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1. 发明申请

US20170033554A1 SINGLE EVENT LATCHUP (SEL) CURRENT SURGE MITIGATION 有权
标题翻译：单一事件锁定（SEL）当前防范措施
公开(公告)号：US20170033554A1
公开(公告)日：2017-02-02
申请号：US14814699
申请日：2015-07-31
申请人： HARRIS CORPORATION
发明人： David Vail , David Diedling , William Boesch , Joshua P. Bruckmeyer
IPC分类号： H02H9/02 , H02H3/087
CPC分类号： H02H9/02 , G01R31/31816 , H02H3/05 , H02H3/087 , H02H3/10 , H02H5/005
摘要： Method and system for Single Event Latchup (SEL) current surge mitigation involves monitoring data signals for a protected device and deriving from them a detected signature comprised of one or more detected signature vector components. The detected signature vector components are compared to previously stored signature vector components. Based on the comparing, the system selectively differentiates between the occurrence of standard power surges associated with normal operation of the protected device, and a non-standard current surge which requires cycling power of the protected device for continued proper functioning of the protected device.
摘要翻译：用于单事件锁存（SEL）电流浪涌缓解的方法和系统涉及监视受保护设备的数据信号，并从其中导出由一个或多个检测到的签名矢量分量组成的检测到的签名。将检测到的签名矢量分量与先前存储的签名向量分量进行比较。基于比较，系统选择性地区分与受保护设备的正常操作相关的标准功率浪涌的发生，以及需要受保护设备的循环功率以保护受保护设备的继续正常工作的非标准电流浪涌。

2. 发明申请

US20160109506A1 SEMICONDUCTOR DEVICE WITH UPSET EVENT DETECTION AND METHOD OF MAKING 有权
标题翻译：具有UPS事件检测的半导体器件及其制造方法
公开(公告)号：US20160109506A1
公开(公告)日：2016-04-21
申请号：US14514449
申请日：2014-10-15
申请人： MARK D. HALL , STEVEN G.H. ANDERSON , MEHUL D. SHROFF
发明人： MARK D. HALL , STEVEN G.H. ANDERSON , MEHUL D. SHROFF
IPC分类号： G01R31/26 , H01L21/822 , H01L29/06 , H01L27/08 , H01L29/66
CPC分类号： G01R31/2632 , G01R31/2644 , G01R31/31816 , H01L27/0629
摘要： A semiconductor device includes a substrate, first electronic circuitry formed on the substrate, a first diode buried in the substrate under the first electronic circuitry, and a first fault detection circuit coupled to the first diode to detect energetic particle strikes on the first electronic circuitry.
摘要翻译：半导体器件包括衬底，形成在衬底上的第一电子电路，埋在第一电子电路下的衬底中的第一二极管，以及耦合到第一二极管以检测第一电子电路上的能量粒子撞击的第一故障检测电路。

3. 发明授权

US09208043B1 Method and apparatus for fault injection and verification on an integrated circuit 有权
标题翻译：用于集成电路故障注入和验证的方法和装置
公开(公告)号：US09208043B1
公开(公告)日：2015-12-08
申请号：US13842140
申请日：2013-03-15
申请人： Xilinx, Inc.
发明人： Chen W. Tseng , Restu I. Ismail , Robert Le
IPC分类号： G06F11/00 , G06F11/263
CPC分类号： G06F11/263 , G01R31/31816 , G01R31/318342
摘要： A method, non-transitory computer readable medium, and apparatus for performing fault injection and verification on an integrated circuit are disclosed. For example, the method generates a mask file for one or more modules of a hierarchical design, wherein the mask file identifies one or more essential bits, receives a selection of one of the one or more modules as a selected module for the fault injection and the verification to be applied, performs the fault injection on at least one essential bit of the selected module based upon the mask file for the selected module, and performs the verification on the selected module.
摘要翻译：公开了一种在集成电路上执行故障注入和验证的方法，非暂时计算机可读介质和装置。例如，该方法为分层设计的一个或多个模块生成掩模文件，其中掩模文件识别一个或多个必要位，接收作为用于故障注入的所选模块的一个或多个模块之一的选择，要应用的验证，基于所选模块的掩模文件对所选模块的至少一个基本位执行故障注入，并对所选模块执行验证。

4. 发明授权

US09110804B2 On-die electric cosmic ray detector 有权
标题翻译：在线电宇宙射线探测器
公开(公告)号：US09110804B2
公开(公告)日：2015-08-18
申请号：US13681832
申请日：2012-11-20
申请人： Intel Corporation
发明人： Eric C. Hannah
IPC分类号： G01T1/00 , G06F11/07 , G01R31/317 , G01R31/3181
CPC分类号： G01T1/247 , G01R31/317 , G01R31/31816 , G06F11/0793
摘要： Described is a chip comprising: a substrate; a logic unit forming an active circuit on the substrate; and a cosmic ray detector embedded in the substrate, the cosmic ray detector to detect a cosmic ray and to generate a signal indicating detection of the cosmic ray, the signal for reducing error in the logic unit.
摘要翻译：描述了一种芯片，包括：基板; 在所述基板上形成有源电路的逻辑单元; 宇宙射线检测器，用于检测宇宙射线并产生指示宇宙射线检测的信号，该信号用于减少逻辑单元中的误差。

