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1. 发明申请

US20100066998A1 SURFACE INSPECTION APPARATUS 有权
标题翻译：表面检查装置
公开(公告)号：US20100066998A1
公开(公告)日：2010-03-18
申请号：US12595699
申请日：2008-04-25
申请人： Yoshinori Hayashi , Masao Kawamura , Hideki Mori
发明人： Yoshinori Hayashi , Masao Kawamura , Hideki Mori
IPC分类号： G01N21/00
CPC分类号： G01N21/9503
摘要： [Problem] To provide a surface inspection apparatus able to suitably inspect the outer circumference edge part of a semiconductor wafer or other plate-shaped member.[Technical Solution] A semiconductor wafer inspection apparatus 10 has a camera lens 22 arranged facing an outer circumference edge part 101 of a semiconductor wafer 100, an imaging surface 24 arranged facing an outer circumference end face of a semiconductor wafer 100 via the camera lens 22, a mirror 12 forming an image of a first outer circumference bevel surface 101b of the semiconductor wafer 100 on the imaging surface 24 via the camera lens 22, a mirror 14 forming an image of a second outer circumference bevel surface 101c of the semiconductor wafer 100 on the imaging surface 24 via the camera lens 22, a correction lens 26 forming an image of an outer circumference end face 101a of the semiconductor wafer 100 on the imaging surface 24 via the center part of the camera lens 22, and an illumination light guide lamp part 18 illuminating surfaces so that, compared with the outer circumference end face 101a, the first outer circumference bevel surface 101b and second outer circumference bevel surface 101c become brighter.
摘要翻译： [问题]提供一种能够适当地检查半导体晶片或其他板状部件的外周缘部的表面检查装置。技术方案半导体晶片检查装置10具有面向半导体晶片100的外周缘部101配置的摄像透镜22，经由照相机镜头22配置成与半导体晶片100的外周端面相对配置的摄像面24 ，通过照相机镜头22在成像面24上形成半导体晶片100的第一外周斜面101b的图像的反射镜12，形成半导体晶片100的第二外周斜面101c的图像的反射镜通过照相机镜头22在成像表面24上，通过照相机镜头22的中心部分在成像表面24上形成半导体晶片100的外周端面101a的图像的校正透镜26和照明光导灯部18照射表面，使得与外周端面101a相比，第一外周斜面101b和第二外圆周面斜面101c变得更亮。

2. 发明申请

US20090251294A1 ARTICLE MANAGEMENT SYSTEM AND ARTICLE MANAGEMENT METHOD 审中-公开
标题翻译：文章管理系统与文章管理方法
公开(公告)号：US20090251294A1
公开(公告)日：2009-10-08
申请号：US12295564
申请日：2007-03-30
申请人： Masao Kawamura , Kou Takesaki , Kentaro Yamasaki
发明人： Masao Kawamura , Kou Takesaki , Kentaro Yamasaki
IPC分类号： H04Q5/22
CPC分类号： G06Q10/087
摘要： As an assembly 50 of articles of management targets, a serial number that becomes a consecutive number is recorded in each of RFID tags 1, 2, . . . , 12 attended to cardboard boxes 31, 32, . . . , 42 in which articles are stored and a flag, by which the total number of articles that becomes a management target of articles can be calculated, is recorded in at least one of RFID tags. For example, the serial numbers are consecutive numbers starting from one, and the total number of articles is recorded in the flags of all of the RFID tags, or an end flag indicating the last is recorded in the flag of the last RFID tag. The serial numbers are consecutive numbers starting an arbitrary number, a start flag indicating the first is recorded in the flag of the first RFID tag and an end flag indicating the last is recorded in the flag of the last RFID tag, or the total number is recorded in the flag of the last RFID tag.
摘要翻译：作为管理目标的组件50，在每个RFID标签1,2中记录成为连续数的序列号。。。，12人出席了纸箱31,32。。。 42，其中存储有物品，并且可以计算成为物品的管理目标物品的总数的标志，记录在至少一个RFID标签中。例如，序列号是从1开始的连续数字，并且总数量记录在所有RFID标签的标志中，或者表示最后的标签的结束标记记录在最后的RFID标签的标志中。序列号是从任意数字开始的连续数字，表示第一个的起始标志记录在第一RFID标签的标志中，表示最后一个的结束标志记录在最后一个RFID标签的标志中，或者总数是记录在最后一个RFID标签的旗帜上。

