linear feedback shift register (LFSR) is implemented to produce patterns. An embodiment of the present disclosure may be practiced with various types of signaling systems, including those with single-ended signals and those with differential signals. An embodiment of the present disclosure may be applied to systems communicating a single bit of information on a single conductor at a given time and to systems communicating multiple bits of information on a single conductor simultaneously.
    • 描述了用于评估和优化信令系统的方法和装置。 在系统的发送电路中产生测试信息的模式,并将其发送到接收电路。 在接收电路中产生类似的信息模式并用作参考。 接收电路比较图案。 模式之间的任何差异是可观察的。 在一个实施例中,实现线性反馈移位寄存器(LFSR)以产生模式。 本公开的实施例可以用各种类型的信令系统来实施,包括具有单端信号和具有差分信号的信令系统。 本公开的实施例可以应用于在给定时间在单个导体上传送单个信息位的系统以及同时在单个导体上传送多个信息位的系统。