会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 84. 发明授权
    • Measurement apparatus and control method
    • 测量装置及控制方法
    • US08326021B2
    • 2012-12-04
    • US12108078
    • 2008-04-23
    • Kazuhiko KobayashiShinji Uchiyama
    • Kazuhiko KobayashiShinji Uchiyama
    • G06K9/00
    • G01B11/14G06K9/00201G06T7/33G06T7/73G06T2207/30244
    • A measurement apparatus (100), which measures the relative position and orientation of an image-capturing apparatus (50) capturing images of one or more measurement objects (10) with respect to the measurement object, acquires a captured image using the image-capturing apparatus (50). Moreover, the respective geometric features present in a 3D model of the measurement object (10) are projected onto the captured image based on the position and orientation of the image-capturing apparatus (50), thereby obtaining projection geometric features. Projection geometric features to be used in calculation of the position and orientation are then selected from the resultant projection geometric features based on distances between the projection geometric features in the captured image. The relative position and orientation of the image-capturing apparatus (50) with respect to the measurement object is then calculated using the selected projection geometric features and image geometric features corresponding to the selected projection geometric features detected in the captured image.
    • 测量装置(100),其测量相对于测量对象拍摄一个或多个测量对象(10)的图像的图像捕获设备(50)的相对位置和方向,使用图像捕获获取捕获的图像 装置(50)。 此外,基于图像捕获装置(50)的位置和取向将存在于测量对象(10)的3D模型中的各个几何特征投影到所捕获的图像上,从而获得投影几何特征。 然后从基于捕获图像中的投影几何特征之间的距离的所得投影几何特征中选择要用于计算位置和取向的投影几何特征。 然后使用所选择的投影几何特征和对应于在捕获图像中检测到的所选择的投影几何特征的图像几何特征来计算图像捕获设备(50)相对于测量对象的相对位置和取向。
    • 85. 发明授权
    • Position and orientation measurement apparatus and control method thereof
    • 位置和方向测量装置及其控制方法
    • US08059889B2
    • 2011-11-15
    • US12123125
    • 2008-05-19
    • Kazuhiko KobayashiShinji Uchiyama
    • Kazuhiko KobayashiShinji Uchiyama
    • G06K9/46
    • G06K9/209G06K9/32G06T7/12G06T7/75G06T2207/30244
    • A position and orientation measurement apparatus for measuring the position and orientation of an image capturing apparatus, which captures an image of a measurement object, relative to the measurement object, extracts configuration planes of the measurement object based on three-dimensional model data of the measurement object, and extracts measurement line segments to be used in detection of edges of a captured image from line segments which form the configuration planes. The position and orientation measurement apparatus projects the extracted measurement line segments onto the captured image based on an estimated position and orientation of the image capturing apparatus, selects visible measurement line segments which are not hidden by the extracted configuration planes, and calculates the position and orientation of the image capturing apparatus relative to the measurement object based on the visible measurement line segments and corresponding edges of the captured image.
