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1. 发明授权

US08017564B2 Lubrication by exposure to light 有权
标题翻译：通过曝光润滑
公开(公告)号：US08017564B2
公开(公告)日：2011-09-13
申请号：US12064025
申请日：2006-08-18
申请人： Thomas Schimmel , Othmar Marti
发明人： Thomas Schimmel , Othmar Marti
IPC分类号： C10M135/00 , C10M129/04
CPC分类号： F16N15/00 , C10M105/72 , C10M177/00 , C10M2219/081
摘要： The present invention concerns a method for a location and/or time-dependent alteration of the friction coefficient and/or adhesion force between two bodies, which includes irradiation of one or both contact surfaces between the bodies with radiation, use of the method according to the invention for location and/or time-dependent alteration of the friction coefficient and/or adhesion force between to bodies, a system that includes two bodies in which the friction coefficient and/or the adhesion force between the bodies can be temporarily or permanently altered, and a device for location and/or time-dependent regulation of the friction coefficient and/or adhesion force which includes the system according to the invention and a control unit.
摘要翻译：本发明涉及一种用于两个体之间的摩擦系数和/或粘附力的位置和/或时间依赖性变化的方法，其包括用辐射照射身体之间的一个或两个接触表面，使用根据本发明用于在物体之间的摩擦系数和/或粘附力的位置和/或时间依赖性改变，包括两个主体的系统，其中摩擦系数和/或物体之间的粘附力可以暂时或永久地改变以及包括根据本发明的系统和控制单元的摩擦系数和/或粘附力的位置和/或时间依赖性调节装置。

2. 发明申请

US20100313311A1 Scanning probe in pulsed-force mode, digital and in real time 有权
标题翻译：以脉冲力模式扫描探头，数字和实时
公开(公告)号：US20100313311A1
公开(公告)日：2010-12-09
申请号：US12804110
申请日：2010-07-14
申请人： Peter Spizig , Detief Sanchen , Jörg Förstner , Joachim Koenen , Othmar Marti , Gerhard Volswinkler
发明人： Peter Spizig , Detief Sanchen , Jörg Förstner , Joachim Koenen , Othmar Marti , Gerhard Volswinkler
IPC分类号： G01Q30/04
CPC分类号： G01Q60/34 , G01Q10/06 , G01Q30/04 , G01Q60/32
摘要： A microscope, in particular a scanning probe microscope, comprising a programmable logic device.
摘要翻译：显微镜，特别是扫描探针显微镜，包括可编程逻辑器件。

3. 发明授权

US07877816B2 Scanning probe in pulsed-force mode, digital and in real time 有权
标题翻译：以脉冲力模式扫描探头，数字和实时
公开(公告)号：US07877816B2
公开(公告)日：2011-01-25
申请号：US11584843
申请日：2006-10-23
申请人： Peter Spizig , Detlef Sanchen , Jörg Förstner , Joachim Koenen , Othmar Marti , Gerhard Volswinkler
发明人： Peter Spizig , Detlef Sanchen , Jörg Förstner , Joachim Koenen , Othmar Marti , Gerhard Volswinkler
IPC分类号： G01N13/12
CPC分类号： G01Q10/06 , G01Q30/04 , G01Q60/32 , Y10S977/85 , Y10S977/851 , Y10S977/852 , Y10S977/86
摘要： Microscope, in particular a scanning probe microscope, comprising a programmable logic device.
摘要翻译：显微镜，特别是扫描探针显微镜，包括可编程逻辑器件。

4. 发明申请

US20080312109A1 Lubrication by Exposure to Light 有权
标题翻译：曝光润滑
公开(公告)号：US20080312109A1
公开(公告)日：2008-12-18
申请号：US12064025
申请日：2006-08-18
申请人： Thomas Schimmel , Othmar Marti
发明人： Thomas Schimmel , Othmar Marti
IPC分类号： F16C33/20
CPC分类号： F16N15/00 , C10M105/72 , C10M177/00 , C10M2219/081
摘要： The present invention concerns a method for a location and/or time-dependent alteration of the friction coefficient and/or adhesion force between two bodies, which includes irradiation of one or both contact surfaces between the bodies with radiation, use of the method according to the invention for location and/or time-dependent alteration of the friction coefficient and/or adhesion force between to bodies, a system that includes two bodies in which the friction coefficient and/or the adhesion force between the bodies can be temporarily or permanently altered, and a device for location and/or time-dependent regulation of the friction coefficient and/or adhesion force which includes the system according to the invention and a control unit.
摘要翻译：本发明涉及一种用于两个物体之间的摩擦系数和/或粘附力的位置和/或时间依赖性变化的方法，其包括用辐射照射身体之间的一个或两个接触表面，使用根据本发明用于在物体之间的摩擦系数和/或粘附力的位置和/或时间依赖性改变，包括两个主体的系统，其中摩擦系数和/或物体之间的粘附力可以暂时或永久地改变以及包括根据本发明的系统和控制单元的摩擦系数和/或粘附力的位置和/或时间依赖性调节装置。

