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    • 1. 发明授权
    • Method and apparatus for limiting access to an integrated circuit (IC)
    • 用于限制对集成电路(IC)的访问的方法和装置
    • US09046570B2
    • 2015-06-02
    • US13566363
    • 2012-08-03
    • Alfredo OlmosJames R. FeddelerMiten H. NagdaStefano Pietri
    • Alfredo OlmosJames R. FeddelerMiten H. NagdaStefano Pietri
    • G01R23/14G01R31/317
    • G06F21/81G01R31/31719G06F1/14G06F1/28
    • A method and apparatus for limiting access to an integrated circuit (IC) upon detection of abnormal conditions is provided. At least one of abnormal voltage detection, abnormal temperature detection, and abnormal clock detection are provided with low power consumption. Both abnormally low and abnormally high parameter values (e.g. abnormally low or high voltage, temperature, or clock frequency) may be detected. Abnormal clock detection may also detect a stopped clock signal, including a clock signal stopped at a low logic level or at a high logic level. Furthermore, abnormal clock detection may detect an abnormal duty cycle of a clock signal. A sampled bandgap reference may be used to provide accurate voltage and current references while consuming a minimal amount of power. Upon detection of an abnormal parameter value, one or more tamper indications may be provided to initiate tampering countermeasures, such as limiting access to the IC.
    • 提供了一种在检测到异常状况时限制对集成电路(IC)的访问的方法和装置。 以低功耗提供异常电压检测,异常温度检测和异常时钟检测中的至少一种。 可以检测异常低和异常高的参数值(例如异常低或高电压,温度或时钟频率)。 异常时钟检测还可以检测停止的时钟信号,包括以低逻辑电平或高逻辑电平停止的时钟信号。 此外,异常时钟检测可以检测时钟信号的异常占空比。 采样的带隙基准可用于提供精确的电压和电流参考,同时消耗最小的功率。 当检测到异常参数值时,可以提供一个或多个篡改指示以启动篡改对策,例如限制对IC的访问。
    • 2. 发明申请
    • METHOD AND APPARATUS FOR LIMITING ACCESS TO AN INTEGRATED CIRCUIT (IC)
    • 限制访问集成电路(IC)的方法和装置
    • US20140035560A1
    • 2014-02-06
    • US13566363
    • 2012-08-03
    • Alfredo OlmosJames R. FeddelerMiten H. NagdaStefano Pietri
    • Alfredo OlmosJames R. FeddelerMiten H. NagdaStefano Pietri
    • G01R23/14
    • G06F21/81G01R31/31719G06F1/14G06F1/28
    • A method and apparatus for limiting access to an integrated circuit (IC) upon detection of abnormal conditions is provided. At least one of abnormal voltage detection, abnormal temperature detection, and abnormal clock detection are provided with low power consumption. Both abnormally low and abnormally high parameter values (e.g. abnormally low or high voltage, temperature, or clock frequency) may be detected. Abnormal clock detection may also detect a stopped clock signal, including a clock signal stopped at a low logic level or at a high logic level. Furthermore, abnormal clock detection may detect an abnormal duty cycle of a clock signal. A sampled bandgap reference may be used to provide accurate voltage and current references while consuming a minimal amount of power. Upon detection of an abnormal parameter value, one or more tamper indications may be provided to initiate tampering countermeasures, such as limiting access to the IC.
    • 提供了一种在检测到异常状况时限制对集成电路(IC)的访问的方法和装置。 以低功耗提供异常电压检测,异常温度检测和异常时钟检测中的至少一种。 可以检测异常低和异常高的参数值(例如异常低或高电压,温度或时钟频率)。 异常时钟检测还可以检测停止的时钟信号,包括以低逻辑电平或高逻辑电平停止的时钟信号。 此外,异常时钟检测可以检测时钟信号的异常占空比。 采样的带隙基准可用于提供精确的电压和电流参考,同时消耗最小的功率。 在检测到异常参数值时,可以提供一个或多个篡改指示以启动篡改对策,例如限制对IC的访问。
    • 5. 发明申请
    • PROGRAMMABLE TEMPERATURE SENSING CIRCUIT FOR AN INTEGRATED CIRCUIT
    • 用于集成电路的可编程温度感测电路
    • US20120242398A1
    • 2012-09-27
    • US13052891
    • 2011-03-21
    • Alfredo OlmosStefano PietriRicardo P. Coimbra
    • Alfredo OlmosStefano PietriRicardo P. Coimbra
    • H03K3/011
    • G01K7/01
    • A programmable temperature sensing circuit includes a comparator, first and second CTAT sensing elements, first and second PTAT reference circuits, and a selection circuit. When a selection signal is a first logic state, an output terminal of the first PTAT reference circuit is coupled to the second CTAT temperature sensing element for providing a first threshold voltage to the second input of the comparator. When the selection signal is a second logic state different from the first logic state, a series-connection of the first PTAT reference circuit and the second PTAT reference circuit are coupled to the second CTAT temperature sensing element for providing a second threshold voltage to the second input of the comparator. The comparator provides an output voltage indication when a voltage provided by the first CTAT sensing element compares favorably with the selected one of the first or second threshold voltages.
