会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Tester for semiconductor devices and test tray used for the same
    • 用于半导体器件和测试托盘的测试仪用于相同
    • US06459259B1
    • 2002-10-01
    • US09254084
    • 1999-02-26
    • Akihiko ItoYoshihito KobayashiYoshiyuki MasuoTsuyoshi Yamashita
    • Akihiko ItoYoshihito KobayashiYoshiyuki MasuoTsuyoshi Yamashita
    • B65G4300
    • G01R31/2893G01R31/01G01R31/2851G01R31/2867
    • An IC tester which is capable of reducing the time required before completion of testing on all of ICs to be tested is provided. The depth (length in the Y-axis direction) of the constant temperature chamber 4 and the exit chamber 5 is expanded by a dimension corresponding approximately to one transverse width (length of the minor edge) of the rectangular test tray 3, and two generally parallel test tray transport paths or alternatively a widened test tray transport path broad enough to transport two test trays simultaneously with the two test trays juxtaposed in a direction transverse to the widened test tray transport path are provided in the section of test tray transport path extending from the soak chamber 41 in the constant temperature chamber 4 through the testing section 42 in the constant temperature chamber 4 to the exit chamber 5 so that two test trays may be simultaneously transported along the two test tray transport paths or the widened test tray transport path.
    • 提供了一种能够在所有要测试的IC上测试完成之前减少所需时间的IC测试器。 恒温室4和出口室5的深度(Y轴方向的长度)以相当于矩形试验盘3的一个横向宽度(小边的长度)的尺寸扩大, 平行的测试托盘传送路径或者可选地,加宽的测试托盘传送路径足够宽以与横向于加宽的测试托盘传送路径的方向并置的两个测试托盘同时传送两个测试托盘设置在从托盘传送路径延伸的部分 恒温室4中的浸泡室41通过恒温室4中的检测部分42到出口室5,从而沿着两个试纸盘传送路径或加宽的试纸盘传送路径同时传送两个试纸盘。
    • 4. 发明授权
    • Semiconductor device testing apparatus and a test tray for use in the testing apparatus
    • 半导体器件测试装置和用于测试装置的测试托盘
    • US06856128B2
    • 2005-02-15
    • US09964211
    • 2001-09-25
    • Akihiko ItoYoshihito KobayashiYoshiyuki MasuoTsuyoshi Yamashita
    • Akihiko ItoYoshihito KobayashiYoshiyuki MasuoTsuyoshi Yamashita
    • G01R31/01G01R31/28B65G43/00
    • G01R31/2893G01R31/01G01R31/2851G01R31/2867
    • An IC tester which is capable of reducing the time required before completion of testing on all of ICs to be tested is provided. The depth (length in the Y-axis direction) of the constant temperature chamber 4 and the exit chamber 5 is expanded by a dimension corresponding approximately to one transverse width (length of the minor edge) of the rectangular test tray 3, and two generally parallel test tray transport paths or alternatively a widened test tray transport path broad enough to transport two test trays simultaneously with the two test trays juxtaposed in a direction transverse to the widened test tray transport path are provided in the section of test tray transport path extending from the soak chamber 41 in the constant temperature chamber 4 through the testing section 42 in the constant temperature chamber 4 to the exit chamber 5 so that two test trays may be simultaneously transported along the two test tray transport paths or the widened test tray transport path.
    • 提供了一种能够在所有要测试的IC上测试完成之前减少所需时间的IC测试器。 恒温室4和出口室5的深度(Y轴方向的长度)以相当于矩形试验盘3的一个横向宽度(小边的长度)的尺寸扩大, 平行的测试托盘传送路径或者可选地,加宽的测试托盘传送路径足够宽以与横向于加宽的测试托盘传送路径的方向并置的两个测试托盘同时传送两个测试托盘设置在从托盘传送路径延伸的部分 恒温室4中的浸泡室41通过恒温室4中的检测部分42到出口室5,从而沿着两个试纸盘传送路径或加宽的试纸盘传送路径同时传送两个试纸盘。
    • 6. 发明申请
    • MOVEMENT APPARATUS AND ELECTRONIC DEVICE TEST APPARATUS
    • 运动装置和电子装置测试装置
    • US20090189631A1
    • 2009-07-30
    • US12280757
    • 2007-02-21
    • Kenichi ShimadaYoshiyuki Masuo
    • Kenichi ShimadaYoshiyuki Masuo
    • G01R31/26
    • G01R31/2893
    • An air cylinder raising and lowering a pickup head for holding an IC device in an electronic device test apparatus, the air cylinder includes a cylinder tube; a piston; a first hollow chamber formed below the piston; a second hollow chamber formed above the piston and being larger than the first hollow chamber in terms of a pressure receiving area of the piston; and a rod with one end coupled with the piston and the other end coupled with the pickup head. The first hollow chamber is connected to the air feed device via a first feed system in which the air feed is secured even if the electric power supply of the electronic device test apparatus is cut off, and the second hollow chamber is connected to the air feed device via a second feed system having a shutoff valve.
    • 一种用于将IC器件保持在电子设备测试装置中的用于升高和降低拾取头的气缸,气缸包括气缸筒; 活塞 形成在活塞下方的第一中空室; 形成在活塞上方的第二中空室,并且在活塞的受压面积方面大于第一中空室; 以及杆,其一端与活塞联接,另一端与拾取头相连。 第一中空室经由第一进料系统连接到空气供给装置,即使电子装置测试装置的电力供应被切断,空气进料被固定,第二中空室连接到空气进料 装置通过具有截止阀的第二进料系统。