专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明申请

US20100306598A1 Operating Computer Memory 有权
标题翻译：操作计算机内存
公开(公告)号：US20100306598A1
公开(公告)日：2010-12-02
申请号：US12476731
申请日：2009-06-02
申请人： Jerry D. Ackaret , Robert M. Dunn , Anna H. Siskind , Wilson E. Smith
发明人： Jerry D. Ackaret , Robert M. Dunn , Anna H. Siskind , Wilson E. Smith
IPC分类号： G06F11/07 , G05D23/00 , G06F11/00
CPC分类号： G06F11/0757 , G06F11/073 , G06F11/0754 , G06F11/0793 , G06F11/3037 , G06F11/3058 , G06F11/34
摘要： Operating computer memory in a computer including dynamically monitoring, by a predictive failure analysis (‘PFA’) module, correctable memory errors and memory temperature and managing cooling resources in the computer in dependence upon the correctable memory errors and memory temperature.
摘要翻译：在计算机中操作计算机存储器，包括通过预测故障分析（“PFA”）模块，可校正的存储器错误和存储器温度以及根据可校正的存储器错误和存储器温度来管理计算机中的冷却资源进行动态监控。

2. 发明授权

US08635488B2 Implementing ultra high availability personality card 有权
标题翻译：实施超高可用性个性卡
公开(公告)号：US08635488B2
公开(公告)日：2014-01-21
申请号：US13291874
申请日：2011-11-08
申请人： Jerry D. Ackaret , Justin P. Bandholz , Brian E. Bigelow , Joseph E. Bolan , Kevin M. Cash , David L. Cowell , Martin J. Crippen , Christopher L. Durham , Jeffery M. Franke , James E. Hughes , David J. Jensen , John K. Langgood , Bay Van Nguyen , James A. O'Connor , Derek Robertson , John M. Sheplock , Wilson E. Smith
发明人： Jerry D. Ackaret , Justin P. Bandholz , Brian E. Bigelow , Joseph E. Bolan , Kevin M. Cash , David L. Cowell , Martin J. Crippen , Christopher L. Durham , Jeffery M. Franke , James E. Hughes , David J. Jensen , John K. Langgood , Bay Van Nguyen , James A. O'Connor , Derek Robertson , John M. Sheplock , Wilson E. Smith
IPC分类号： G06F11/00
CPC分类号： G06F11/20 , G06F11/0766 , G06F11/1666 , G06F11/2007 , G06F11/2017 , G06F11/2038
摘要： A method and circuit for implementing an enhanced availability personality card for a chassis computer system, and a design structure on which the subject circuit resides are provided. The personality card includes a first erasable programmable read only memory (EPROM) and a second EPROM, each EPROM storing Vital Product Data (VPD) and a first temperature sensor and a second temperature sensor sensing temperature. A primary bidirectional bus and a redundant bidirectional bus are respectively connected between the first EPROM and the first temperature sensor and the second EPROM and the second temperature sensor, and a pair of chassis management modules. Each chassis management module includes a switch connected to both the primary bidirectional bus and the redundant bidirectional bus providing redundant paths, enabling continued function with failure of any critical personality card component.
摘要翻译：一种用于实现用于机箱计算机系统的增强型可用性个性卡的方法和电路，以及设置有该主题电路所在的设计结构。个性卡包括第一可擦除可编程只读存储器（EPROM）和第二EPROM，每个EPROM存储重要产品数据（VPD）和第一温度传感器以及感测温度的第二温度传感器。第一EPROM和第一温度传感器以及第二EPROM和第二温度传感器之间分别连接有主双向总线和冗余双向总线，以及一对机箱管理模块。每个机箱管理模块包括连接到主双向总线和冗余双向总线的交换机，提供冗余路径，使得能够在任何关键个性卡组件失效的情况下继续运行。

