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1. 发明申请

US20120085898A1 TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACE 有权
标题翻译：表面飞行时间质谱
公开(公告)号：US20120085898A1
公开(公告)日：2012-04-12
申请号：US13328091
申请日：2011-12-16
申请人： Thomas F. Egan , J. Albert Schultz , Steven R. Ulrich , Kelley L. Waters
发明人： Thomas F. Egan , J. Albert Schultz , Steven R. Ulrich , Kelley L. Waters
IPC分类号： H01J49/40 , H05H3/02 , H01J47/00 , H01J37/26
CPC分类号： H01J49/40 , G01N23/203 , G01N23/2206 , G01N23/2255
摘要： The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.
摘要翻译：本发明提供了一种用于计数和测量二次电子和散射离子和中性粒子的飞行时间的粒子检测器，并且使这些和背散射离子和中性粒子之间的一致性相关联，同时保持用于冲击表面的连续的未脉冲的聚焦的初始离子束。初级粒子散射和二次粒子发射的强度与聚焦光束在材料表面上的冲击位置相关，从而通过扫描聚焦束穿过表面获得空间分辨的表面元素和电子结构映射。

2. 发明授权

US08614416B2 Nonoparticulate assisted nanoscale molecular imaging by mass spectrometery 有权
标题翻译：通过质谱法测定无微粒辅助纳米级分子成像
公开(公告)号：US08614416B2
公开(公告)日：2013-12-24
申请号：US13156111
申请日：2011-06-08
申请人： J. Albert Schultz , Thomas F. Egan , Ernest K. Lewis , Steven Ulrich , Kelley L. Waters
发明人： J. Albert Schultz , Thomas F. Egan , Ernest K. Lewis , Steven Ulrich , Kelley L. Waters
IPC分类号： H01J49/40 , H01J49/26 , H01J37/26 , G01N21/64
CPC分类号： H01J49/10 , G01N21/64 , G01N21/6458 , G01N21/65 , G01N21/658 , G01N23/2258 , G01N2021/6417 , H01J49/0004 , H01J49/0422 , H01J49/0463 , H01J49/142 , H01J49/164 , H01J49/26 , H01J49/40
摘要： Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
摘要翻译：描述了用于质谱的方法和装置，具体地，使用纳米颗粒注入作为二次离子的基质，更一般地说是二次粒子。光子束源或纳米颗粒束源可用于解吸源或初级离子/一次粒子源。

3. 发明授权

US08519329B2 Time-of-flight mass spectrometry of surfaces 有权
标题翻译：飞行时间质谱的表面
公开(公告)号：US08519329B2
公开(公告)日：2013-08-27
申请号：US13328091
申请日：2011-12-16
申请人： J. Albert Schultz , Thomas F. Egan , Steven R. Ulrich , Kelley L. Waters
发明人： J. Albert Schultz , Thomas F. Egan , Steven R. Ulrich , Kelley L. Waters
IPC分类号： H01J49/40
CPC分类号： H01J49/40 , G01N23/203 , G01N23/2206 , G01N23/2255
摘要： The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.
摘要翻译：本发明提供了一种用于计数和测量二次电子和散射离子和中性粒子的飞行时间的粒子检测器，并且使这些和背散射离子和中性粒子之间的一致性相关联，同时保持用于冲击表面的连续的未脉冲的聚焦的初始离子束。初级粒子散射和二次粒子发射的强度与聚焦光束在材料表面上的冲击位置相关，从而通过扫描聚焦束穿过表面获得空间分辨的表面元素和电子结构映射。

4. 发明授权

US08829428B2 Time-of-flight spectrometry and spectroscopy of surfaces 有权
标题翻译：飞行时间谱和表面光谱
公开(公告)号：US08829428B2
公开(公告)日：2014-09-09
申请号：US12956665
申请日：2010-11-30
申请人： J. Albert Schultz , Thomas F. Egan , Steven Ulrich , Kelley L. Waters
发明人： J. Albert Schultz , Thomas F. Egan , Steven Ulrich , Kelley L. Waters
IPC分类号： H01J49/40 , H01J49/00 , H01J49/14 , G01N23/225
CPC分类号： H01J49/142 , G01N23/2258 , H01J49/0004 , H01J49/0095
摘要： Described is an analytical method and apparatus for counting and measuring the flight time of secondary electrons, secondary ions and neutrals, scattered ions and/or neutrals and for correlating coincidences between these while maintaining a continuous un-pulsed, micro-focused, primary particle beam for impinging a surface for purposes of microprobe imaging and microanalysis.
摘要翻译：描述了一种分析方法和装置，用于计数和测量二次电子，二次离子和中性粒子，散射离子和/或中性粒子的飞行时间，并且在两者之间相互关联，同时保持连续的非脉冲，微聚焦的一次粒子束用于冲击表面以用于微探针成像和微量分析。

