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    • 2. 发明授权
    • Projection exposure system as well as a process for compensating image defects occuring in the projection optics of a projection exposure system, in particular for microlithography
    • 投影曝光系统以及用于补偿投影曝光系统的投影光学元件中发生的图像缺陷的过程,特别是用于微光刻
    • US06784977B2
    • 2004-08-31
    • US10133963
    • 2002-04-25
    • Rudolf von BünauChristian Hembd-SöllnerHubert Holderer
    • Rudolf von BünauChristian Hembd-SöllnerHubert Holderer
    • G03B2754
    • G03F7/70191G03F7/70308
    • A projection exposure system, in particular for microlithography, serves for the generation of an image in an image plane of an object arranged in an object plane. The system comprises a light source that emits a projection light bundle. The system also comprises a projection optics arranged in the optical path between the object plane and the image plane as well as at least one optical correction component arranged in the projection light optical path in front of the image plane. In order to change the optical image properties this component is coupled to at least one correction manipulator so that an optical surface of the optical correction component illuminated by the projection light bundle is moved at least regionally. In this connection the correction manipulator operates together with a correction sensor device. The correction sensor device comprises a light source that emits at least one measuring light bundle. This light bundle passes through at least a part of the projection optics and lie sin front of the entry point to and after the exit from the projection optics outside the projection light bundle. The correction sensory device also has a position-sensitive correction sensor element for the detection of the wave front of the at least one measuring light bundle. By means of the correction sensor device a correction of image defects of the projection optics is ensured without the loss of projection light.
    • 特别是用于微光刻的投影曝光系统用于在物平面中的物体的像平面中产生图像。 该系统包括发射投影光束的光源。 该系统还包括布置在物平面和图像平面之间的光路中的投影光学器件以及布置在图像平面前面的投影光学光路中的至少一个光学校正元件。 为了改变光学图像特性,该部件耦合到至少一个校正操纵器,使得由投影光束照射的光学校正部件的光学表面至少在区域上移动。 在这方面,校正操纵器与校正传感器装置一起操作。 校正传感器装置包括发射至少一个测量光束的光源。 该光束穿过投影光学元件的至少一部分,并且将入射点的前面位于投影光束外部的投影光学器件的出射之后和之后。 校正感觉装置还具有用于检测至少一个测量光束的波前的位置敏感校正传感器元件。 通过校正传感器装置,确保投影光学器件的图像缺陷的校正,而不损失投影光。
    • 3. 发明授权
    • Optical arrangement having improved temperature distribution within an optical element
    • 在光学元件内具有改善的温度分布的光学布置
    • US06521877B1
    • 2003-02-18
    • US09721451
    • 2000-11-22
    • Werner Müller-RissmannHubert HoldererRudolf Von BünauChristian WagnerJochen BeckerStefan XalterWolfgang Hummel
    • Werner Müller-RissmannHubert HoldererRudolf Von BünauChristian WagnerJochen BeckerStefan XalterWolfgang Hummel
    • G01J120
    • G03F7/70891
    • An optical arrangement, in particular a microlithographic projection printing installation, has in particular a slot-shaped image field or rotationally non-symmetrical illumination. A refractive optical element, e.g. a lens (2), is heated by the rotationally non-symmetrical radiated impingement (3) of a light source. At least one electric heating element is coupled to the optical element. Said heating element comprises a resistance heating coating carried by the optical element. In the region of the surface (3) of the optical element acted upon by the radiation of the light source the resistance heating coating is substantially optically transparent. It comprises a plurality of parallel, electrically mutually insulated coating strips (5 to 10). A heating current source (17 to 19) is additionally part of the heating element. By virtue of the combined heating of the optical element by the radiated impingement (3) and the resistance heating, a correction of imaging defects induced by illumination in the optical element is achieved by means of a symmetrical and/or homogeneous temperature and refractive index distribution.