3. 发明申请

US20130117601A1 IMPLEMENTING ULTRA HIGH AVAILABILITY PERSONALITY CARD 有权
标题翻译：实施超高可用性个人卡
公开(公告)号：US20130117601A1
公开(公告)日：2013-05-09
申请号：US13291874
申请日：2011-11-08
申请人： Jerry D. Ackaret , Justin P. Bandholz , Brian E. Bigelow , Joseph E. Bolan , Kevin M. Cash , David L. Cowell , Martin J. Crippen , Christopher L. Durham , Jeffery M. Franke , James E. Hughes , David J. Jensen , John K. Langgood , Bay Van Nguyen , James A. O'Connor , Derek Robertson , John M. Sheplock , Wilson E. Smith
发明人： Jerry D. Ackaret , Justin P. Bandholz , Brian E. Bigelow , Joseph E. Bolan , Kevin M. Cash , David L. Cowell , Martin J. Crippen , Christopher L. Durham , Jeffery M. Franke , James E. Hughes , David J. Jensen , John K. Langgood , Bay Van Nguyen , James A. O'Connor , Derek Robertson , John M. Sheplock , Wilson E. Smith
IPC分类号： G06F11/07 , G06F17/50
CPC分类号： G06F11/20 , G06F11/0766 , G06F11/1666 , G06F11/2007 , G06F11/2017 , G06F11/2038
摘要： A method and circuit for implementing an enhanced availability personality card for a chassis computer system, and a design structure on which the subject circuit resides are provided. The personality card includes a first erasable programmable read only memory (EPROM) and a second EPROM, each EPROM storing Vital Product Data (VPD) and a first temperature sensor and a second temperature sensor sensing temperature. A primary bidirectional bus and a redundant bidirectional bus are respectively connected between the first EPROM and the first temperature sensor and the second EPROM and the second temperature sensor, and a pair of chassis management modules. Each chassis management module includes a switch connected to both the primary bidirectional bus and the redundant bidirectional bus providing redundant paths, enabling continued function with failure of any critical personality card component.
摘要翻译：一种用于实现用于机箱计算机系统的增强型可用性个性卡的方法和电路，以及设置有该主题电路所在的设计结构。个性卡包括第一可擦除可编程只读存储器（EPROM）和第二EPROM，每个EPROM存储重要产品数据（VPD）和第一温度传感器以及感测温度的第二温度传感器。第一EPROM和第一温度传感器以及第二EPROM和第二温度传感器之间分别连接有主双向总线和冗余双向总线，以及一对机箱管理模块。每个机箱管理模块包括连接到主双向总线和冗余双向总线的交换机，提供冗余路径，使得能够在任何关键个性卡组件失效的情况下继续运行。

4. 发明授权

US07084660B1 System and method for accelerated detection of transient particle induced soft error rates in integrated circuits 失效
标题翻译：用于加速检测集成电路中瞬态粒子诱导的软错误率的系统和方法
公开(公告)号：US07084660B1
公开(公告)日：2006-08-01
申请号：US11098104
申请日：2005-04-04
申请人： Jerry D. Ackaret , Richard B. Bhend , David F. Heidel , Naoko Pia Sanda , Scott B. Swaney , Jane Jones, legal representative
发明人： Theodore H. Zabel, deceased
IPC分类号： G01R31/27 , H01L23/58 , H01L21/00
CPC分类号： G01R31/2881 , G01R31/31816 , H01L21/563 , H01L23/556 , H01L24/31 , H01L24/81 , H01L2224/16225 , H01L2224/32225 , H01L2224/73204 , H01L2224/81052 , H01L2224/8121 , H01L2224/81815 , H01L2224/83102 , H01L2224/83859 , H01L2224/83951 , H01L2224/92125 , H01L2924/00011 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01033 , H01L2924/01082 , H01L2924/01084 , H01L2924/01092 , H01L2924/01094 , H01L2924/14 , H01L2924/3025 , H01L2924/00 , H01L2224/0401
摘要： A method and system are provided for accelerated detection of soft error rates (SER) in integrated circuits (IC's) due to transient particle emission. An integrated circuit is packaged for accelerated transient particle emission by doping the underfill thereof with a transient-particle-emitting material having a predetermined emission rate. The emission rate is substantially constant over a predetermined period of time for testing. Accelerated transient-particle-emission testing is performed on the integrated circuit. Single-event upsets due to soft errors are detected, and a quantitative measurement of SER is determined.
摘要翻译：提供了一种方法和系统，用于加速检测由于瞬态粒子发射引起的集成电路（IC）中的软错误率（SER）。通过用具有预定排放速率的瞬态粒子发射材料掺杂其底部填充物来封装用于加速瞬态粒子发射的集成电路。发射速率在测试的预定时间段内基本上是恒定的。在集成电路上进行加速瞬态粒子发射测试。检测到由于软错误引起的单事件故障，并确定SER的定量测量。

