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    • 1. 发明授权
    • High speed sink/source register to reduce level sensitive scan design test time
    • 高速吸收/源寄存器,以降低敏感扫描设计的测试时间
    • US06591388B1
    • 2003-07-08
    • US09551130
    • 2000-04-18
    • Timothy J. Vonreyn
    • Timothy J. Vonreyn
    • G01R3128
    • G01R31/318536G01R31/318544
    • Test data is provided through shift registers, operated at a high clock rate comparable to or exceeding a normal high speed clock rate of a chip being tested, to each of a plurality of scan chains configured from registers present on the chip; respective latches of which are connected to inputs and outputs of logic array partitions to be tested. Reduced test clock rate of input and output circuits of the scan chains is accommodated by high speed source and sink shift registers. The source and sink registers are fully loaded and unloaded between consecutive test clock signals and test signals are preferably applied to and collected from the chip in a single serial string through a single pair of tester input/output pins. Testing time is thus reduced without requiring design time and chip space for a clock tree optimized for high speed operation while use of testers of reduced cost and having an arbitrarily small number of input/output pin pairs and independent of test register configuaration on the chip can be used.
    • 通过移位寄存器提供测试数据,该移位寄存器以与正在测试的芯片的正常高速时钟速率相当或者超过正在被测试的芯片的正常高速时钟速率的高时钟速率被提供给由存在于芯片上的寄存器配置的多个扫描链中的每 其相应的锁存器连接到要测试的逻辑阵列分区的输入和输出。 降低扫描链的输入和输出电路的测试时钟速率由高速源和吸收移位寄存器来适应。 源和宿寄存器在连续的测试时钟信号之间被完全加载和卸载,并且测试信号优选地通过单个测试器输入/输出引脚在单个串行串中被施加到芯片并从芯片采集。 因此,降低了测试时间,而不需要为高速操作优化的时钟树的设计时间和芯片空间,同时使用降低成本的测试仪,并且具有任意少量的输入/输出引脚对,并且独立于芯片上的测试寄存器配置 使用。