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1. 发明授权

US06459259B1 Tester for semiconductor devices and test tray used for the same 失效
标题翻译：用于半导体器件和测试托盘的测试仪用于相同
公开(公告)号：US06459259B1
公开(公告)日：2002-10-01
申请号：US09254084
申请日：1999-02-26
申请人： Akihiko Ito , Yoshihito Kobayashi , Yoshiyuki Masuo , Tsuyoshi Yamashita
发明人： Akihiko Ito , Yoshihito Kobayashi , Yoshiyuki Masuo , Tsuyoshi Yamashita
IPC分类号： B65G4300
CPC分类号： G01R31/2893 , G01R31/01 , G01R31/2851 , G01R31/2867
摘要： An IC tester which is capable of reducing the time required before completion of testing on all of ICs to be tested is provided. The depth (length in the Y-axis direction) of the constant temperature chamber 4 and the exit chamber 5 is expanded by a dimension corresponding approximately to one transverse width (length of the minor edge) of the rectangular test tray 3, and two generally parallel test tray transport paths or alternatively a widened test tray transport path broad enough to transport two test trays simultaneously with the two test trays juxtaposed in a direction transverse to the widened test tray transport path are provided in the section of test tray transport path extending from the soak chamber 41 in the constant temperature chamber 4 through the testing section 42 in the constant temperature chamber 4 to the exit chamber 5 so that two test trays may be simultaneously transported along the two test tray transport paths or the widened test tray transport path.
摘要翻译：提供了一种能够在所有要测试的IC上测试完成之前减少所需时间的IC测试器。恒温室4和出口室5的深度（Y轴方向的长度）以相当于矩形试验盘3的一个横向宽度（小边的长度）的尺寸扩大，平行的测试托盘传送路径或者可选地，加宽的测试托盘传送路径足够宽以与横向于加宽的测试托盘传送路径的方向并置的两个测试托盘同时传送两个测试托盘设置在从托盘传送路径延伸的部分恒温室4中的浸泡室41通过恒温室4中的检测部分42到出口室5，从而沿着两个试纸盘传送路径或加宽的试纸盘传送路径同时传送两个试纸盘。

2. 发明授权

US6104183A Semiconductor device testing apparatus 失效
标题翻译：半导体器件测试仪器
公开(公告)号：US6104183A
公开(公告)日：2000-08-15
申请号：US809243
申请日：1997-05-28
申请人： Yoshihito Kobayashi , Tsuyoshi Yamashita , Hiroto Nakamura , Shin Nemoto , Yoshiyuki Masuo , Akihiko Ito
发明人： Yoshihito Kobayashi , Tsuyoshi Yamashita , Hiroto Nakamura , Shin Nemoto , Yoshiyuki Masuo , Akihiko Ito
IPC分类号： G01R31/26 , G01R31/28 , H01L21/677
CPC分类号： G01R31/2868
摘要： A semiconductor device testing apparatus having a reduced transverse width and compact in size is provided. Adjacent to a constant temperature chamber 101 containing therein a vertical transport means is located a test chamber 102 which is in turn adjoined by a temperature-stress removing chamber 103 likewise containing therein a vertical transport means, so that the constant temperature chamber 101, the test chamber 102 and the temperature-stress removing chamber 103 are arranged transversely in a line. Further, a loader section 300 is located in front of the constant temperature chamber, and an unloader section 400 is located in front of the test chamber and the temperature-stress removing chamber. With this arrangement, the transverse width of the testing apparatus may be reduced to about three test tray lengths.
摘要翻译： PCT No.PCT / JP96 / 02067 Sec。 371日期1997年5月28日 102（e）日期1997年5月28日PCT提交1996年7月24日PCT公布。出版物WO97 / 05495 日期：1997年2月13日提供了具有减小的横向宽度和尺寸紧凑的半导体器件测试装置。在其中容纳有垂直传送装置的恒温室101附近设置有测试室102，测试室102又由同样包含垂直传送装置的温度应力消除室103邻接，使得恒温室101，测试室102和温度应力消除室103横向排列成一行。此外，装载部300位于恒温室前方，卸载部400位于试验室前方和温度应力消除室。通过这种布置，测试装置的横向宽度可以减小到约三个测试托盘长度。