5. 发明申请

US20120018630A1 Nonoparticulate Assisted Nanoscale Molecular Imaging by Mass Spectrometery 有权
标题翻译：非微粒辅助纳米尺度分子成像质谱
公开(公告)号：US20120018630A1
公开(公告)日：2012-01-26
申请号：US13156111
申请日：2011-06-08
申请人： J. Albert Schultz , Thomas F. Egan , Ernest K. Lewis , Steven Ulrich , Kelley L. Waters
发明人： J. Albert Schultz , Thomas F. Egan , Ernest K. Lewis , Steven Ulrich , Kelley L. Waters
IPC分类号： H01J49/40 , H01J49/26 , H01J37/26 , G01N21/64
CPC分类号： H01J49/10 , G01N21/64 , G01N21/6458 , G01N21/65 , G01N21/658 , G01N23/2258 , G01N2021/6417 , H01J49/0004 , H01J49/0422 , H01J49/0463 , H01J49/142 , H01J49/164 , H01J49/26 , H01J49/40
摘要： Methods and devices for mass spectrometry are described, specifically the use of nanoparticulate implantation as a matrix for secondary ion and more generally secondary particles. A photon beam source or a nanoparticulate beam source can be used a desorption source or a primary ion/primary particle source.
摘要翻译：描述了用于质谱的方法和装置，具体地，使用纳米颗粒注入作为二次离子的基质，更一般地说是二次粒子。光子束源或纳米颗粒束源可用于解吸源或初级离子/一次粒子源。

6. 发明授权

US08101909B2 Time-of-flight mass spectrometry of surfaces 有权
标题翻译：飞行时间质谱的表面
公开(公告)号：US08101909B2
公开(公告)日：2012-01-24
申请号：US12360011
申请日：2009-01-26
申请人： Thomas F. Egan , J. Albert Schultz , Steven R. Ulrich , Kelley L. Waters
发明人： Thomas F. Egan , J. Albert Schultz , Steven R. Ulrich , Kelley L. Waters
IPC分类号： H01J49/40
CPC分类号： H01J49/40 , G01N23/203 , G01N23/2206 , G01N23/2255
摘要： The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.
摘要翻译：本发明提供了一种用于计数和测量二次电子和散射离子和中性粒子的飞行时间的粒子检测器，并且使这些和背散射离子和中性粒子之间的一致性相关联，同时保持用于冲击表面的连续的未脉冲的聚焦的初始离子束。初级粒子散射和二次粒子发射的强度与聚焦光束在材料表面上的冲击位置相关，从而通过扫描聚焦束穿过表面获得空间分辨的表面元素和电子结构映射。

7. 发明申请

US20090189072A1 TIME-OF-FLIGHT MASS SPECTROMETRY OF SURFACES 有权
标题翻译：表面飞行时间质谱
公开(公告)号：US20090189072A1
公开(公告)日：2009-07-30
申请号：US12360011
申请日：2009-01-26
申请人： Thomas F. Egan , J. Albert Schultz , Steven R. Ulrich , Kelley L. Waters
发明人： Thomas F. Egan , J. Albert Schultz , Steven R. Ulrich , Kelley L. Waters
IPC分类号： H01J49/40 , B01D59/44
CPC分类号： H01J49/40 , G01N23/203 , G01N23/2206 , G01N23/2255
摘要： The present invent provides a particle detector for counting and measuring the flight time of secondary electrons and scattered ions and neutrals and to correlate coincidences between these and backscattered ions/and neutrals while maintaining a continuous unpulsed microfocused primary ion beam for impinging a surface. Intensities of the primary particle scattering and secondary particle emissions are correlated with the position of impact of the focused beam onto a materials surface so that a spatially resolved surface elemental and electronic structural mapping is obtained by scanning the focused beam across the surface.
摘要翻译：本发明提供了一种用于计数和测量二次电子和散射离子和中性粒子的飞行时间的粒子检测器，并且使这些和背散射离子和中性粒子之间的一致性相关联，同时保持用于冲击表面的连续的未脉冲的聚焦的初始离子束。初级粒子散射和二次粒子发射的强度与聚焦光束在材料表面上的冲击位置相关，从而通过扫描聚焦束穿过表面获得空间分辨的表面元素和电子结构映射。