    • 可编程温度感测电路包括比较器,第一和第二CTAT感测元件,第一和第二PTAT参考电路以及选择电路。 当选择信号是第一逻辑状态时,第一PTAT参考电路的输出端耦合到第二CTAT温度感测元件,用于向比较器的第二输入提供第一阈值电压。 当选择信号是与第一逻辑状态不同的第二逻辑状态时,第一PTAT参考电路和第二PTAT参考电路的串联连接耦合到第二CTAT温度感测元件,以向第二逻辑状态提供第二阈值电压 输入比较器。 当由第一CTAT感测元件提供的电压与所选择的第一或第二阈值电压中的一个相比较时,比较器提供输出电压指示。
    • 6. 发明授权
    • Touch panel detection circuitry and method of operation
    • 触摸屏检测电路及操作方法
    • US07868877B2
    • 2011-01-11
    • US11874400
    • 2007-10-18
    • Stefano PietriSheng LinAlfredo OlmosDavid R. Tipple
    • Stefano PietriSheng LinAlfredo OlmosDavid R. Tipple
    • G06F3/045
    • G06F3/045G06F3/0416
    • A touch panel detection circuit includes current limiting circuitry that has a first portion coupled between a first supply voltage terminal and a first input node and a second portion coupled between a second input node and a second supply voltage terminal. Programmable precharge circuitry connects the first input node to the first supply voltage terminal via a conductive path that is in parallel with the first portion of the current limiting circuitry and precharges the first input node to a predetermined voltage. Comparison circuitry is coupled to the programmable precharge circuitry and to the first input node. The comparison circuitry detects a change in resistance between the first input node and the second input node and provides a signal in response thereto when the comparison circuitry is enabled by the programmable precharge circuitry.
    • 触摸面板检测电路包括限流电路,其具有耦合在第一电源电压端子和第一输入节点之间的第一部分和耦合在第二输入节点和第二电源电压端子之间的第二部分。 可编程预充电电路经由与限流电路的第一部分并联并将第一输入节点预充电到预定电压的导电路径将第一输入节点连接到第一电源电压端。 比较电路耦合到可编程预充电电路和第一输入节点。 当比较电路由可编程预充电电路使能时,比较电路检测第一输入节点和第二输入节点之间的电阻变化并提供响应于此的信号。
    • 7. 发明授权
    • Device and technique for transistor well biasing
    • 晶体管阱偏置的器件和技术
    • US08164378B2
    • 2012-04-24
    • US12115825
    • 2008-05-06
    • Stefano PietriAlfredo OlmosJehoda RefaeliJefferson Daniel de Barros Soldera
    • Stefano PietriAlfredo OlmosJehoda RefaeliJefferson Daniel de Barros Soldera
    • H03K3/01H03K17/00
    • H03K5/2472G05F3/205G05F3/24H03K2217/0018
    • A method includes receiving a set of voltages comprising at least a first voltage, a second voltage, and a third voltage and biasing a well of a transistor based on the extreme voltage of the set of voltages. Biasing the well of the transistor can include concurrently providing a first signal and a second signal based on a comparison of the first voltage and the second voltage and selectively coupling the well of the transistor to a source of the extreme voltage of the set of voltages based on the first signal, the second signal, and the third voltage. An electronic device comprises a transistor and a power switching module. The power switching module includes a set of inputs, each input configured to receive a corresponding one of a set of voltages comprising at least a first voltage, a second voltage, and a third voltage, and includes an output coupled to a well of the transistor, the output configured to provide the extreme voltage of the set of voltages.