    • 光学布置,特别是微光刻投影印刷装置,特别地具有槽形图像场或旋转非对称照明。 折射光学元件,例如 透镜(2)被光源的旋转非对称辐射冲击(3)加热。 至少一个电加热元件耦合到光学元件。 所述加热元件包括由光学元件承载的电阻加热涂层。 在由光源的辐射作用的光学元件的表面(3)的区域中,电阻加热涂层基本上是光学透明的。 它包括多个平行的,电互相绝缘的涂层条(5至10)。 加热电流源(17〜19)是加热元件的另外一部分。 由于通过辐射冲击(3)和电阻加热对光学元件的组合加热,通过对称和/或均匀的温度和折射率分布来实现由光学元件中的照明引起的成像缺陷的校正 。
    • 7. 发明授权
    • Optical arrangement
    • 光学布置
    • US06781668B2
    • 2004-08-24
    • US09752282
    • 2000-12-29
    • Karl-Heinz SchusterHubert HoldererRudolf Von BünauChristian WagnerJochen BeckerStefan XalterWolfgang Hummel
    • Karl-Heinz SchusterHubert HoldererRudolf Von BünauChristian WagnerJochen BeckerStefan XalterWolfgang Hummel
    • G03B2752
    • G03F7/70058G03F7/70216G03F7/70891
    • An optical arrangement, in particular a microlithographic projection printing installation, has in particular a slot-shaped image field or rotationally non-symmetrical illumination. An optical element (5) is therefore acted upon in a rotationally non-symmetrical manner by the radiation of a light source. To temper the optical element (5), a supply apparatus (11, 19 to 23) for gas is used. The latter having at least one supply line (21) and at least one gas directing device (11). The latter is aligned relative to the optical element (5) and controllable in such a way that the gas is directed by the gas directing device (11) towards the optical element (5). The volumetric flow of the exiting gas therefore has a magnitude and spatial distribution (17), which are adapted to the intensity distribution (6) of the radiation. By virtue of such tempering, rotationally non-symmetrical light-induced image defects in the optical element (5) are avoided or compensated.
    • 光学布置,特别是微光刻投影印刷装置,特别地具有槽形图像场或旋转非对称照明。 因此,光学元件(5)通过光源的辐射以旋转非对称的方式作用。 为了回火光学元件(5),使用用于气体的供给装置(11,19〜23)。 后者具有至少一个供应管线(21)和至少一个气体引导装置(11)。 后者相对于光学元件(5)对准并且可以以气体被气体引导装置(11)引向光学元件(5)的方式控制。 因此,出口气体的体积流量具有适于辐射的强度分布(6)的大小和空间分布(17)。 由于这种回火,避免或补偿光学元件(5)中的旋转非对称的光诱导图像缺陷。
    • 10. 发明授权
    • Projection-microlithographic device
    • 投影微光刻装置
    • US06445442B2
    • 2002-09-03
    • US09932355
    • 2001-08-20
    • Rudolf Von BünauJörg SchultzJohannes Wangler
    • Rudolf Von BünauJörg SchultzJohannes Wangler
    • G03B2754
    • G03F7/70066G03F7/70358
    • An illuminating device of a projection-microlithographic device includes a light source, an objective, and a device which produces a particular image field configuration. The device has fields which, in the direction of scanning movement, are separated at least in parts by a free zone, and are located in a peripheral region of the circular image field of a downstream projection objective in a manner at least approximating rotation symmetry. The integral of the quantity of light passing through the fields in the scanning direction are constant over the entire extent of the image field configuration in the direction at right angles to the scanning direction. Such an image field configuration replaces a conventional rectangular scanner slot formation whose width in the scanning direction corresponds to the forementioned integral of the image field configuration. The design of the image field configuration permits an approximately rotationally symmetric illumination of the projection objective.
    • 投影微光刻装置的照明装置包括光源,物镜和产生特定图像场配置的装置。 该装置具有在扫描方向上至少部分地通过自由区域分离的区域,并且以至少近似于旋转对称的方式位于下游投影物镜的圆形图像场的周边区域中。 在扫描方向上通过场的光量的积分在与扫描方向成直角的方向上的图像场构造的整个范围内是恒定的。 这样的图像场配置取代了扫描方向上的宽度对应于图像场配置的前述积分的常规矩形扫描器狭缝形状。 图像场配置的设计允许投影物镜的大致旋转对称的照明。