5. 发明授权

US06703614B1 Method for determining the distance of a near-field probe from a specimen surface to be examined, and near-field microscope 失效
标题翻译：用于确定近场探针距待检查样本表面的距离的方法以及近场显微镜
公开(公告)号：US06703614B1
公开(公告)日：2004-03-09
申请号：US09442429
申请日：1999-11-17
申请人： Thomas Stifter , Othmar Marti , Robert Brunner
发明人： Thomas Stifter , Othmar Marti , Robert Brunner
IPC分类号： G01B528
CPC分类号： G01Q10/06 , G01N33/442 , G01N33/483 , G01Q10/02 , G01Q20/00 , G01Q60/18 , Y10S977/851 , Y10S977/862
摘要： A method for determining the distance of a scanning probe of a scanning probe microscope from a specimen surface to be examined comprising the steps of: exciting the scanning probe to oscillations lateral to a surface to be examined; recording at least one amplitude signal and a frequency signal and a phase signal of the oscillating scanning probe; superimposing a vertically oscillating movement of the scanning probe and specimen surface to be examined relative to one another is superimposed on the oscillation of the scanning probe lateral to the specimen surface to be examined; and determining the distance of the scanning probe from the specimen surface from at least one of the amplitude signal and a frequency signal and a phase signal.
摘要翻译：一种用于确定扫描探针显微镜的扫描探针距待检查样本的距离的方法，包括以下步骤：将扫描探针激发到要检查的表面的振荡; 记录振荡扫描探头的至少一个振幅信号和频率信号和相位信号; 将待检查的扫描探针和样品表面的垂直摆动运动相对于彼此重叠叠加在扫描探针的被检测样品表面侧面的振荡上; 以及从所述振幅信号和频率信号以及相位信号中的至少一个确定所述扫描探针与所述检测体表面的距离。

6. 发明授权

US08286261B2 Scanning probe in pulsed-force mode, digital and in real time 有权
标题翻译：以脉冲力模式扫描探头，数字和实时
公开(公告)号：US08286261B2
公开(公告)日：2012-10-09
申请号：US12804110
申请日：2010-07-14
申请人： Peter Spizig , Detief Sanchen , Jörg Förstner , Joachim Koenen , Othmar Marti , Gerhard Volswinkler
发明人： Peter Spizig , Detief Sanchen , Jörg Förstner , Joachim Koenen , Othmar Marti , Gerhard Volswinkler
IPC分类号： G01Q60/00
CPC分类号： G01Q60/34 , G01Q10/06 , G01Q30/04 , G01Q60/32
摘要： A microscope, in particular a scanning probe microscope, comprising a programmable logic device.
摘要翻译：显微镜，特别是扫描探针显微镜，包括可编程逻辑器件。