    • 用于测量相对于测量对象捕获测量对象的图像的摄像设备的位置和姿态的位置和姿态测量设备基于测量的三维模型数据提取测量对象的配置面 对象,并提取要用于从形成配置平面的线段检测拍摄图像的边缘的测量线段。 位置和姿势测量装置基于估计的摄像装置的位置和姿态将提取的测量线段投影到拍摄图像上,选择未被提取的配置面隐藏的可见测量线段,并计算位置和取向 基于所述可见测量线段和所捕获图像的相应边缘,所述摄像装置相对于所述测量对象。
    • 88. 发明授权
    • Vapor drying method, apparatus and recording medium for use in the method
    • 用于该方法的蒸气干燥方法,设备和记录介质
    • US07637029B2
    • 2009-12-29
    • US11472415
    • 2006-06-22
    • Yuji KamikawaKazuhiko KobayashiNobutaka KurodaMikio NakashimaOsamu Tsuda
    • Yuji KamikawaKazuhiko KobayashiNobutaka KurodaMikio NakashimaOsamu Tsuda
    • F26B19/00
    • H01L21/67051H01L21/67023H01L21/67028H01L21/67034Y10S134/902
    • A vapor drying apparatus comprises a processing chamber 1a adapted to contain semiconductor wafers W; a supply nozzle 2 adapted to supply IPA vapor or N2 gas into the processing chamber 1a; a two-fluid nozzle 3 connected to both of an IPA supply source 8 and an N2 gas supply source 5 and adapted to produce a mixed fluid of IPA and N2 gas; a vapor generating apparatus 10 adapted to produce IPA vapor by heating the mixed fluid produced by the two-fluid nozzle 3; an N2 gas supply line 23 connected to the upstream side of the two-fluid nozzle 3; and a mixed fluid supply line 22 connected to the downstream side of the two-fluid nozzle 3. An open-and-close valve V2 is provided on a branch line 25 connecting the N2 gas supply line 23 and the mixed fluid supply line 22. First, N2 gas is supplied to the two-fluid nozzle 3 while IPA from the IPA supply source 8 is supplied to the two-fluid nozzle 3 so as to produce the mixed fluid, followed by supplying it to the processing chamber 1a so as to perform a first drying step. Subsequently, N2 gas from the N2 gas supply source 5 is supplied to the processing chamber 1a through the two-fluid nozzle 3 and the branch line 25 so as to perform a second drying step.
    • 蒸气干燥装置包括适于容纳半导体晶片W的处理室1a; 供应喷嘴2,其适于将IPA蒸汽或N 2气体供应到处理室1a中; 连接到IPA供应源8和N 2气体供应源5两者并且适于产生IPA和N 2气体的混合流体的双流体喷嘴3; 蒸汽发生装置10,适于通过加热由双流体喷嘴3产生的混合流体产生IPA蒸气; 连接到双流体喷嘴3的上游侧的N 2气体供给管线23; 以及连接到双流体喷嘴3的下游侧的混合流体供给管线22.开关阀V2设置在连接N2气体供给管线23和混合流体供给管线22的分支管线25上。 首先,向双流体喷嘴3供给N2气体,同时将来自IPA供给源8的IPA供给至双流体喷嘴3,生成混合流体,然后将其供给到处理室1a, 执行第一干燥步骤。 接着,将来自N2气体供给源5的N2气通过双流体喷嘴3和分支管线25供给到处理室1a,进行第二干燥工序。
    • 89. 发明申请
    • POSITION AND ORIENTATION MEASUREMENT APPARATUS AND CONTROL METHOD THEREOF
    • 位置和方位测量装置及其控制方法
    • US20080292180A1
    • 2008-11-27
    • US12123125
    • 2008-05-19
    • Kazuhiko KobayashiShinji Uchiyama
    • Kazuhiko KobayashiShinji Uchiyama
    • G06K9/46
    • G06K9/209G06K9/32G06T7/12G06T7/75G06T2207/30244
    • A position and orientation measurement apparatus for measuring the position and orientation of an image capturing apparatus, which captures an image of a measurement object, relative to the measurement object, extracts configuration planes of the measurement object based on three-dimensional model data of the measurement object, and extracts measurement line segments to be used in detection of edges of a captured image from line segments which form the configuration planes. The position and orientation measurement apparatus projects the extracted measurement line segments onto the captured image based on an estimated position and orientation of the image capturing apparatus, selects visible measurement line segments which are not hidden by the extracted configuration planes, and calculates the position and orientation of the image capturing apparatus relative to the measurement object based on the visible measurement line segments and corresponding edges of the captured image.
    • 用于测量相对于测量对象捕获测量对象的图像的摄像设备的位置和姿态的位置和姿态测量设备基于测量的三维模型数据提取测量对象的配置面 对象,并提取要用于从形成配置平面的线段检测拍摄图像的边缘的测量线段。 位置和姿势测量装置基于估计的摄像装置的位置和姿态将提取的测量线段投影到拍摄图像上,选择未被提取的配置面隐藏的可见测量线段,并计算位置和取向 基于所述可见测量线段和所捕获图像的相应边缘,所述摄像装置相对于所述测量对象。