8. 发明授权

US08384023B2 Post-ionization of neutrals for ion mobility oTOFMS identification of molecules and elements desorbed from surfaces 有权
标题翻译：用于离子迁移的中性粒子的离子化oTOFMS鉴定从表面解吸的分子和元素
公开(公告)号：US08384023B2
公开(公告)日：2013-02-26
申请号：US12692604
申请日：2010-01-23
申请人： J. Albert Schultz , Thomas F. Egan , Kelley L. Waters , Ernest K. Lewis
发明人： J. Albert Schultz , Thomas F. Egan , Kelley L. Waters , Ernest K. Lewis
IPC分类号： H01J49/00
CPC分类号： H01J49/40 , G01N27/622 , H01J49/0027 , H01J49/0045 , H01J49/107
摘要： The present invention relates to a method and apparatus for ionizing a neutral MALDI desorption plume, and in particular, for efficiently measuring the ionized MALDI desorption plume when post-ionization techniques are combined with a medium pressure MALDI-IM-oTOFMS instrument. Additionally, the present disclosure provides a method and apparatus that simultaneously separates tissue-sample MALDI ions by IM-oTOFMS according to their chemical family. After separation, the MALDI ions are directly compared to the ions created by post-ionizing the co-desorbed neutral molecules with a second laser wherein the second laser is delayed by a few hundred microseconds. The present disclosure further provides novel approaches that enhance the analysis of ions, including the use of giant fullerene internal standards to enhance mass accuracy, and ultraviolet (UV) declustering lasers to generate intact peptides and proteins, either of which may be followed by VUV post-ionization which generates identifiable structural fragments.
摘要翻译：本发明涉及一种用于离子化中性MALDI解吸羽流的方法和装置，特别是当电离后技术与中压MALDI-IM-OTOFMS仪器结合时，用于有效测量电离的MALDI解吸羽流。此外，本公开提供了一种方法和装置，其通过IM-oTOFMS根据其化学族同时分离组织样品MALDI离子。分离后，将MALDI离子直接与通过用第二激光离子化共解吸的中性分子产生的离子进行比较，其中第二激光器延迟几百微秒。本公开进一步提供了增强离子分析的新方法，包括使用巨富勒烯内标来提高质量精度，以及紫外（UV）去聚簇激光以产生完整的肽和蛋白质，其中之一可以是VUV柱产生可识别的结构碎片。

9. 发明申请

US20110147578A1 TIME-OF-FLIGHT SPECTROMETRY AND SPECTROSCOPY OF SURFACES 有权
标题翻译：飞行时间光谱和表面光谱
公开(公告)号：US20110147578A1
公开(公告)日：2011-06-23
申请号：US12956665
申请日：2010-11-30
申请人： J. Albert Schultz , Thomas F. Egan , Steven Ulrich , Kelley L. Waters
发明人： J. Albert Schultz , Thomas F. Egan , Steven Ulrich , Kelley L. Waters
IPC分类号： H01J49/40 , H01J49/14
CPC分类号： H01J49/142 , G01N23/2258 , H01J49/0004 , H01J49/0095
摘要： Described is an analytical method and apparatus for counting and measuring the flight time of secondary electrons, secondary ions and neutrals, scattered ions and/or neutrals and for correlating coincidences between these while maintaining a continuous un-pulsed, micro-focused, primary particle beam for impinging a surface for purposes of microprobe imaging and microanalysis.
摘要翻译：描述了一种分析方法和装置，用于计数和测量二次电子，二次离子和中性粒子，散射离子和/或中性粒子的飞行时间，并且在两者之间相互关联，同时保持连续的非脉冲，微聚焦的一次粒子束用于冲击表面以用于微探针成像和微量分析。

10. 发明申请

US20100200742A1 POST-IONIZATION OF NEUTRALS FOR ION MOBILITY OTOFMS IDENTIFICATION OF MOLECULES AND ELEMENTS DESORBED FROM SURFACES 有权
标题翻译：离子移动物质中和离子的离子化鉴定从表面脱落的分子和元素
公开(公告)号：US20100200742A1
公开(公告)日：2010-08-12
申请号：US12692604
申请日：2010-01-23
申请人： J. Albert Schultz , Thomas F. Egan , Kelley L. Waters , Ernest K. Lewis
发明人： J. Albert Schultz , Thomas F. Egan , Kelley L. Waters , Ernest K. Lewis
IPC分类号： H01J49/40 , H01J49/04 , G12B13/00
CPC分类号： H01J49/40 , G01N27/622 , H01J49/0027 , H01J49/0045 , H01J49/107
摘要： The present invention relates to a method and apparatus for ionizing a neutral MALDI desorption plume, and in particular, for efficiently measuring the ionized MALDI desorption plume when post-ionization techniques are combined with a medium pressure MALDI-IM-oTOFMS instrument. Additionally, the present disclosure provides a method and apparatus that simultaneously separates tissue-sample MALDI ions by IM-oTOFMS according to their chemical family. After separation, the MALDI ions are directly compared to the ions created by post-ionizing the co-desorbed neutral molecules with a second laser wherein the second laser is delayed by a few hundred microseconds. The present disclosure further provides novel approaches that enhance the analysis of ions, including the use of giant fullerene internal standards to enhance mass accuracy, and ultraviolet (UV) declustering lasers to generate intact peptides and proteins, either of which may be followed by VUV post-ionization which generates identifiable structural fragments.
摘要翻译：本发明涉及一种用于离子化中性MALDI解吸羽流的方法和装置，特别是当电离后技术与中压MALDI-IM-OTOFMS仪器结合时，用于有效测量电离的MALDI解吸羽流。此外，本公开提供了一种方法和装置，其通过IM-oTOFMS根据其化学族同时分离组织样品MALDI离子。分离后，将MALDI离子直接与通过用第二激光离子化共解吸的中性分子产生的离子进行比较，其中第二激光器延迟几百微秒。本公开进一步提供了增强离子分析的新方法，包括使用巨富勒烯内标来提高质量精度，以及紫外（UV）去聚簇激光以产生完整的肽和蛋白质，其中之一可以是VUV柱产生可识别的结构碎片。

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