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    • 4. 发明授权
    • Dynamic memory
    • 动态内存
    • US5642326A
    • 1997-06-24
    • US534558
    • 1995-09-27
    • Kiyofumi SakuraiSatoru TakaseMasaki Ogihara
    • Kiyofumi SakuraiSatoru TakaseMasaki Ogihara
    • G11C11/407G11C7/22G11C8/18G11C11/4076G11C11/409G11C7/00
    • G11C11/4076G11C7/22G11C8/18
    • A dynamic memory comprises a control circuit for controlling the selection of the row decoder and the activation of the sense amplifiers in accordance with a RAS signal externally supplied thereto and a word line control circuit for controlling a selected word line to turn the electric potentials read out from the memory cells connected to the word line on the bit lines connected to the respective memory cells back to an inactive level after the electric potentials are sensed and amplified by the sense amplifiers corresponding to the respective bit lines during the time period from the time when the RAS signal is turned to an active level and the time when it is turned back to the inactive level. A dynamic memory has gate oxide films are designed to be subjected to a less electric field strength in order to minimize the degradation of reliability and the memory can effectively reduce the fall of the word line driving stepped-up voltage to eliminate the necessity of a leak current compensation circuit. Additionally, the memory reduces the time required to restore the electric potentials for a data reading operation and also the cycle time required for a data writing operation.
    • 动态存储器包括控制电路,用于根据外部提供给它的+ E,ovs RAS + EE信号和用于控制选定字线的字线控制电路来控制行解码器的选择和感测放大器的激活 将连接到各个存储器单元的位线上连接到字线的存储单元读出的电位在由该位线对应的读出放大器在 从+ E,ovs RAS + EE信号变为有效电平的时间段和其回到无效电平的时间。 具有栅极氧化膜的动态存储器被设计为经受较少的电场强度以便最小化可靠性的劣化,并且存储器可以有效地减少字线驱动升压电压的下降以消除泄漏的必要性 电流补偿电路。 此外,存储器减少了恢复数据读取操作的电位所需的时间以及数据写入操作所需的周期时间。
    • 6. 发明授权
    • Screening circuitry for a dynamic random access memory
    • 动态随机存取存储器的屏蔽电路
    • US5475646A
    • 1995-12-12
    • US342000
    • 1994-11-16
    • Masaki Ogihara
    • Masaki Ogihara
    • G11C11/407G01R31/317G11C11/401G11C11/403G11C11/406G11C29/00G11C29/06G11C29/14G11C7/00
    • G01R31/31701
    • A dynamic random access memory comprising a dynamic memory section, a first screening-test pad, a second screening-test pad, and a mode-setting circuit. The dynamic memory section includes a memory-cell array having dynamic-type memory cells (MC) arranged in rows and columns, a row circuit and a column circuit, both connected to the memory-cell array, and a refresh counter for generating a refresh address signal for refreshing the dynamic-type memory cells when the dynamic memory section is set in a CBR refresh mode. The first screening-test pad receives a first external control signal for setting the dynamic memory section in an ordinary mode or a screening-test mode. The second screening-test pad receives a second external control signal for setting the dynamic memory section in the CBR refresh mode. The mode-setting circuit detects whether or not the first control signal and the second external control signal are in predetermined states, and enables the row circuit and the column circuit upon detecting that the first and second control signals are in the predetermined states, thereby to cause the refresh counter to supply the refresh address signal to the row circuit and the column circuit.
    • 一种动态随机存取存储器,包括动态存储器部分,第一筛选测试焊盘,第二屏蔽测试焊盘和模式设置电路。 动态存储器部分包括具有排列成行和列的动态型存储单元(MC)的存储单元阵列,两个连接到存储单元阵列的行电路和列电路以及用于产生刷新的刷新计数器 用于在动态存储器部分被设置为CBR刷新模式时刷新动态型存储器单元的地址信号。 第一筛选测试垫接收用于在普通模式或筛选测试模式下设置动态存储器部分的第一外部控制信号。 第二筛选测试垫接收用于将动态存储器部分设置在CBR刷新模式中的第二外部控制信号。 模式设定电路检测第一控制信号和第二外部控制信号是否处于预定状态,并且在检测到第一和第二控制信号处于预定状态时使能行电路和列电路,从而 使刷新计数器向行电路和列电路提供刷新地址信号。
    • 10. 发明授权
    • Dram using word line potential circuit control
    • Dram使用字线电位电路控制
    • US5619162A
    • 1997-04-08
    • US658572
    • 1996-06-05
    • Masaki Ogihara
    • Masaki Ogihara
    • G11C11/407G11C8/08G11C11/4074G11C11/408G05F3/16G11C7/00
    • G11C8/08G11C11/4074G11C11/4085G11C11/4087
    • Memory cells including at least one memory cell having an n-channel MOS transistor and an n-channel MOS capacitor. A word line is connected to the memory cells. A word line drive circuit for driving the word line includes a p-channel MOS for transferring a potential to the word line. The word line drive circuit is controlled by a output from a word line potential control circuit. The word line potential control circuit applies a power source potential to the word line through the current path of the p-channel MOS transistor in the word line drive circuit when the memory cells are not selected, and the word line potential control circuit applies a potential higher than a potential obtained by adding a threshold voltage of the n-channel MOS transistor to the power source potential to the word line through the current path of the p-channel MOS transistor in the word line drive circuit when the memory cells are selected.
    • 存储单元包括至少一个具有n沟道MOS晶体管和n沟道MOS电容器的存储单元。 字线连接到存储单元。 用于驱动字线的字线驱动电路包括用于将电位传送到字线的p沟道MOS。 字线驱动电路由字线电位控制电路的输出控制。 当没有选择存储单元时,字线电位控制电路通过字线驱动电路中的p沟道MOS晶体管的电流路径向字线施加电源电位,并且字线电位控制电路施加电位 高于通过在选择存储单元时通过字线驱动电路中的p沟道MOS晶体管的电流路径将n沟道MOS晶体管的阈值电压加到字线而获得的电位。