    • 一种方法包括接收包括至少第一电压,第二电压和第三电压的一组电压,并且基于该组电压的极限电压来偏置晶体管的阱。 偏置晶体管的阱可以包括基于第一电压和第二电压的比较同时提供第一信号和第二信号,并且选择性地将晶体管的阱耦合到该组电压的极值电压的源 第一信号,第二信号和第三电压。 电子设备包括晶体管和电源切换模块。 功率切换模块包括一组输入,每个输入被配置为接收包括至少第一电压,第二电压和第三电压的一组电压中的对应的一个,并且包括耦合到晶体管的阱的输出 ,所述输出被配置为提供所述一组电压的极限电压。
    • 8. 发明申请
    • TOUCH PANEL DETECTION CIRCUITRY AND METHOD OF OPERATION
    • 触控面板检测电路和操作方法
    • US20090102802A1
    • 2009-04-23
    • US11874400
    • 2007-10-18
    • Stefano PietriSheng LinAlfredo OlmosDavid R. Tipple
    • Stefano PietriSheng LinAlfredo OlmosDavid R. Tipple
    • G06F3/041
    • G06F3/045G06F3/0416
    • A touch panel detection circuit includes current limiting circuitry that has a first portion coupled between a first supply voltage terminal and a first input node and a second portion coupled between a second input node and a second supply voltage terminal. Programmable precharge circuitry connects the first input node to the first supply voltage terminal via a conductive path that is in parallel with the first portion of the current limiting circuitry and precharges the first input node to a predetermined voltage. Comparison circuitry is coupled to the programmable precharge circuitry and to the first input node. The comparison circuitry detects a change in resistance between the first input node and the second input node and provides a signal in response thereto when the comparison circuitry is enabled by the programmable precharge circuitry.
    • 触摸面板检测电路包括限流电路,其具有耦合在第一电源电压端子和第一输入节点之间的第一部分和耦合在第二输入节点和第二电源电压端子之间的第二部分。 可编程预充电电路经由与限流电路的第一部分并联并将第一输入节点预充电到预定电压的导电路径将第一输入节点连接到第一电源电压端。 比较电路耦合到可编程预充电电路和第一输入节点。 当比较电路由可编程预充电电路使能时,比较电路检测第一输入节点和第二输入节点之间的电阻变化并提供响应于此的信号。
    • 9. 发明申请
    • LOW POWER VOLTAGE REFERENCE
    • 低功率电压参考
    • US20080218253A1
    • 2008-09-11
    • US11681067
    • 2007-03-01
    • STEFANO PIETRIJader Alves De Lima FilhoAlfredo Olmos
    • STEFANO PIETRIJader Alves De Lima FilhoAlfredo Olmos
    • G05F1/10
    • G05F3/262G05F3/245
    • A voltage reference includes a first cell configured to receive a first proportional to absolute temperature (PTAT) current and a second cell configured to receive a second PTAT current. The first cell includes a diode-connected stack of insulated-gate field-effect transistors (IGFETs). The diode-connected stack of IGFETs includes a first transistor that is configured to be biased in a triode weak inversion region. The second cell includes a diode-connected stack of IGFETs and a serially coupled resistor. A magnitude of the second PTAT current is based on a drain-to-source voltage of the first transistor and a value of the serially coupled resistor. The voltage reference provides a reference voltage at a reference node of the second cell based on the second PTAT current.
    • 电压基准包括被配置为接收第一与绝对温度(PTAT)成比例的电流的第一单元和被配置为接收第二PTAT电流的第二单元。 第一个单元包括二极管连接的绝缘栅场效应晶体管(IGFET)堆叠。 IGFET的二极管连接的堆叠包括被配置为偏置在三极管弱反转区域中的第一晶体管。 第二单元包括二极管连接的IGFET堆叠和串联电阻器。 第二PTAT电流的大小基于第一晶体管的漏极 - 源极电压和串联电阻器的值。 电压参考基于第二PTAT电流在第二单元的参考节点处提供参考电压。
    • 10. 发明授权
    • Touch screen detection and diagnostics
    • 触摸屏检测和诊断
    • US08487884B2
    • 2013-07-16
    • US12145004
    • 2008-06-24
    • Marcos Augusto De GoesAlfredo OlmosStefano Pietri
    • Marcos Augusto De GoesAlfredo OlmosStefano Pietri
    • G06F3/041
    • G06F3/0416
    • A method includes driving a current through a touch screen that is based on contact of the touch screen, generating a proportional second current, and detecting contact of the touch screen from the second current. Another method includes providing a touch screen with parallel plates, disabling contact detection when a plate voltage is lower than a threshold voltage, and enabling contact detection when the plate voltage is at least equal to the threshold voltage. A device includes a first node and a second node coupled to a touch screen, a third node, a first current mirror coupled to the second node and the third node configured to generate a current at the third node that is proportional to a second current at the second node, and a detection circuit that provides a signal based on the first current that indicates contact of the touch screen.
    • 一种方法包括通过基于触摸屏的接触的触摸屏驱动电流,产生比例的第二电流,以及检测触摸屏与第二电流的接触。 另一种方法包括提供具有平行板的触摸屏,当板电压低于阈值电压时禁止接触检测,以及当板电压至少等于阈值电压时使能接触检测。 设备包括耦合到触摸屏的第一节点和第二节点,第三节点,耦合到第二节点的第一电流镜和被配置为在第三节点处产生与第二电流成比例的电流的第三节点 第二节点,以及检测电路,其提供基于指示触摸屏的接触的第一电流的信号。