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    • 1. 发明授权
    • Millimeter-wave transistor device
    • 毫米波晶体管器件
    • US08653564B1
    • 2014-02-18
    • US12551581
    • 2009-09-01
    • Jing-Hong Conan Zhan
    • Jing-Hong Conan Zhan
    • H01L29/76
    • H01L29/78H01L27/0207H01L29/4238
    • A millimeter-wave transistor device includes a plurality of sub-cells arranged in matrix array, each of the sub-cells having a longitudinal gate finger elongating along a reference y-axis, a source doping region disposed at one side of the longitudinal gate finger and a drain doping region at the other side of the longitudinal gate finger opposite to the source doping region; and at least three parallel connecting bars extending along a reference x-axis, electrically connecting with respective distal ends of the longitudinal gate finger of each of the sub-cells.
    • 毫米波晶体管器件包括以矩阵阵列排列的多个子单元,每个子单元具有沿着参考y轴延伸的纵向栅极指状,源极掺杂区域设置在纵向栅极指状物的一侧 以及在所述纵向栅极指与所述源极掺杂区域相对的另一侧的漏极掺杂区域; 以及沿着参考x轴延伸的至少三个平行连接杆,与每个子单元的纵向门指的相应远端电连接。
    • 2. 发明申请
    • APPARATUS AND METHOD FOR DUTY CYCLE CALIBRATION
    • 用于周期校准的装置和方法
    • US20130141149A1
    • 2013-06-06
    • US13612729
    • 2012-09-12
    • Yu-Li HSUEHChih-Hsien SHENJing-Hong Conan ZHAN
    • Yu-Li HSUEHChih-Hsien SHENJing-Hong Conan ZHAN
    • H03K3/017
    • H03K3/017H03K5/1565
    • An apparatus for duty cycle calibration includes an input calibration circuit, a delay chain, a first comparator, and a second comparator. The input calibration circuit calibrates an input clock signal according to a first control signal so as to generate an input calibration clock signal. The delay chain includes a plurality of delay units coupled in series, and delays the input calibration clock signal so as to generate a first delay clock signal and a second delay clock signal. At least two of the delay units each have an adjustable delay time which is controlled according to a second control signal. The first comparator compares the input calibration clock signal with the first delay clock signal so as to generate the first control signal. The second comparator compares the input calibration clock signal with the second delay clock signal so as to generate the second control signal.
    • 用于占空比校准的装置包括输入校准电路,延迟链,第一比较器和第二比较器。 输入校准电路根据第一控制信号校准输入时钟信号,以产生输入校准时钟信号。 延迟链包括串联耦合的多个延迟单元,并延迟输入校准时钟信号,以产生第一延迟时钟信号和第二延迟时钟信号。 延迟单元中的至少两个具有根据第二控制信号来控制的可调延迟时间。 第一比较器将输入校准时钟信号与第一延迟时钟信号进行比较,以产生第一控制信号。 第二比较器将输入校准时钟信号与第二延迟时钟信号进行比较,以产生第二控制信号。
    • 8. 发明授权
    • Apparatus and method for duty cycle calibration
    • 用于占空比校准的装置和方法
    • US08878582B2
    • 2014-11-04
    • US13612729
    • 2012-09-12
    • Yu-Li HsuehChih-Hsien ShenJing-Hong Conan Zhan
    • Yu-Li HsuehChih-Hsien ShenJing-Hong Conan Zhan
    • H03K3/017H03K5/156
    • H03K3/017H03K5/1565
    • An apparatus for duty cycle calibration includes an input calibration circuit, a delay chain, a first comparator, and a second comparator. The input calibration circuit calibrates an input clock signal according to a first control signal so as to generate an input calibration clock signal. The delay chain includes a plurality of delay units coupled in series, and delays the input calibration clock signal so as to generate a first delay clock signal and a second delay clock signal. At least two of the delay units each have an adjustable delay time which is controlled according to a second control signal. The first comparator compares the input calibration clock signal with the first delay clock signal so as to generate the first control signal. The second comparator compares the input calibration clock signal with the second delay clock signal so as to generate the second control signal.
    • 用于占空比校准的装置包括输入校准电路,延迟链,第一比较器和第二比较器。 输入校准电路根据第一控制信号校准输入时钟信号,以产生输入校准时钟信号。 延迟链包括串联耦合的多个延迟单元,并延迟输入校准时钟信号,以产生第一延迟时钟信号和第二延迟时钟信号。 延迟单元中的至少两个具有根据第二控制信号来控制的可调延迟时间。 第一比较器将输入校准时钟信号与第一延迟时钟信号进行比较,以产生第一控制信号。 第二比较器将输入校准时钟信号与第二延迟时钟信号进行比较,以产生第二控制信号。