5. 发明授权

US08949101B2 Hardware execution driven application level derating calculation for soft error rate analysis 有权
标题翻译：软件错误率分析的硬件执行驱动应用级降额计算
公开(公告)号：US08949101B2
公开(公告)日：2015-02-03
申请号：US13271827
申请日：2011-10-12
申请人： Pradip Bose , Meeta S. Gupta , Prabhakar N. Kudva , Daniel A. Prener
发明人： Pradip Bose , Meeta S. Gupta , Prabhakar N. Kudva , Daniel A. Prener
IPC分类号： G01R31/3181 , G06F17/50 , G01R31/3183
CPC分类号： G01R31/31816 , G01R31/318357 , G06F17/5022
摘要： Mechanisms are provided for predicting effects of soft errors on an integrated circuit device design. A data processing system is configured to implement a unified derating tool that includes a machine derating front-end engine used to generate machine derating information, and an application derating front-end engine used to generate application derating information, for the integrated circuit device design. The machine derating front-end engine executes a simulation of the integrated circuit device design to generate the machine derating information. The application derating front-end engine executes an application workload on existing hardware similar in architecture to the integrated circuit device design and injects a fault into the existing hardware during execution of the application workload to generate application derating information. The machine derating information is combined with the application derating information to generate at least one soft error rate value for the integrated circuit device design.
摘要翻译：提供了用于预测软错误对集成电路器件设计的影响的机制。数据处理系统被配置为实现统一的降额工具，其包括用于生成机器降额信息的机器降额前端引擎和用于生成应用降额信息的应用降级前端引擎用于集成电路器件设计。机器降额前端引擎执行集成电路设备设计的仿真以生成机器降额信息。应用降级前端引擎在架构上与集成电路设备设计类似的现有硬件上执行应用程序工作负载，并在执行应用程序工作负载期间将故障注入到现有硬件中，以生成应用程序降级信息。机器降额信息与应用降级信息组合以产生用于集成电路设备设计的至少一个软错误率值。

6. 发明授权

US08874978B2 Information processing apparatus, information processing system, controlling method for information processing apparatus and program 有权
标题翻译：信息处理装置，信息处理系统，信息处理装置和程序的控制方法
公开(公告)号：US08874978B2
公开(公告)日：2014-10-28
申请号：US13416431
申请日：2012-03-09
申请人： Koji Hirairi
发明人： Koji Hirairi
IPC分类号： G06F11/00 , G01R31/30 , H03M13/00 , G06F11/10 , G06F1/32 , G06F11/07 , H04L1/20 , G01R31/317 , G01R31/3181 , H03M13/09
CPC分类号： G06F11/1008 , G01R31/3171 , G01R31/31816 , G06F1/324 , G06F1/3296 , G06F11/076 , H03M13/09 , H04L1/203 , Y02D10/126 , Y02D10/172
摘要： An information processing apparatus includes a first parity production section for producing a first error detection code for detecting an error of data. A second parity production section produces a second error detection code for detecting an error of the data from the first error detection code. A first parity checking section detects an error of the retained data as a first error using the retained first error detection code. A second parity checking section detects an error of the retained data as a second error using the retained second error detection code. A control amount outputting section outputs, when an occurrence rate of a first error is equal to or lower than a first threshold value, a control amount for controlling a power supply voltage or a frequency using a second threshold value as a target value for an occurrence rate of a second error.
摘要翻译：信息处理设备包括：第一奇偶校验生成部分，用于产生用于检测数据错误的第一错误检测码。第二奇偶校验生成部分产生用于检测来自第一错误检测码的数据的错误的第二错误检测码。第一奇偶校验部分使用保留的第一错误检测码来检测保留数据的错误作为第一错误。第二奇偶校验部分使用保留的第二错误检测码来检测作为第二错误的保留数据的错误。当第一误差的出现率等于或低于第一阈值时，控制量输出部分输出用于使用第二阈值控制电源电压或频率的控制量作为发生的目标值率的第二个错误。