3. 发明授权

US06856128B2 Semiconductor device testing apparatus and a test tray for use in the testing apparatus 有权
标题翻译：半导体器件测试装置和用于测试装置的测试托盘
公开(公告)号：US06856128B2
公开(公告)日：2005-02-15
申请号：US09964211
申请日：2001-09-25
申请人： Akihiko Ito , Yoshihito Kobayashi , Yoshiyuki Masuo , Tsuyoshi Yamashita
发明人： Akihiko Ito , Yoshihito Kobayashi , Yoshiyuki Masuo , Tsuyoshi Yamashita
IPC分类号： G01R31/01 , G01R31/28 , B65G43/00
CPC分类号： G01R31/2893 , G01R31/01 , G01R31/2851 , G01R31/2867
摘要： An IC tester which is capable of reducing the time required before completion of testing on all of ICs to be tested is provided. The depth (length in the Y-axis direction) of the constant temperature chamber 4 and the exit chamber 5 is expanded by a dimension corresponding approximately to one transverse width (length of the minor edge) of the rectangular test tray 3, and two generally parallel test tray transport paths or alternatively a widened test tray transport path broad enough to transport two test trays simultaneously with the two test trays juxtaposed in a direction transverse to the widened test tray transport path are provided in the section of test tray transport path extending from the soak chamber 41 in the constant temperature chamber 4 through the testing section 42 in the constant temperature chamber 4 to the exit chamber 5 so that two test trays may be simultaneously transported along the two test tray transport paths or the widened test tray transport path.
摘要翻译：提供了一种能够在所有要测试的IC上测试完成之前减少所需时间的IC测试器。恒温室4和出口室5的深度（Y轴方向的长度）以相当于矩形试验盘3的一个横向宽度（小边的长度）的尺寸扩大，平行的测试托盘传送路径或者可选地，加宽的测试托盘传送路径足够宽以与横向于加宽的测试托盘传送路径的方向并置的两个测试托盘同时传送两个测试托盘设置在从托盘传送路径延伸的部分恒温室4中的浸泡室41通过恒温室4中的检测部分42到出口室5，从而沿着两个试纸盘传送路径或加宽的试纸盘传送路径同时传送两个试纸盘。

4. 发明授权

US06384593B1 Semiconductor device testing apparatus 失效
标题翻译：半导体器件测试仪器
公开(公告)号：US06384593B1
公开(公告)日：2002-05-07
申请号：US09596062
申请日：2000-06-16
申请人： Yoshihito Kobayashi , Tsuyoshi Yamashita , Hiroto Nakamura , Shin Nemoto , Yoshiyuki Masuo , Akihiko Ito
发明人： Yoshihito Kobayashi , Tsuyoshi Yamashita , Hiroto Nakamura , Shin Nemoto , Yoshiyuki Masuo , Akihiko Ito
IPC分类号： G01R3128
CPC分类号： G01R31/2868
摘要： A semiconductor device testing apparatus having a reduced transverse width and compact in size is provided. Adjacent to a constant temperature chamber containing therein a vertical transport means is located a test chamber which is in turn adjoined by a temperature-stress removing chamber likewise containing therein a vertical transport means, so that the constant temperature chamber and the test chamber are arranged transversely in a line, while the temperature-stress removing chamber is located in front of the test chamber when viewed in front view of the apparatus. Further, a loader section is located in front of the constant temperature chamber, and an unloader section is located above the temperature-stress removing chamber. With this arrangement, the transverse width of the testing apparatus may be reduced to about two test tray lengths.
摘要翻译：提供了具有减小的横向宽度并且尺寸紧凑的半导体器件测试装置。在其中容纳有垂直输送装置的恒温室附近设有试验室，该试验室又由同样含有垂直输送装置的温度应力消除室邻接，使得恒温室和试验室横向布置在该装置的正视图中观察时，温度应力消除室位于测试室的前方。此外，装载部位于恒温室前方，卸载部位于温度应力消除室的上方。通过这种布置，测试装置的横向宽度可以减小到大约两个测试托盘长度。

