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    • 3. 发明申请
    • Thin-film transistor with vertical channel region
    • 具有垂直沟道区域的薄膜晶体管
    • US20060049461A1
    • 2006-03-09
    • US11261194
    • 2005-10-28
    • Paul SchueleApostolos Voutsas
    • Paul SchueleApostolos Voutsas
    • H01L27/12H01L21/84
    • H01L27/12H01L29/78624H01L29/78642H01L29/78648H01L29/78675
    • A vertical thin-film transistor (V-TFT) is provided along with a method for forming the V-TFT. The method comprises: providing a substrate made from a material such as Si, quartz, glass, or plastic; conformally depositing an insulating layer overlying the substrate; forming a gate, having sidewalls and a thickness, overlying a substrate insulation layer; forming a gate oxide layer overlying the gate sidewalls, and a gate insulation layer overlying the gate top surface; etching the exposed substrate insulation layer; forming a first source/drain region overlying the gate insulation layer; forming a second source/drain region overlying the substrate insulation layer, adjacent a first gate sidewall; and, forming a channel region overlying the first gate sidewall with a channel length about equal to the thickness of the gate, interposed between the first and second source/drain regions.
    • 提供垂直薄膜晶体管(V-TFT)以及用于形成V-TFT的方法。 该方法包括:提供由诸如Si,石英,玻璃或塑料的材料制成的衬底; 保形地沉积覆盖衬底的绝缘层; 形成具有覆盖衬底绝缘层的侧壁和厚度的栅极; 形成覆盖所述栅极侧壁的栅极氧化层,以及覆盖所述栅极顶表面的栅极绝缘层; 蚀刻暴露的基板绝缘层; 形成覆盖所述栅极绝缘层的第一源极/漏极区域; 在第一栅极侧壁附近形成覆盖衬底绝缘层的第二源极/漏极区域; 并且在第一和第二源极/漏极区域之间形成沟槽区域,该沟道区域覆盖具有大约等于栅极厚度的沟道长度的第一栅极侧壁。
    • 5. 发明授权
    • Method of forming a capacitor plate and a capacitor incorporating same
    • 形成电容器板的方法和结合其的电容器
    • US5955758A
    • 1999-09-21
    • US738789
    • 1996-10-29
    • Gurtej S. SandhuPaul SchueleWayne Kinney
    • Gurtej S. SandhuPaul SchueleWayne Kinney
    • H01L21/02H01L21/8242H01L21/8246H01L27/108
    • H01L27/11502H01L27/1085H01L27/11507H01L28/40H01L27/10852
    • A method of forming a capacitor includes, a) providing a node to which electrical connection to a capacitor is to be made; b) providing an electrically conductive first layer over the node; c) providing an electrically insulative barrier second layer over the first conductive layer; d) providing a third layer over the electrically insulative barrier layer, the third layer comprising a material which is either electrically conductive and resistant to oxidation, or forms an electrically conductive material upon oxidation; e) providing an insulating inorganic metal oxide dielectric layer over the electrically conductive third layer; f) providing an electrically conductive fourth layer over the insulating inorganic metal oxide dielectric layer; and g) providing an electrically conductive interconnect to extend over the second insulative layer and electrically interconnect the first and third conductive layers. A capacitor construction having such a dielectric layer in combination with the barrier layer and electrical interconnect of a first capacitor plate is disclosed.
    • 形成电容器的方法包括:a)提供与电容器进行电连接的节点; b)在节点上提供导电的第一层; c)在所述第一导电层之上提供电绝缘阻挡层第二层; d)在电绝缘阻挡层上提供第三层,第三层包括导电并耐氧化的材料,或者在氧化时形成导电材料; e)在导电的第三层之上提供绝缘的无机金属氧化物介电层; f)在绝缘无机金属氧化物介电层上提供导电第四层; 以及g)提供导电互连以在所述第二绝缘层上延伸并且使所述第一和第三导电层电互连。 公开了一种电容器结构,其具有与阻挡层和第一电容器板的电互连结合的这种介电层。
    • 6. 发明申请
    • Piezo-diode cantilever MEMS
    • 压电二极管悬臂MEMS
    • US20070278600A1
    • 2007-12-06
    • US11717231
    • 2007-03-13
    • Changqing ZhanPaul SchueleJohn ConleyJohn Hartzell
    • Changqing ZhanPaul SchueleJohn ConleyJohn Hartzell
    • H01L29/84H01L21/02
    • B81B3/0021H01L29/868
    • A piezo thin-film diode (piezo-diode) cantilever microelectromechanical system (MEMS) and associated fabrication processes are provided. The method deposits thin-films overlying a substrate. The substrate can be made of glass, polymer, quartz, metal foil, Si, sapphire, ceramic, or compound semiconductor materials. Amorphous silicon (a-Si), polycrystalline Si (poly-Si), oxides, a-SiGe, poly-SiGe, metals, metal-containing compounds, nitrides, polymers, ceramic films, magnetic films, and compound semiconductor materials are some examples of thin-film materials. A cantilever beam is formed from the thin-films, and a diode is embedded with the cantilever beam. The diode is made from a thin-film shared in common with the cantilever beam. The shared thin-film may a film overlying a cantilever beam top surface, a thin-film overlying a cantilever beam bottom surface, or a thin-film embedded within the cantilever beam.
