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    • 4. 发明申请
    • Thin-film transistor with vertical channel region
    • 具有垂直沟道区域的薄膜晶体管
    • US20060049461A1
    • 2006-03-09
    • US11261194
    • 2005-10-28
    • Paul SchueleApostolos Voutsas
    • Paul SchueleApostolos Voutsas
    • H01L27/12H01L21/84
    • H01L27/12H01L29/78624H01L29/78642H01L29/78648H01L29/78675
    • A vertical thin-film transistor (V-TFT) is provided along with a method for forming the V-TFT. The method comprises: providing a substrate made from a material such as Si, quartz, glass, or plastic; conformally depositing an insulating layer overlying the substrate; forming a gate, having sidewalls and a thickness, overlying a substrate insulation layer; forming a gate oxide layer overlying the gate sidewalls, and a gate insulation layer overlying the gate top surface; etching the exposed substrate insulation layer; forming a first source/drain region overlying the gate insulation layer; forming a second source/drain region overlying the substrate insulation layer, adjacent a first gate sidewall; and, forming a channel region overlying the first gate sidewall with a channel length about equal to the thickness of the gate, interposed between the first and second source/drain regions.
    • 提供垂直薄膜晶体管(V-TFT)以及用于形成V-TFT的方法。 该方法包括:提供由诸如Si,石英,玻璃或塑料的材料制成的衬底; 保形地沉积覆盖衬底的绝缘层; 形成具有覆盖衬底绝缘层的侧壁和厚度的栅极; 形成覆盖所述栅极侧壁的栅极氧化层,以及覆盖所述栅极顶表面的栅极绝缘层; 蚀刻暴露的基板绝缘层; 形成覆盖所述栅极绝缘层的第一源极/漏极区域; 在第一栅极侧壁附近形成覆盖衬底绝缘层的第二源极/漏极区域; 并且在第一和第二源极/漏极区域之间形成沟槽区域,该沟道区域覆盖具有大约等于栅极厚度的沟道长度的第一栅极侧壁。
    • 6. 发明授权
    • Method of forming a capacitor plate and a capacitor incorporating same
    • 形成电容器板的方法和结合其的电容器
    • US5955758A
    • 1999-09-21
    • US738789
    • 1996-10-29
    • Gurtej S. SandhuPaul SchueleWayne Kinney
    • Gurtej S. SandhuPaul SchueleWayne Kinney
    • H01L21/02H01L21/8242H01L21/8246H01L27/108
    • H01L27/11502H01L27/1085H01L27/11507H01L28/40H01L27/10852
    • A method of forming a capacitor includes, a) providing a node to which electrical connection to a capacitor is to be made; b) providing an electrically conductive first layer over the node; c) providing an electrically insulative barrier second layer over the first conductive layer; d) providing a third layer over the electrically insulative barrier layer, the third layer comprising a material which is either electrically conductive and resistant to oxidation, or forms an electrically conductive material upon oxidation; e) providing an insulating inorganic metal oxide dielectric layer over the electrically conductive third layer; f) providing an electrically conductive fourth layer over the insulating inorganic metal oxide dielectric layer; and g) providing an electrically conductive interconnect to extend over the second insulative layer and electrically interconnect the first and third conductive layers. A capacitor construction having such a dielectric layer in combination with the barrier layer and electrical interconnect of a first capacitor plate is disclosed.
    • 形成电容器的方法包括:a)提供与电容器进行电连接的节点; b)在节点上提供导电的第一层; c)在所述第一导电层之上提供电绝缘阻挡层第二层; d)在电绝缘阻挡层上提供第三层,第三层包括导电并耐氧化的材料,或者在氧化时形成导电材料; e)在导电的第三层之上提供绝缘的无机金属氧化物介电层; f)在绝缘无机金属氧化物介电层上提供导电第四层; 以及g)提供导电互连以在所述第二绝缘层上延伸并且使所述第一和第三导电层电互连。 公开了一种电容器结构,其具有与阻挡层和第一电容器板的电互连结合的这种介电层。
    • 7. 发明申请
    • Adjacent planar and non-planar thin-film transistor
    • 相邻的平面和非平面薄膜晶体管
    • US20070228471A1
    • 2007-10-04
    • US11807075
    • 2007-05-25
    • Paul SchueleApostolos Voutsas
    • Paul SchueleApostolos Voutsas
    • H01L27/12
    • H01L27/12H01L29/78624H01L29/78642H01L29/78648H01L29/78675
    • A method is provided for concurrently forming MP-TFTs and P-TFTs. Generally, the method comprises: forming a P-TFT having source/drain (S/D) regions, an intervening channel region, and a gate, all in a first horizontal plane; and simultaneously forming a MP-TFT having a first gate in the first horizontal plane and at least one S/D region in a second horizontal plane, overlying the first horizontal plane. The vertical TFT (V-TFT) is an MP-TFT having vertical first gate sidewalls and a vertical channel region overlying a gate sidewall. The dual-gate TFT (DG-TFT) is an MP-TFT having a bottom gate, first and second S/D regions with top surfaces, an intervening channel region with a top surface, and a second, top gate with a bottom surface, all in a second horizontal plane, overlying the first horizontal plane.