3. 发明授权

US5011788A Process of manufacturing semiconductor integrated circuit device and product formed thereby 失效
标题翻译：制造半导体集成电路器件的工艺和由此形成的产品
公开(公告)号：US5011788A
公开(公告)日：1991-04-30
申请号：US284557
申请日：1988-12-15
申请人： Mikinori Kawaji , Toshihiko Takakura , Akihisa Uchida , Shigeo Kuroda , Yoichi Tamaki , Takeo Shiba , Kazuhiko Sagara , Masao Kawamura
发明人： Mikinori Kawaji , Toshihiko Takakura , Akihisa Uchida , Shigeo Kuroda , Yoichi Tamaki , Takeo Shiba , Kazuhiko Sagara , Masao Kawamura
IPC分类号： H01L21/762 , H01L21/763 , H01L29/732
CPC分类号： H01L21/763 , H01L21/76224 , H01L29/7325 , Y10S148/05
摘要： A bipolar type of semiconductor integrated circuit device is provided with U-shaped grooves which are formed by cutting a main surface of a semiconductor body to form isolation regions between bipolar transistors. A silicon oxide film can be formed in the U-shaped grooves by thermal oxidation simultaneously with the formation of a silicon oxide film used to form isolation regions between each collector contact region and base region. No separate step is needed for forming the silicon oxide film between the collector contact region and the base region. The thickness of the silicon oxide film can be controlled, and has a sufficient thickness even at its two edges, i.e., at its boundaries with the U-shaped grooves, so that the bipolar transistors exhibit good electrical characteristics. Namely, the collector resistance thereof does not increase, and the breakdown voltage at the pn junction between the collector region and the base region does not decrease. The U-shaped grooves can each comprise narrow and deep sub-grooves, with thick oxide films formed on the surfaces of the sub-grooves and a thick oxide film formed on a surface of an area between the sub-grooves, and with wiring formed on the oxide on the area between the sub-grooves.

4. 发明授权

US4943655A Salt of 5-acetyl-2-alkylbenzenesulfonic acid 失效
标题翻译： 5-乙酰基-2-烷基苯磺酸盐
公开(公告)号：US4943655A
公开(公告)日：1990-07-24
申请号：US328388
申请日：1989-03-24
申请人： Kunioki Kato , Masao Kawamura , Hiroshi Goda , Kiyoshi Sawada , Kazuhiro Hamatani
发明人： Kunioki Kato , Masao Kawamura , Hiroshi Goda , Kiyoshi Sawada , Kazuhiro Hamatani
IPC分类号： C07C20060101 , C07C309/30 , C07C311/15
CPC分类号： C07C309/00
摘要： Process for preparing 2-alkyl-5-haloacetylbenzenesulfonamide represented by the general formula (1), ##STR1## (wherein R.sup.1 is an alkyl group having 1 to 5 carbon atoms; and X is a chlorine atom, bromine atom or iodine atom), characterized by halogenating a 5-acetyl-2-alkylbenzenesulfonamide represented by the general formula (2), ##STR2## (wherein R.sup.1 is the same as defined above) in a lower alcohol represented by the general formula (3),R.sup.4 --OH(wherein R.sup.4 is an alkyl group having 1 to 5 carbon atoms).

5. 发明授权

US4859998A Apparatus and method for driving signal electrodes for liquid crystal display devices 失效
标题翻译：用于驱动液晶显示装置的信号电极的装置和方法
公开(公告)号：US4859998A
公开(公告)日：1989-08-22
申请号：US207020
申请日：1988-06-14
申请人： Masao Kawamura , Minoru Usui
发明人： Masao Kawamura , Minoru Usui
IPC分类号： G09G3/36 , G02F1/133 , H04N3/12
CPC分类号： H04N3/127
摘要： A signal electrode drive circuit for driving a liquid crystal display panel includes a latch circuit for latching a digitized video signal, a buffer, a graduation signal-forming circuit, an intensity modulation pulse-generating circuit, and an analog multiplexer. The latch circuit holds the video data only once during one horizontal scanning period until a next latch pulse M is generated, thus considerably reducing current dissipation.
摘要翻译：用于驱动液晶显示面板的信号电极驱动电路包括用于锁存数字化视频信号的锁存电路，缓冲器，刻度信号形成电路，强度调制脉冲发生电路和模拟多路复用器。锁存电路在一个水平扫描周期期间仅保持一次视频数据，直到产生下一个锁存脉冲M，从而大大减少了电流消耗。

