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    • 1. 发明授权
    • Method and apparatus for demultiplexing optical signals in a passive optical network
    • 用于在无源光网络中解复用光信号的方法和装置
    • US08023782B2
    • 2011-09-20
    • US12403967
    • 2009-03-13
    • Andreas GoebelLawrence C. WestGregory L. Wojcik
    • Andreas GoebelLawrence C. WestGregory L. Wojcik
    • G02B6/28G02B6/34G02B6/26G02B6/42H04J14/00H04J14/02
    • G02B6/4246G02B6/2931G02B6/2938
    • Methods and structures are disclosed demultiplexing optical signals transmitted over an optical fiber into a silicon substrate and to multiple detectors. The silicon substrate has two spaced-apart surfaces and a diffractive element disposed adjacent to one of the surfaces. Each of the optical signals corresponds to one of multiple wavelengths. The optical signals are directed into the silicon substrate along a path through the first surface to be incident on the diffractive element. The path is oriented generally normal with the first surface and/or with the diffractive element, which angularly separates the optical signals such that each of the wavelengths traverses through the substrate in a wavelength dependent direction to the first surface. Each optical signal is steered from the first surface towards the second surface to be incident on different optical elements that direct them generally normal to the first surface to be incident on one of the detectors.
    • 公开了将光纤传输到硅衬底和多个检测器中的方法和结构。 硅衬底具有两个间隔开的表面和与其中一个表面相邻设置的衍射元件。 每个光信号对应于多个波长中的一个。 沿着穿过第一表面的路径将光信号引导到硅衬底中以入射到衍射元件上。 该路径与第一表面和/或衍射元件大致正交地定向,该衍射元件使光信号成角度地分离,使得每个波长沿着与第一表面波长相关的方向穿过衬底。 每个光信号从第一表面转向第二表面以入射到不同的光学元件上,这些光学元件将它们大致垂直于第一表面入射到其中一个检测器上。
    • 6. 发明授权
    • Method and apparatus for demultiplexing optical signals in a passive optical network
    • 用于在无源光网络中解复用光信号的方法和装置
    • US07505647B2
    • 2009-03-17
    • US11771760
    • 2007-06-29
    • Andreas GoebelLawrence C. WestGregory L. Wojcik
    • Andreas GoebelLawrence C. WestGregory L. Wojcik
    • G02B6/28H04J14/00H04J14/02
    • G02B6/4246G02B6/2931G02B6/2938
    • Methods and structures are disclosed demultiplexing optical signals transmitted over an optical fiber into a silicon substrate and to multiple detectors. The silicon substrate has two spaced-apart surfaces and a diffractive element disposed adjacent to one of the surfaces. Each of the optical signals corresponds to one of multiple wavelengths. The optical signals are directed into the silicon substrate along a path through the first surface to be incident on the diffractive element. The path is oriented generally normal with the first surface and/or with the diffractive element, which angularly separates the optical signals such that each of the wavelengths traverses through the substrate in a wavelength dependent direction to the first surface. Each optical signal is steered from the first surface towards the second surface to be incident on different optical elements that direct them generally normal to the first surface to be incident on one of the detectors.
    • 公开了将光纤传输到硅衬底和多个检测器中的方法和结构。 硅衬底具有两个间隔开的表面和与其中一个表面相邻设置的衍射元件。 每个光信号对应于多个波长中的一个。 沿着穿过第一表面的路径将光信号引导到硅衬底中以入射到衍射元件上。 该路径与第一表面和/或衍射元件大致正交,该衍射元件使光信号成角度地分离,使得每个波长以与波长相关的方向穿过基板。 每个光信号从第一表面转向第二表面以入射到不同的光学元件上,这些光学元件将它们大致垂直于第一表面入射到其中一个检测器上。
    • 10. 发明申请
    • EMBEDDED WAVEGUIDE DETECTORS
    • 嵌入式波形检测器
    • US20090269878A1
    • 2009-10-29
    • US12420558
    • 2009-04-08
    • Francisco A. LeonLawrence C. WestYuichi WadaGregory L. WojcikStephen Moffatt
    • Francisco A. LeonLawrence C. WestYuichi WadaGregory L. WojcikStephen Moffatt
    • H01L21/20
    • G02B6/12004G02B2006/12061H01L31/0232H01L31/0288H01L31/105H01L31/1812Y02E10/50
    • A method of fabricating a detector that involves: forming a trench in a substrate, the substrate having an upper surface; forming a first doped semiconductor layer on the substrate and in the trench; forming a second semiconductor layer on the first doped semiconductor layer and extending into the trench, the second semiconductor layer having a conductivity that is less than the conductivity of the first doped semiconductor layer; forming a third doped semiconductor layer on the second semiconductor layer and extending into the trench; removing portions of the first, second and third layers that are above a plane defined by the surface of the substrate to produce an upper, substantially planar surface and expose an upper end of the first doped semiconductor layer in the trench; forming a first electrical contact to the first semiconductor doped layer; and forming a second electrical contact to the third semiconductor doped layer.
    • 一种制造检测器的方法,包括:在衬底中形成沟槽,所述衬底具有上表面; 在所述衬底和所述沟槽中形成第一掺杂半导体层; 在所述第一掺杂半导体层上形成第二半导体层并延伸到所述沟槽中,所述第二半导体层的导电率小于所述第一掺杂半导体层的导电性; 在所述第二半导体层上形成第三掺杂半导体层并延伸到所述沟槽中; 去除在由衬底的表面限定的平面之上的第一层,第二层和第三层的部分,以产生上部基本平坦的表面,并且暴露沟槽中的第一掺杂半导体层的上端; 形成第一电接触到第一半导体掺杂层; 以及向所述第三半导体掺杂层形成第二电接触。