    • 提供了用于同时形成MP-TFT和P-TFT的方法。 通常,该方法包括:在第一水平面中形成具有源极/漏极(S / D)区域,中间沟道区域和栅极的P-TFT; 同时在第一水平面上形成具有第一栅极的MP-TFT和位于第一水平面上的第二水平面中的至少一个S / D区域。 垂直TFT(V-TFT)是具有垂直的第一栅极侧壁和覆盖栅极侧壁的垂直沟道区的MP-TFT。 双栅极TFT(DG-TFT)是具有底栅,具有顶表面的第一和第二S / D区,具有顶表面的中间沟道区和具有底表面的第二顶栅的MP-TFT 都在第二个水平面上,覆盖着第一个水平面。
    • 8. 发明申请
    • Sidewall gate thin-film transistor
    • 侧壁栅极薄膜晶体管
    • US20060246637A1
    • 2006-11-02
    • US11479221
    • 2006-06-30
    • Apostolos VoutsasPaul Schuele
    • Apostolos VoutsasPaul Schuele
    • H01L21/84H01L21/00
    • H01L27/1251H01L27/1214H01L29/6675H01L29/78642
    • A sidewall gate thin-film transistor (TFT) and associated fabrication method are provided. The method provides a substrate with a surface and forms a surface-normal feature. The surface-normal feature is normal with respect to the substrate surface, with a sidewall made from an electrical insulator. An active silicon (Si) layer is formed overlying the surface-normal feature, with a channel overlying the surface-normal feature sidewall. A gate insulator overlies the channel, and a sidewall gate overlies the gate insulator. More specifically, the gate insulator is formed from conformally depositing an electrical insulator layer overlying the active Si layer. The gate electrode layer is conformally deposited overlying the gate insulator layer and anisotropically etched, leaving a gate electrode sidewall adjacent to the gate insulator layer overlying the channel.
    • 提供了侧壁栅极薄膜晶体管(TFT)和相关的制造方法。 该方法提供具有表面的基底并形成表面法线特征。 表面法线特征相对于基底表面是正常的,具有由电绝缘体制成的侧壁。 形成覆盖表面法线特征的活性硅(Si)层,覆盖表面法线特征侧壁的沟道。 栅极绝缘体覆盖沟道,并且侧壁栅极覆盖栅极绝缘体。 更具体地说,栅极绝缘体通过共形沉积覆盖有源Si层的电绝缘体层形成。 栅极电极层被共形沉积在栅极绝缘体层上并各向异性蚀刻,留下与栅极绝缘体层相邻的栅电极侧壁。
    • 10. 发明申请
    • Simultaneous planar and non-planar thin-film transistor processes
    • 同时平面和非平面薄膜晶体管工艺
    • US20050239238A1
    • 2005-10-27
    • US10985587
    • 2004-11-09
    • Paul SchueleApostolos Voutsas
    • Paul SchueleApostolos Voutsas
    • H01L29/10H01L29/76H01L29/786
    • H01L27/12H01L29/78624H01L29/78642H01L29/78648H01L29/78675
    • A method is provided for concurrently forming MP-TFTs and P-TFTs. Generally, the method comprises: forming a P-TFT having source/drain (S/D) regions, an intervening channel region, and a gate, all in a first horizontal plane; and simultaneously forming a MP-TFT having a first gate in the first horizontal plane and at least one S/D region in a second horizontal plane, overlying the first horizontal plane. The vertical TFT (V-TFT) is an MP-TFT having vertical first gate sidewalls and a vertical channel region overlying a gate sidewall. The dual-gate TFT (DG-TFT) is an MP-TFT having a bottom gate, first and second S/D regions with top surfaces, an intervening channel region with a top surface, and a second, top gate with a bottom surface, all in a second horizontal plane, overlying the first horizontal plane.
    • 提供了用于同时形成MP-TFT和P-TFT的方法。 通常,该方法包括:在第一水平面中形成具有源极/漏极(S / D)区域,中间沟道区域和栅极的P-TFT; 同时在第一水平面上形成具有第一栅极的MP-TFT和位于第一水平面上的第二水平面中的至少一个S / D区域。 垂直TFT(V-TFT)是具有垂直的第一栅极侧壁和覆盖栅极侧壁的垂直沟道区的MP-TFT。 双栅极TFT(DG-TFT)是具有底栅,具有顶表面的第一和第二S / D区,具有顶表面的中间沟道区和具有底表面的第二顶栅的MP-TFT 都在第二个水平面上,覆盖着第一个水平面。