6. 发明授权

US4835317A 4-tert.-butyl-1,2-benzenedithiol, complex compounds derived therefrom, and a method of producing the same 失效
标题翻译： 4-叔丁基-1,2-苯二硫醇，由其衍生的络合物及其制备方法
公开(公告)号：US4835317A
公开(公告)日：1989-05-30
申请号：US143643
申请日：1988-01-13
申请人： Michio Suzuki , Masao Kawamura , Kunioki Kato , Masahide Takahashi , Tsuyoshi Morishita , Kazuyuki Nakayama , Akio Nakatsuka
发明人： Michio Suzuki , Masao Kawamura , Kunioki Kato , Masahide Takahashi , Tsuyoshi Morishita , Kazuyuki Nakayama , Akio Nakatsuka
IPC分类号： C07F1/00 , C07F15/00 , C07F15/04 , C07F15/06
CPC分类号： C07C323/00 , C07F1/005 , C07F15/0093 , C07F15/045 , C07F15/065
摘要： Novel compounds, 4-tert.-butyl-1,2-benzenedithiol and bis(4-tert.-butyl-1,2-dithiophenolate) metal complexes having the general formula of ##STR1## wherein M represents a trivalent transition metal, and A represents a quarternary ammonium are provided.The novel benzenedithiol is produced by reacting 4-tert.-butylbenzenethiol or di(4-tert.-butylphenyl)disulfide with sulfur monochloride in the presence of iodine or a Lewis acid in a solvent, and then reducing the resultant product with a metal selected from the group consisting of zinc, tin, iron and aluminum in the presence of an acid.The novel Cu, Co and Ni complexes are produced by reacting the benzenedithiol with a salt of the corresponding divalent transition metal in the presence of an alkoxide metal or a hydride metal and a quarternary ammonium salt in a solvent under an oxidative atmosphere.The complexes strongly absorb rays in the region of ultraviolet, visible or near infrared, and are useful intermediates for the production of optical information recording media.

7. 发明授权

US4273941A Process for producing p-hydroxybenzaldehyde 失效
标题翻译：对羟基苯甲醛生产方法
公开(公告)号：US4273941A
公开(公告)日：1981-06-16
申请号：US55414
申请日：1979-07-06
申请人： Masao Kawamura , Tadaaki Nishi , Kunioki Kato , Hiroshi Mizokami , Tadashi Kanazawa
发明人： Masao Kawamura , Tadaaki Nishi , Kunioki Kato , Hiroshi Mizokami , Tadashi Kanazawa
IPC分类号： C07C45/64 , C07C85/11 , C07C89/00
CPC分类号： C07C45/64
摘要： A process for producing p-hydroxybenzaldehyde through p-aminobenzaldehyde from p-nitrotoluene, comprising reacting p-nitrotoluene with sodium polysulphide in an alcohol-alkali aqueous solution mixed solvent in the presence or absence of an aprotic polar compound to produce p-aminobenzaldehyde, diazotizing the p-aminobenzaldehyde and then hydrolyzing the diazotized p-aminobenzaldehyde to produce p-hydroxybenzaldehyde.
摘要翻译：在对硝基甲苯中通过对氨基苯甲醛生产对羟基苯甲醛的方法，包括在存在或不存在非质子极性化合物的情况下，将对硝基甲苯与多硫化钠在醇 - 碱水溶液混合溶剂中反应生成对氨基苯甲醛，重氮化对氨基苯甲醛，然后水解重氮化的对氨基苯甲醛以产生对羟基苯甲醛。