5. 发明授权

US06445203B1 Electric device testing apparatus 失效
标题翻译：电器测试仪器
公开(公告)号：US06445203B1
公开(公告)日：2002-09-03
申请号：US09456408
申请日：1999-12-08
申请人： Tsuyoshi Yamashita , Yoshihito Kobayashi , Toshiyuki Kiyokawa , Hiroto Nakamura , Noriyuki Igarashi , Kenichi Shimada
发明人： Tsuyoshi Yamashita , Yoshihito Kobayashi , Toshiyuki Kiyokawa , Hiroto Nakamura , Noriyuki Igarashi , Kenichi Shimada
IPC分类号： G01R3102
CPC分类号： G01R31/2874 , G01R31/2806 , G01R31/2856 , G01R31/2863
摘要： An electric device testing apparatus comprises a connection terminal to which an IC chip to be tested is removably connected, a pusher for pushing the IC chip in the direction of the connection terminal in order to connect the IC chip to the connection terminal, and temperature adjusted air supply for blowing a temperature adjusted air to around the IC chip during a test on the IC chip via a through hole formed on the pushed.
摘要翻译：一种电气设备测试装置，包括：被测试的IC芯片可拆卸地连接到的连接端子，用于沿着连接端子的方向推动IC芯片的推动器，以将IC芯片连接到连接端子，并且温度调节用于在通过形成在所述推动件上的通孔对IC芯片进行测试期间将温度调节的空气吹送到IC芯片周围。

6. 发明授权

US07804316B2 Pusher, pusher unit and semiconductor testing apparatus 有权
标题翻译：推动器，推动器单元和半导体测试装置
公开(公告)号：US07804316B2
公开(公告)日：2010-09-28
申请号：US12016211
申请日：2008-01-18
申请人： Akihiko Ito , Tsuyoshi Yamashita , Tomoyuki Kanaumi
发明人： Akihiko Ito , Tsuyoshi Yamashita , Tomoyuki Kanaumi
IPC分类号： G01R31/02
CPC分类号： G01R31/2887
摘要： A pusher 200 that pushes a semiconductor device under test 300 against a test socket 500 in a semiconductor test apparatus 20 is provided that includes a main body section 210 that is thermally coupled with the thermal source 400 and a plurality of device pushing sections 220, each of which is physically and thermally coupled to the thermal source 400, is displaced toward the test socket 500 by the pushing force of the main body section 210 to contact a surface to be pushed of a semiconductor device under test 300, pushes the semiconductor device under test 300, and transmits heat from the thermal source 400 to the semiconductor device under test 300. Thermal conductivity between the pusher and the semiconductor device under test is enhanced to provide a pusher that can quickly and accurately test a semiconductor device.
摘要翻译：提供了一种将半导体器件300与半导体测试装置20相对的测试插座500推送的推动器200，其包括与热源400热耦合的主体部分210和多个装置推动部分220 物理和热耦合到热源400通过主体部分210的推动力朝向测试插座500移动，以接触待测试的半导体器件被推动的表面，将半导体器件按下测试300，并且将热量从热源400传递到被测试的300的半导体器件。推进器和被测半导体器件之间的热传导性得到增强，以提供可以快速且准确地测试半导体器件的推动器。

7. 发明授权

US08829739B2 Power converter for vehicle 有权
标题翻译：车用电源转换器
公开(公告)号：US08829739B2
公开(公告)日：2014-09-09
申请号：US13553954
申请日：2012-07-20
申请人： Takuya Okubo , Tsuyoshi Yamashita
发明人： Takuya Okubo , Tsuyoshi Yamashita
IPC分类号： H01H9/54 , H01H33/59 , H01H47/00 , H01H85/46 , H01H3/26 , H01H3/28
CPC分类号： H02M1/36 , B60L2210/40 , Y02T10/7241 , Y10T307/944
摘要： A power converter capable of activating a control circuit therein without increasing a length of a wiring for conveying an external activation signal. In the power converter, a converter circuit isolates a first voltage of a first power supply, converts the first voltage into a second voltage, and outputs the second voltage to a second power supply. A first power supply connecting circuit connects the first power supply to the converter circuit in response to the activation signal. An activation circuit determines whether or not the activation signal has been received by the first power supply connecting circuit on the basis of a voltage between input terminals of the converter circuit and activates the control circuit when it is determined that the activation signal has been received by the first power supply connecting circuit.
摘要翻译：一种功率转换器，其能够在不增加用于传送外部激活信号的布线的长度的情况下激活其中的控制电路。在功率转换器中，转换器电路隔离第一电源的第一电压，将第一电压转换成第二电压，并将第二电压输出到第二电源。第一电源连接电路响应于激活信号将第一电源连接到转换器电路。激活电路基于转换器电路的输入端子之间的电压来确定第一电源连接电路是否已经接收到激活信号，并且当确定已经接收到激活信号被激活时激活控制电路第一个电源连接电路。