7. 发明授权

US07129486B2 Scanning probe with digitized pulsed-force mode operation and real-time evaluation 有权
标题翻译：扫描探头采用数字化脉冲力模式操作和实时评估
公开(公告)号：US07129486B2
公开(公告)日：2006-10-31
申请号：US10433917
申请日：2001-12-12
申请人： Peter Spizig , Detlef Sanchen , Jörg Förstner , Joachim Koenen , Othmar Marti
发明人： Peter Spizig , Detlef Sanchen , Jörg Förstner , Joachim Koenen , Othmar Marti
IPC分类号： G01N23/00
CPC分类号： G01Q60/34 , G01Q10/06 , G01Q30/04 , G01Q60/32
摘要： The invention relates to a method for creating the image of a sample surface to be analyzed, with a resolution which is better than 1 μm laterally in relation to the sample surface and better than 100 nm vertically in relation to said surface. According to the invention, the surface is scanned on a point-by-point basis by a scanning probe, the distance between the scanning probe and the sample surface at each scanning point being periodically modulated, in such a way that a force-time curve of the probe is produced for this point. The force-time curve is recorded at each scanning point, digitized using an A/D converter, evaluated online in real-time and stored, together with the entire data stream, in a first area of a memory device. One or several characteristic variables of the force-time curves are determined for each scanning point from the real-time evaluation results and the stored digitized force-time curves and an image of the sample surface is obtained from said characteristic variables of the scanning points.
摘要翻译：本发明涉及一种用于创建待分析样品表面的图像的方法，其分辨率相对于样品表面横向优于1μm，相对于所述表面垂直于100nm。根据本发明，通过扫描探针逐点扫描表面，在每个扫描点处扫描探针和样品表面之间的距离被周期性地调制，使得力 - 时间曲线的探针是为此而产生的。在每个扫描点记录力 - 时间曲线，使用A / D转换器进行数字化，实时在线评估，并与整个数据流一起存储在存储器件的第一区域中。从实时评估结果和存储的数字化力 - 时间曲线确定每个扫描点的力 - 时间曲线的一个或几个特征变量，并且从扫描点的所述特征变量获得样本表面的图像。

8. 发明申请

US20070114406A1 Scanning probe in pulsed-force mode, digital and in real time 有权
标题翻译：以脉冲力模式扫描探头，数字和实时
公开(公告)号：US20070114406A1
公开(公告)日：2007-05-24
申请号：US11584843
申请日：2006-10-23
申请人： Peter Spizig , Detlef Sanchen , Jorg Forstner , Joachim Koenen , Othmar Marti , Gerhard Volswinkler
发明人： Peter Spizig , Detlef Sanchen , Jorg Forstner , Joachim Koenen , Othmar Marti , Gerhard Volswinkler
IPC分类号： G21K7/00
CPC分类号： G01Q10/06 , G01Q30/04 , G01Q60/32 , Y10S977/85 , Y10S977/851 , Y10S977/852 , Y10S977/86
摘要： Microscope, in particular a scanning probe microscope, comprising a programmable logic device
摘要翻译：显微镜，特别是扫描探针显微镜，包括可编程逻辑器件

9. 发明授权

US06880386B1 Method and device for simultaneously determining the adhesion, friction, and other material properties of a sample surface 有权
标题翻译：用于同时测定样品表面的粘合性，摩擦性和其它材料性质的方法和装置
公开(公告)号：US06880386B1
公开(公告)日：2005-04-19
申请号：US09869789
申请日：2000-01-04
申请人： Hans-Ulrich Krotil , Thomas Stifter , Othmar Marti
发明人： Hans-Ulrich Krotil , Thomas Stifter , Othmar Marti
IPC分类号： G01N13/00 , G01N19/02 , G01N19/04 , G01Q20/02 , G01Q60/26 , G01Q60/28 , G01N13/16 , G01B11/30 , G01B21/30
CPC分类号： G01Q60/26 , G01N19/02 , G01N19/04 , G01Q20/02 , G01Q60/28
摘要： A process for the location-resolved simultaneous detection of the adhesion and friction as well as possibly of other material properties of a sample surface to be examined by means of a raster probe microscope comprising a raster probe. The raster probe and/or the sample with sample surface are moved until at a point of the sample surface to be examined the raster probe interacts in a determined manner with this surface. The raster probe and/or the sample are subjected to a vertical oscillation, and a first measuring signal characterized by the deformation of the raster probe is recorded. A second measuring signal characterizing the deformation of the raster probe is recorded, wherein the raster probe and/or the sample are subjected to a horizontal and/or vertical oscillation. From these two measuring signals the desired material properties are determined. For the detection of the entire surface area to be examined the raster probe and or the sample are again moved and for the repetition of the measuring process described brought into contact with the sample surface in the above described manner.
摘要翻译：用于通过包括光栅探针的光栅探针显微镜同时检测粘合和摩擦以及可能通过待检查的样品表面的其它材料性质的位置分辨的方法。光栅探针和/或具有样品表面的样品被移动直到待检测的样品表面的点处，光栅探针以确定的方式与该表面相互作用。光栅探针和/或样品经受垂直振荡，并且记录由光栅探针的变形表征的第一测量信号。记录表征光栅探针的变形的第二测量信号，其中光栅探针和/或样品经受水平和/或垂直振荡。从这两个测量信号中，确定所需的材料性质。为了检测待检查的整个表面区域，再次移动光栅探针和/或样品，并且以上述方式重复与描述的样品表面接触的测量过程。

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