8. 发明授权

US4201239A Sealing device for a valve 失效
标题翻译：阀门密封装置
公开(公告)号：US4201239A
公开(公告)日：1980-05-06
申请号：US879265
申请日：1978-02-21
申请人： Masao Kawamura
发明人： Masao Kawamura
IPC分类号： F16J15/00 , F16K1/226 , F16K5/06
CPC分类号： F16J15/008 , F16K1/2266 , Y10T137/1797
摘要： A sealing device is provided for use in a butterfly valve, ball valve or the like wherein a seal ring is provided which forms a seal in co-operation with a rotating valve member, in which the seal is held in position by an annular pressure member which is impelled towards the body of the valve by springs, and whose inner periphery is adapted to form an emergency seal in co-operation with the valve member, should the seal itself be damaged or destroyed by fire.
摘要翻译：提供一种用于蝶阀，球阀等的密封装置，其中提供密封环，其与旋转的阀构件形成密封，所述密封环与旋转的阀构件相配合，其中密封件通过环形压力构件如果密封件本身被火灾破坏或破坏，其通过弹簧被推向阀的主体，并且其内周适于与阀构件协作地形成紧急密封件。

9. 发明授权

US4195041A Process for producing p-hydroxybenzaldehyde 失效
标题翻译：对羟基苯甲醛生产方法
公开(公告)号：US4195041A
公开(公告)日：1980-03-25
申请号：US938125
申请日：1978-08-30
申请人： Masao Kawamura , Tadaaki Nishi , Kunioki Kato , Hiroshi Mizokami , Tadashi Kanazawa
发明人： Masao Kawamura , Tadaaki Nishi , Kunioki Kato , Hiroshi Mizokami , Tadashi Kanazawa
IPC分类号： C07C45/64 , C07C45/00
CPC分类号： C07C45/64
摘要： A process for producing p-hydroxybenzaldehyde through p-aminobenzaldehyde from p-nitrotoluene, comprising reacting p-nitrotoluene with sodium polysulphide in an alcohol-alkali aqueous solution mixed solvent in the presence or absence of an aprotic polar compound to produce p-aminobenzaldehyde, diazotizing the p-aminobenzaldehyde and then hydrolyzing the diazotized p-aminobenzaldehyde to produce p-hydroxybenzaldehyde.
摘要翻译：在对硝基甲苯中通过对氨基苯甲醛生产对羟基苯甲醛的方法，包括在存在或不存在非质子极性化合物的情况下，将对硝基甲苯与多硫化钠在醇 - 碱水溶液混合溶剂中反应生成对氨基苯甲醛，重氮化对氨基苯甲醛，然后水解重氮化的对氨基苯甲醛以产生对羟基苯甲醛。

10. 发明授权

US08023111B2 Surface inspection apparatus 有权
标题翻译：表面检查装置
公开(公告)号：US08023111B2
公开(公告)日：2011-09-20
申请号：US12595699
申请日：2008-04-25
申请人： Yoshinori Hayashi , Masao Kawamura , Hideki Mori
发明人： Yoshinori Hayashi , Masao Kawamura , Hideki Mori
IPC分类号： G01N21/88
CPC分类号： G01N21/9503
摘要： A semiconductor wafer inspection apparatus for inspecting an outer circumference edge part of a semiconductor wafer. The apparatus has a camera lens arranged facing an outer circumference edge part of a semiconductor wafer, an imaging surface arranged facing an outer circumference end face of a semiconductor wafer via the camera lens, a mirror forming an image of a first outer circumference bevel surface of the semiconductor wafer on the imaging surface via the camera lens, a mirror forming an image of a second outer circumference bevel surface of the semiconductor wafer on the imaging surface via the camera lens, a correction lens forming an image of an outer circumference end face of the semiconductor wafer on the imaging surface via the center part of the camera lens, and an illumination light guide lamp part illuminating the surfaces. With use of the apparatus the first outer circumference bevel surface and second outer circumference bevel surface become brighter compared with the outer circumference end face.
摘要翻译：一种用于检查半导体晶片的外周边缘部分的半导体晶片检查装置。该装置具有面向半导体晶片的外周缘部的相机透镜，经由照相机透镜与半导体晶片的外周端面相对配置的摄像面，形成第一外周斜面的图像的反射镜通过照相机镜头在成像表面上的半导体晶片，通过照相机镜头在成像表面上形成半导体晶片的第二外圆周斜面的图像的镜;校正透镜，其形成外周端面的图像通过照相机镜头的中心部分的成像表面上的半导体晶片和照亮该表面的照明光导灯部分。通过使用该装置，与外周端面相比，第一外周斜面和第二外圆周斜面变得更亮。

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