    • 提供压电薄膜二极管(压电二极管)悬臂微机电系统(MEMS)及相关制造工艺。 该方法沉积覆盖在基底上的薄膜。 基板可以由玻璃,聚合物,石英,金属箔,Si,蓝宝石,陶瓷或化合物半导体材料制成。 非晶硅(a-Si),多晶Si(poly-Si),氧化物,a-SiGe,poly-SiGe,金属,含金属的化合物,氮化物,聚合物,陶瓷膜,磁性膜和化合物半导体材料是一些例子 的薄膜材料。 悬臂梁由薄膜形成,二极管嵌入悬臂梁。 二极管由与悬臂梁共用的薄膜制成。 共享的薄膜可以是覆盖悬臂梁顶表面的薄膜,覆盖悬臂梁底表面的薄膜或嵌入在悬臂梁内的薄膜。
    • 7. 发明申请
    • Digital-to-time converter
    • 数字时间转换器
    • US20070222493A1
    • 2007-09-27
    • US11439410
    • 2006-05-23
    • Themistokles AfentakisApostolos VoutsasPaul Schuele
    • Themistokles AfentakisApostolos VoutsasPaul Schuele
    • H03H11/26
    • H03K5/133H03K2005/00039H03K2005/00058
    • A digital-to-time converter (DTC) is provided, made from a plurality of series-connected cells. Each cell has an input interface to accept a signal, a control interface to accept a digital command, a delayed signal path, a minimum delay signal path, and an output interface. The signal path is selected in response to the command. The time delay associated with the delayed signal path of each cell can be varied, so that the plurality of series-connected cells is able to provide a large range of delay combinations. For example, if there are n series-connected cells, then the jth series-connected cell, where j varies from 1 to n, conducts the signal through 2j MOS gates in the delayed signal path. Assuming a digital control word with n bit places, the jth series-connected cell accepts the jth bit place of the control word to select a delay path.
    • 提供了由多个串联连接的单元制成的数字 - 时间转换器(DTC)。 每个单元具有接收信号的输入接口,接受数字命令的控制接口,延迟信号路径,最小延迟信号路径和输出接口。 响应命令选择信号路径。 可以改变与每个单元的延迟信号路径相关联的时间延迟,使得多个串联单元能够提供大范围的延迟组合。 例如,如果存在n个串联连接的单元,那么其中j从1变化到n的第j个串联单元通过延迟信号路径中的2个MOS栅极传导信号。 假设具有n位位置的数字控制字,第j个串联单元接受控制字的第j位,以选择延迟路径。
    • 9. 发明申请
    • Dual-gate thin-film transistor
    • 双栅极薄膜晶体管
    • US20060068532A1
    • 2006-03-30
    • US10953913
    • 2004-09-28
    • Paul SchueleApostolos Voutsas
    • Paul SchueleApostolos Voutsas
    • H01L21/84
    • G09G3/20G09G3/3208G09G3/3659G09G2300/08G09G2310/0262H01L29/78648
    • A dual-gate thin film transistor (DG-TFT) and associated fabrication method are provided. The method comprises: forming a first (back) gate in a first horizontal plane; forming source/drain (S/D) regions and an intervening channel region in a second horizontal plane, overlying the first plane; and, forming a second (top) gate in a third horizontal plane, overlying the second plane. The S/D regions and intervening channel region have a combined length, smaller than the length of the first gate. A substrate insulating layer is formed over the substrate, made from a material such as SiO2. A first gate insulation layer is formed over the first gate. Amorphous silicon (a-Si) is deposited over the first gate insulation layer and crystallized. The S/D and channel regions are formed from the crystallized Si layer. A second gate oxide layer is formed over the channel region.
    • 提供了双栅极薄膜晶体管(DG-TFT)和相关制造方法。 该方法包括:在第一水平面中形成第一(后)栅极; 在第一平面上形成源极/漏极(S / D)区域和在第二水平面中的中间沟道区域; 并且在第三水平面上形成覆盖第二平面的第二(顶部)门。 S / D区域和中间沟道区域具有小于第一栅极的长度的组合长度。 在衬底上形成衬底绝缘层,由诸如SiO 2的材料制成。 在第一栅极上形成第一栅极绝缘层。 非晶硅(a-Si)沉积在第一栅绝缘层上并结晶。 S / D和沟道区域由结晶的Si层形成。 在沟道区上形成第二栅氧化层。