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    • 6. 发明授权
    • Laser chamber installation in and removal from a laser system housing
    • 激光室安装在激光系统外壳中并从中移除
    • US6111907A
    • 2000-08-29
    • US271040
    • 1999-03-17
    • Robert G. Ozarski
    • Robert G. Ozarski
    • H01S3/03H01S3/225H01S3/08
    • H01S3/03H01S3/225
    • A system for providing support for the movement of a laser chamber of a laser system during the installation and removal of the laser chamber from the laser system housing. The system includes a rail assembly that is retractable and extendible from the laser system housing and provides support for moving the laser chamber between an operating position within the housing and a position outside of the housing for removal. The rail assembly is retractable to reside within the housing when not in use. The system may also include at least one actuator for controlling the movement of the laser chamber in a direction having a vertical component. Actuator types that may be used include rotary, piston cylinder, hydraulic, pneumatic, and/or electrical mechanical. One type of rail assembly includes opposing rail structures that retract and extend by moving laterally out from the housing or by pivoting out from the housing. The system may be implemented with a gas laser system such as an excimer laser system.
    • 一种用于在从激光系统壳体安装和移除激光室期间为激光系统的激光室的移动提供支撑的系统。 该系统包括可从激光系统壳体缩回和延伸的轨道组件,并且提供支撑件,用于将激光室在壳体内的操作位置与壳体外部的位置之间移动以便移除。 轨道组件可缩回以在不使用时驻留在壳体内。 该系统还可以包括至少一个用于在具有垂直分量的方向上控制激光室的运动的致动器。 可以使用的致动器类型包括旋转,活塞气缸,液压,气动和/或电气机械。 一种类型的轨道组件包括相对的轨道结构,其通过从壳体侧向移出或通过从壳体枢转而缩回和延伸。 该系统可以用诸如准分子激光系统的气体激光系统来实现。
    • 8. 发明授权
    • Method for film thickness and refractive index determination
    • 薄膜厚度和折射率测定方法
    • US4909631A
    • 1990-03-20
    • US134638
    • 1987-12-18
    • Raul Y. TanDavid W. MyersRobert G. OzarskiJohn F. SchipperMichael P. C. Watts
    • Raul Y. TanDavid W. MyersRobert G. OzarskiJohn F. SchipperMichael P. C. Watts
    • G01B11/06G01N21/41
    • G01N21/41G01B11/065G01N2021/4126
    • Two methods for determination of thickness of a film of known material that is mounted on one face of a solid substrate of known material are disclosed, using: (1) inversion of an optical beam reflectivity equation; or (2) determination of the film thickness that minimizes the variance of the optical beam reflectivity, computed at each of a predetermined sequence of optical beam wavelengths. Four methods for determination of the (real) refractive index of a film of known thickness mounted on a face of a solid substrate of known material are disclosed, using: (1) minimization of absolute differences of computed and measured optical beam reflectivity, summed over a sequence of known film thicknesses, for assumed values of the refractive index; (2 and 3) two iterative techniques of promote convergence of an estimate of the index to a final value of the refractive index; or (4) solution of a quadratic equation whose coefficients are slowly varying functions of the solution variable.
    • 公开了两种用于确定安装在已知材料的固体基板的一个面上的已知材料的膜的厚度的方法:(1)反射光束反射率方程; 或(2)确定在预定的光束波长序列中计算出的光束反射率的方差最小化的膜厚度。 公开了用于确定安装在已知材料的固体基板的表面上的已知厚度的膜的(实际)折射率的四种方法,其使用:(1)最小化计算和测量的光束反射率的绝对差, 已知膜厚度序列,用于折射率的假设值; (2和3)两种迭代技术来促进指数估计与折射率的最终值的收敛; 或(4)二次方程的解,其系数是解变量的缓慢变化函数。