5. 发明授权

US09081676B2 Operating computer memory 有权
标题翻译：操作计算机内存
公开(公告)号：US09081676B2
公开(公告)日：2015-07-14
申请号：US12476731
申请日：2009-06-02
申请人： Jerry D. Ackaret , Robert M. Dunn , Anna H. Siskind , Wilson E. Smith
发明人： Jerry D. Ackaret , Robert M. Dunn , Anna H. Siskind , Wilson E. Smith
IPC分类号： G06F11/00 , G06F11/07
CPC分类号： G06F11/0757 , G06F11/073 , G06F11/0754 , G06F11/0793 , G06F11/3037 , G06F11/3058 , G06F11/34
摘要： Operating computer memory in a computer including dynamically monitoring, by a predictive failure analysis (‘PFA’) module, correctable memory errors and memory temperature and managing cooling resources in the computer in dependence upon the correctable memory errors and memory temperature.
摘要翻译：在计算机中操作计算机存储器，包括通过预测故障分析（“PFA”）模块，可校正的存储器错误和存储器温度以及根据可校正的存储器错误和存储器温度来管理计算机中的冷却资源进行动态监控。

6. 发明授权

US07238547B2 Packaging integrated circuits for accelerated detection of transient particle induced soft error rates 有权
标题翻译：封装集成电路，用于加速检测瞬态粒子引起的软错误率
公开(公告)号：US07238547B2
公开(公告)日：2007-07-03
申请号：US11098343
申请日：2005-04-04
申请人： Janes Jones, legal representative , Jerry D. Ackaret , Michael A. Gaynes , Michael S. Gordon , Nancy C. LaBianca
发明人： Theodore H. Zabel, deceased
IPC分类号： H01L21/56
CPC分类号： G06F11/00
摘要： An IC device is packaged for accelerated transient particle emission by doping the underfill thereof with a transient-particle-emitting material having a predetermined, substantially constant emission rate. The emission rate may be tunable. In one aspect, a radioactive adhesive composition is provided for bonding a semiconductor device to a chip carrier. The radioactive adhesive composition is made from a cured reaction product including a resin and a filler, and may be reworkable or non-reworkable. Either the resin or the filler, individually or both together as a mix, are doped substantially uniformly with the transient-particle-emitting material, thereby putting the transient-particle-emitting in close proximity with the IC to be tested. The underfill is formulated to have a stable chemistry, and the doped particles are encapsulated, so as to contain the emissions. Accelerated transient-particle-emission testing may then be performed on the IC in situ to provide accelerated detection of soft errors.
摘要翻译：通过用具有预定的，基本上恒定的发射速率的瞬态粒子发射材料掺杂其底部填充物来封装IC器件用于加速瞬态粒子发射。排放率可能是可调的。在一个方面，提供了用于将半导体器件接合到芯片载体的放射性粘合剂组合物。放射性粘合剂组合物由包括树脂和填料的固化反应产物制成，并且可以是可再加工的或不可再加工的。单独或两者一起作为混合物的树脂或填料均以瞬态粒子发射材料基本上均匀地掺杂，从而使瞬态粒子发射紧密接近待测试的IC。底层填料配制成具有稳定的化学性质，并且掺杂的颗粒被包封，以便包含排放物。然后可以在IC上原位进行加速瞬态粒子发射测试，以提供软错误的加速检测。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式