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    • 1. 发明授权
    • Method and apparatus for X-ray analyses
    • X射线分析的方法和装置
    • US5877498A
    • 1999-03-02
    • US893034
    • 1997-07-15
    • Aritoshi SugimotoYoshimi SudoTokuo KureKen NinomiyaKatsuhiro KurodaTakashi NishidaHideo TodokoroYasuhiro MitsuiHiroyasu Shichi
    • Aritoshi SugimotoYoshimi SudoTokuo KureKen NinomiyaKatsuhiro KurodaTakashi NishidaHideo TodokoroYasuhiro MitsuiHiroyasu Shichi
    • G01N23/225H01J37/256
    • G01N23/2252H01J2237/2445H01J2237/2807
    • An X-ray analyzing method for inspecting opening states of fine holes comprises the steps of: irradiating a finely converged electron beam into a first fine hole, observing an X-ray emitted from the inside of said first fine hole in order to obtain an first X-ray analysis data about the residue substance existing at the bottom of said first fine hole; irradiating a finely converged electron beam into a second fine hole, observing an X-ray emitted from the inside of said second fine hole in order to obtain an second X-ray analysis data about the residue substance existing at the bottom of said second fine hole; and comparing said first X-ray analysis data with said second X-ray analysis data, forming a judgment as to whether or not a difference between said first and second analysis data is smaller than a predetermined threshold value and using an outcome of said judgment to determine the opening states of said first and second fine holes. The X-ray observations are carried out by detecting only the X-rays emitted within the angular range -.theta. to +.theta. where notation .theta. is an angle formed with a center axis of the irradiated electron beam and so defined that tan .theta. is equal to a/d whereas notations a and d are the radius and the depth of the fine holes.
    • 用于检查细孔的打开状态的X射线分析方法包括以下步骤:将精细会聚的电子束照射到第一细孔中,观察从所述第一细孔的内部发射的X射线,以获得第一细孔 关于存在于所述第一细孔底部的残留物质的X射线分析数据; 将精细会聚的电子束照射到第二细孔中,观察从所述第二细孔的内部发射的X射线,以获得关于存在于所述第二细孔底部的残留物质的第二X射线分析数据 ; 以及将所述第一X射线分析数据与所述第二X射线分析数据进行比较,形成关于所述第一和第二分析数据之间的差是否小于预定阈值的判断,并且使用所述判断结果 确定所述第一和第二细孔的打开状态。 通过仅检测在角度范围θ至+θ内发射的X射线来进行X射线观察,其中符号θ是与照射的电子束的中心轴形成的角度,并且如此定义,tanθ等于 a / d,而符号a和d是细孔的半径和深度。
    • 6. 发明授权
    • Prefoamed propylene polymer-base particles, expansion-molded article
produced from said particles and production process of said article
    • 预发泡的丙烯聚合物基颗粒,由所述颗粒制备的发泡模制品和所述制品的制备方法
    • US4695593A
    • 1987-09-22
    • US831548
    • 1986-02-21
    • Hideki KuwabaraAtsushi KitagawaYoshimi Sudo
    • Hideki KuwabaraAtsushi KitagawaYoshimi Sudo
    • C08J9/232C08J9/24
    • C08J9/232C08J2323/10Y10S264/07Y10S264/16
    • Prefoamed polypropylene-base particles have a crystalline structure featuring a high-temperature peak appeared on the higher temperature side than the peak inherent to polypropylene-base resins on a DSC curve obtained by differential scanning calorimetry upon heating 1-3 mg of the prefoamed polypropylene-base particles at a constant heating rate of 10.degree. C./min. to 220.degree. C. by means of a differential scanning calorimeter and the internal pressure decreasing velocity coefficient k of the particles is either equal to or smaller than 0.70 (k.ltoreq.0.70) at 25.degree. C. and 1 atm. The prefoamed polypropylene-base particles can be formed into an expansion-molded polypropylene-base article by imparting foamability to the particles, filling the resultant particles in a mold and then heating the particles so as to cause their expansion. The expansion-molded article has good surface quality, excellent dimensional accuracy, and superb physical properties such as shrinkage factor, compression hardness, compression set and interparticle fusion-bonding property.
    • 预发泡的聚丙烯基颗粒具有在高温侧出现的高温峰的晶体结构,而不是聚丙烯基树脂固有的峰,在通过差示扫描量热法获得的DSC曲线上,加热1-3mg预发泡的聚丙烯 - 基础颗粒以10℃/分钟的恒定加热速率。 通过差示扫描量热计至220℃,并且在25℃和1atm下,颗粒的内部压力降低速度系数k等于或小于0.70(k <0.70)。 预发泡的聚丙烯基颗粒可以通过赋予颗粒发泡性,将所得颗粒填充到模具中,然后加热颗粒以使其膨胀而形成为膨胀模制的聚丙烯基制品。 发泡成形品具有良好的表面质量,优异的尺寸精度,以​​及收缩率,压缩硬度,压缩永久变形和颗粒间熔合性等极好的物理性能。