8. 发明授权

US08164355B2 Electronic component pressing device and electronic component test apparatus 失效
标题翻译：电子元件按压装置和电子元件测试装置
公开(公告)号：US08164355B2
公开(公告)日：2012-04-24
申请号：US12527976
申请日：2008-01-18
申请人： Tsuyoshi Yamashita
发明人： Tsuyoshi Yamashita
IPC分类号： G01R31/20
CPC分类号： G01R31/2891
摘要： An electronic component pressing device includes a first pressing member for pressing a predetermined first region of the electronic component to be tested; a second pressing member for pressing a predetermined second region other than the first region of the electronic component to be tested; a gimbal mechanism for adhering the first pressing member to the first region when the first pressing member presses the first region of the electronic component to be tested; first pressing load applying means for applying a pressing load on the gimbal mechanism; and second pressing load applying means for applying a pressing load on the second pressing member.
摘要翻译：电子部件按压装置包括：第一按压部件，用于按压待测试的电子部件的预定的第一区域; 第二按压构件，用于按压除了待测试的电子部件的第一区域之外的预定的第二区域; 当所述第一按压构件按压所述待测电子部件的所述第一区域时，将所述第一按压构件粘合到所述第一区域的万向接头机构; 第一按压负荷施加装置，用于在万向节机构上施加按压负荷; 以及用于对第二按压部件施加按压负荷的第二按压负荷施加机构。

9. 发明申请

US20110122206A1 Ink Ejection Device 有权
标题翻译：喷墨设备
公开(公告)号：US20110122206A1
公开(公告)日：2011-05-26
申请号：US12623843
申请日：2009-11-23
申请人： David Pidwerbecki , Tsuyoshi Yamashita
发明人： David Pidwerbecki , Tsuyoshi Yamashita
IPC分类号： B41J2/045
CPC分类号： B41J2/14233 , B41J2/1433
摘要： A side shooting ink ejection device may comprise a front surface, side shooting nozzles having ejection orifices for ejecting fluid, and piezoelectric actuators for moving the fluid through vibration for ejecting the fluid out of the nozzle. The side shooting nozzles may be arranged to eject fluid in a side direction of the piezoelectric actuator. The front surface may comprise recessed portions. The side shooting nozzles may open into the recessed portions so that the ejection orifices are countersunk with respect to the front surface.
摘要翻译：侧面喷墨装置可以包括前表面，具有用于喷射流体的喷射孔的侧面喷射喷嘴和用于通过振动移动流体的压电致动器，以将流体喷出喷嘴。侧面喷嘴可以布置成在压电致动器的侧面方向上喷射流体。前表面可以包括凹入部分。侧面喷嘴可以打开到凹部中，使得喷射孔相对于前表面被沉没。

10. 发明授权

US07697310B2 Control apparatus for inhibiting synchronous-rectifier switching elements at low output current for a voltage transforming apparatus 有权
标题翻译：用于抑制用于电压变换装置的低输出电流下的同步整流器开关元件的控制装置
公开(公告)号：US07697310B2
公开(公告)日：2010-04-13
申请号：US11699076
申请日：2007-01-29
申请人： Kimikazu Nakamura , Tsuyoshi Yamashita
发明人： Kimikazu Nakamura , Tsuyoshi Yamashita
IPC分类号： H02M3/335
CPC分类号： H02M3/33592 , Y02B70/1475
摘要： The control apparatus for controlling a voltage transforming apparatus having a transformer, power switching elements disposed in a primary side, and synchronous-rectifying switching elements disposed in a secondary side includes a judging circuit making a judgment as to whether or not an output current of the voltage transforming apparatus is smaller than a specified current on the basis of a primary-side current of the transformer and an inhibition circuit inhibiting the synchronous-rectifying switching elements from performing their synchronous-rectifying control operation when the judging circuit judges that the output current is smaller than the specified current. The judging circuit makes the judgment with compensating for a variation of a relationship between the primary side-current and the output current due to variation of duty ratio of the power switching elements, and variation of at least one of the DC output voltage and the DC input voltage of the voltage transforming apparatus.
摘要翻译：用于控制具有变压器的电压变换装置的控制装置，设置在初级侧的功率开关元件和设置在次级侧的同步整流开关元件包括判断电路，判断是否输出电流电压变换装置基于变压器的初级侧电流小于规定电流，抑制电路在判定电路判定为输出电流为止时，禁止同步整流用开关元件进行同步整流控制动作小于指定电流。判断电路通过补偿由于功率开关元件的占空比的变化引起的一次侧电流与输出电流之间的关系的变化以及直流输出电压和直流的至少一个的变化的判断电压变换装置的输入电压。

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