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    • 2. 发明申请
    • System for Sensing a Sample
    • 感应样品系统
    • US20060230819A1
    • 2006-10-19
    • US11423098
    • 2006-06-08
    • Thomas McWaidPeter PanagasSteven EatonAmin SamsavarWilliam Wheeler
    • Thomas McWaidPeter PanagasSteven EatonAmin SamsavarWilliam Wheeler
    • G01B5/28
    • G01B3/008G01B7/34G01Q10/06G01Q60/34Y10S977/851
    • A profiler or scanning probe microscope may be scanned across a sample surface with a distance between them controlled to allow the sensing tip to contact the surface intermittently in order to find and measure features of interest. The distance is controlled so that when the sensing tip is raised or lowered to touch the sample surface, there is no lateral relative motion between the tip and the sample. This prevents tip damage. Prior knowledge of the height distribution of the sample surface may be provided or measured and used for positioning the sensing tip initially or in controlling the separation to avoid lateral contact between the tip and the sample. The process may also be performed in two parts: a fast find mode to find the features and a subsequent measurement mode to measure the features. A quick step mode may also be performed by choosing steps of lateral relative motion to be smaller than 100 nanometers to reduce probability of tip damage. In this mode, after each vertical step to increase the separation between the tip and the sample, it is detected as to whether the tip and the sample are in contact. If they are still in contact after the vertical step, one or more vertical steps are taken to increase the separation, and no vertical step to reduce the separation is taken and no lateral relative motion is caused until it is determined that the tip and the sample are no longer in contact.
    • 扫描仪或扫描探针显微镜可以跨样品表面进行扫描,其间的距离被控制以允许感测尖端间歇地接触表面,以便找到并测量感兴趣的特征。 控制距离使得当感测尖端升高或降低以接触样品表面时,尖端和样品之间没有横向相对运动。 这可以防止尖端损坏。 可以提供或测量样品表面的高度分布的先前知识并且用于最初定位感测尖端或者用于控制分离以避免尖端和样品之间的横向接触。 该过程也可以分两部分执行:快速查找模式以查找特征,以及随后的测量模式来测量特征。 还可以通过选择横向相对运动的步骤来小于100纳米,以减少尖端损伤的可能性来执行快速步进模式。 在该模式中,在每个垂直步骤之后,增加尖端和样品之间的间隔,检测尖端和样品是否接触。 如果它们在垂直步骤之后仍然接触,则采取一个或多个垂直步骤来增加分离,并且不采取垂直步骤来减小分离,并且不会引起横向相对运动,直到确定尖端和样品 不再联系。
    • 3. 发明申请
    • System for sensing a sample
    • 用于感测样品的系统
    • US20050262931A1
    • 2005-12-01
    • US11192808
    • 2005-07-28
    • Thomas McWaidPeter PanagasSteven EatonAmin SamsavarWilliam Wheeler
    • Thomas McWaidPeter PanagasSteven EatonAmin SamsavarWilliam Wheeler
    • G01Q70/08G01B3/00G01B5/28G01B7/34G01B21/20G01B21/30G01Q10/00G01Q10/02G01Q10/04G01Q10/06G01Q60/38G01Q70/00G01Q70/06G01Q70/12G01Q90/00G01N13/10
    • G01B3/008G01B7/34G01Q10/06G01Q60/34Y10S977/851
    • A profiler or scanning probe microscope may be scanned across a sample surface with a distance between them controlled to allow the sensing tip to contact the surface intermittently in order to find and measure features of interest. The distance is controlled so that when the sensing tip is raised or lowered to touch the sample surface, there is no lateral relative motion between the tip and the sample. This prevents tip damage. Prior knowledge of the height distribution of the sample surface may be provided or measured and used for positioning the sensing tip initially or in controlling the separation to avoid lateral contact between the tip and the sample. The process may also be performed in two parts: a fast find mode to find the features and a subsequent measurement mode to measure the features. A quick step mode may also be performed by choosing steps of lateral relative motion to be smaller than 100 nanometers to reduce probability of tip damage. In this mode, after each vertical step to increase the separation between the tip and the sample, it is detected as to whether the tip and the sample are in contact. If they are still in contact after the vertical step, one or more vertical steps are taken to increase the separation, and no vertical step to reduce the separation is taken and no lateral relative motion is caused until it is determined that the tip and the sample are no longer in contact.
    • 扫描仪或扫描探针显微镜可以跨样品表面进行扫描,其间的距离被控制以允许感测尖端间歇地接触表面,以便找到并测量感兴趣的特征。 控制距离使得当感测尖端升高或降低以接触样品表面时,尖端和样品之间没有横向相对运动。 这可以防止尖端损坏。 可以提供或测量样品表面的高度分布的先前知识并且用于最初定位感测尖端或者用于控制分离以避免尖端和样品之间的横向接触。 该过程也可以分两部分执行:快速查找模式以查找特征,以及随后的测量模式来测量特征。 还可以通过选择横向相对运动的步骤来小于100纳米,以减少尖端损伤的可能性来执行快速步进模式。 在该模式中,在每个垂直步骤之后,增加尖端和样品之间的间隔,检测尖端和样品是否接触。 如果它们在垂直步骤之后仍然接触,则采取一个或多个垂直步骤来增加分离,并且不采取垂直步骤来减小分离,并且不会引起横向相对运动,直到确定尖端和样品 不再联系。
    • 6. 发明授权
    • Cross circulation mail sorter stacker design with dual ported input, and method of operating the same
    • 具有双端口输入的交叉流通邮件分拣机堆垛机设计及其操作方法
    • US07414218B2
    • 2008-08-19
    • US10918601
    • 2004-08-16
    • William WheelerWillson L. Mayerberg, II
    • William WheelerWillson L. Mayerberg, II
    • B07C5/00
    • B07C3/02Y10S209/90
    • A new and improved mail sorting system, which is able to dramatically increase the throughput sorting volume of mail pieces or articles, comprises the incorporation of a plurality of cross-circulation path (CCP) conveyors within a conventional looped or folded conveyor belt system whereby, in effect, mail pieces or articles can be effectively removed from primary conveyor flow path sections so as to create gaps or spaces upon the primary conveyor flow path sections into which additional mail pieces or articles can be introduced through means of a second input or infeed port. In addition, a plurality of the new and improved mail sorting systems can be integrated together into a multi-system mail sorting system wherein off-shoot or auxiliary outfeed conveyor belt sections can feed pieces or articles of mail from any particular one of the mail sorting systems to the second input or infeed ports of the other mail sorting systems so as to render the overall system still more efficient.
    • 新的和改进的邮件分类系统能够显着增加邮件片或物品的吞吐量分选体积,包括在传统的环绕或折叠的传送带系统内并入多个交叉循环路径(CCP)输送机, 实际上,邮件或物品可以有效地从一次输送机流路部分移除,以便在一次输送机流路部分上产生间隙或空间,借助于第二输入或进给端口可以向其中引入附加邮件或物品 。 此外,多个新的和改进的邮件分类系统可以集成在一起成为多系统邮件分类系统,其中,离线或辅助输出输送带段可以从任何特定的邮件分类 系统到其他邮件分拣系统的第二输入或进给端口,以使整个系统仍然更有效率。