7. 发明申请

US20140203836A1 METHOD OF CHARACTERIZING THE SENSITIVITY OF AN ELECTRONIC COMPONENT SUBJECTED TO IRRADIATION CONDITIONS 审中-公开
标题翻译：表征受辐照条件影响的电子元件灵敏度的方法
公开(公告)号：US20140203836A1
公开(公告)日：2014-07-24
申请号：US14342998
申请日：2012-09-05
申请人： Florent Miller , Cecile Weulersse
发明人： Florent Miller , Cecile Weulersse
IPC分类号： G01R31/26
CPC分类号： G01R31/2601 , G01R31/002 , G01R31/008 , G01R31/2881 , G01R31/30 , G01R31/31816
摘要： A method of selecting a piece of electronic equipment subjected to irradiation conditions comprising at least one electronic component by characterizing a sensitivity parameter of the electronic component to the irradiation conditions listed in a predetermined specifications. The electronic component is irradiated with a source of ionizing radiation having the known irradiation characteristics and geometry. A set of operating values of the electronic component are measured during the irradiation of the electronic component. The sensitivity of the electronic component are measured for a number of irradiation conditions lower than all of the conditions listed in the specifications. The measured results are extrapolated to the other irradiation conditions of the specifications.
摘要翻译：一种通过将电子部件的灵敏度参数表征为按照规定的规格列出的照射条件来选择经受包含至少一个电子部件的照射条件的电子设备的方法。用具有已知辐射特性和几何形状的电离辐射源照射电子部件。在电子部件的照射期间测量电子部件的一组操作值。对于低于规格中列出的所有条件的多个照射条件，测量电子部件的灵敏度。测量结果外推到规格的其他照射条件。

8. 发明申请

US20140115376A1 INTEGRATED CIRCUIT WITH ERROR REPAIR AND FAULT TOLERANCE 审中-公开
公开(公告)号：US20140115376A1
公开(公告)日：2014-04-24
申请号：US14143065
申请日：2013-12-30
申请人： ARM Limited
发明人： Shidhartha DAS , David Michael Bull , Emre Ozer
IPC分类号： G06F11/07
CPC分类号： G06F11/0793 , G01R31/31816 , G06F11/1076 , G06F11/1608
摘要： An integrated circuit is provided with error detection circuitry and error repair circuitry. Error tolerance circuitry is responsive to a control parameter to selectively disable the error repair circuitry. The control parameter is dependent on the processing performed within the circuit. For example, the control parameter may be generated in dependence upon the program instruction being executed, the output signal value which is in error, the previous behavior of the circuit or in other ways.

9. 发明申请

US20130132007A1 EMBEDDED TRANSIENT SCANNING SYSTEM APPARATUS AND METHODOLOGY 有权
标题翻译：嵌入式瞬态扫描系统设备和方法
公开(公告)号：US20130132007A1
公开(公告)日：2013-05-23
申请号：US13664563
申请日：2012-10-31
申请人： Pragma Design, Inc.
发明人： Jeffrey C. Dunnihoo
IPC分类号： G01R31/28
CPC分类号： G01R31/2879 , G01R31/002 , G01R31/26 , G01R31/2884 , G01R31/31816 , G06F17/40 , G06F19/00
摘要： Systems and methods for scanning and characterizing an integrated circuit for transient events. Embedded apparatus can detect transient events that may be incident on the integrated circuit, and moreover, identify particular nodes of the integrated circuit that are affected by the transient event. Additionally, the integrated circuit can be characterized by applying known transient pulses of varying severity to selected nodes of the integrated circuit, detecting the severity levels at which the selected nodes can fail, and storing indications pertaining to pulse severity at which selected nodes can fail. Moreover, based on the characterization, targeted protection mechanisms can be provided for nodes that are characterized as being susceptible.
摘要翻译：用于扫描和表征瞬态事件的集成电路的系统和方法。嵌入式设备可以检测可能入射到集成电路上的瞬态事件，此外，识别受瞬态事件影响的集成电路的特定节点。此外，集成电路的特征可以在于，对集成电路的选定节点应用不同严重程度的已知瞬态脉冲，检测所选节点可能发生故障的严重性级别，以及存储所选节点可能失败的脉冲严重性的指示。此外，基于表征，可以为表征为易感的节点提供目标保护机制。

10. 发明授权

US08447548B2 Method using time to digital converter for direct measurement of set pulse widths 有权
标题翻译：使用时间到数字转换器直接测量设定脉冲宽度的方法
公开(公告)号：US08447548B2
公开(公告)日：2013-05-21
申请号：US12419842
申请日：2009-04-07
申请人： Anthony L. McKay , Jeremy Popp
发明人： Anthony L. McKay , Jeremy Popp
IPC分类号： G01R29/02
CPC分类号： G01R31/31816 , G01R31/002 , G04F10/005
摘要： The disclosure provides for a method for identifying and measuring a signal pulse induced in a microcircuit due to ionizing radiation. The method comprises locating an ionizing radiation induced pulse across a microcircuit using a plurality of sensors on the microcircuit. The method further comprises radiating a radiation through the microcircuit to produce a pulse width. The method further comprises using a time to digital converter (TDC) to measure a duration of the pulse width to create a measured pulse width. The method further comprises using the TDC to convert the measured pulse width into a digital signal.
摘要翻译：本公开提供了一种用于识别和测量由于电离辐射而在微电路中感应的信号脉冲的方法。该方法包括使用微电路上的多个传感器将电离辐射感应脉冲定位在微电路上。该方法还包括通过微电路辐射辐射以产生脉冲宽度。该方法还包括使用时间 - 数字转换器（TDC）来测量脉冲宽度的持续时间以产生测量的脉冲宽度。该方法还包括使用TDC将所测量的脉冲宽度转换为数字信号。

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