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    • 4. 发明申请
    • Long-lifetime interconnect structure and method for making
    • 长寿命互联结构和制作方法
    • US20070246830A1
    • 2007-10-25
    • US11408183
    • 2006-04-21
    • Yoshiaki Shimooka
    • Yoshiaki Shimooka
    • H01L23/52
    • H01L23/53238H01L23/53295H01L2924/0002H01L2924/00
    • An interconnect structure and method for manufacturing are described wherein an insulating material adjacent to or at least partially surrounding a conductive interconnect has a coefficient of thermal expansion (CTE) equal to or larger than the CTE of the interconnect. For example, a copper-based damascene interconnect layer may be provided, wherein an inter-layer dielectric (ILD) a least partially surrounds the interconnect layer and a cap insulator is disposed on the interconnect layer. In such an embodiment, the CTE of the ILD and/or the cap insulator would be at least as large as the CTE of the interconnect layer. This may result in no stress or compressive stress being applied by the insulating material to the interconnect layer when the device has cooled, such as to room temperature, after formation of the various layers.
    • 描述了用于制造的互连结构和方法,其中与导电互连相邻或至少部分地围绕导电互连的绝缘材料具有等于或大于互连的CTE的热膨胀系数(CTE)。 例如,可以提供铜基镶嵌互连层,其中层间电介质(ILD)至少部分地围绕互连层,并且帽绝缘体设置在互连层上。 在这样的实施例中,ILD和/或帽绝缘体的CTE将至少与互连层的CTE一样大。 当形成各层之后,当器件已经冷却到室温时,这可能导致绝缘材料施加到互连层的应力或压应力。
    • 9. 发明申请
    • MICRO-ELECTRO-MECHANICAL-SYSTEM PACKAGE AND METHOD FOR MANUFACTURING THE SAME
    • 微电子机械系统包装及其制造方法
    • US20090107692A1
    • 2009-04-30
    • US12252830
    • 2008-10-16
    • Yoshiaki SHIMOOKA
    • Yoshiaki SHIMOOKA
    • H05K5/06B05D5/12
    • B81C1/00333B81C2203/0136B81C2203/0145
    • According to an aspect of the present invention, there is provided a method for manufacturing a MEMS package, the method including: forming a MEMS device on a substrate; forming a sacrificing member on the MEMS device; forming a cavity formation film on the sacrificing member; forming a through hole in the cavity formation film at a portion other than above the MEMS device; removing the sacrificing member through the through hole, thereby forming a cavity around the MEMS device; and forming a seal layer on the cavity formation film to block the through hole and to seal the cavity, by performing a film forming process in which a seal layer material is straightly applied in a direction of perpendicular to a surface of the substrate.
    • 根据本发明的一个方面,提供了一种用于制造MEMS封装的方法,所述方法包括:在衬底上形成MEMS器件; 在所述MEMS器件上形成牺牲部件; 在牺牲构件上形成空腔形成膜; 在MEMS器件上方的部分处在空腔形成膜中形成通孔; 通过所述通孔去除所述牺牲部件,从而在所述MEMS装置周围形成空腔; 并且在空腔形成膜上形成密封层以阻挡通孔并密封空腔,通过进行成膜工艺,其中密封层材料沿垂直于衬底表面的方向直线施加。