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    • 81. 发明授权
    • Synchronous signal generation circuit
    • 同步信号发生电路
    • US06337834B1
    • 2002-01-08
    • US09706842
    • 2000-11-07
    • Katsuaki IsobeHironobu AkitaSatoshi EtoHaruki Toda
    • Katsuaki IsobeHironobu AkitaSatoshi EtoHaruki Toda
    • G11C800
    • G11C7/225G11C7/22G11C7/222
    • The present invention provides a synchronous signal generation circuit that can be operated with a high accuracy, at a high speed and with a low power consumption without being affected by the process dispersion. The synchronous signal generation circuit of the present invention comprises a real circuit including an input receiver, an off-chip driver, and a mirror-type synchronous circuit, and a dummy circuit for determining the delay time in the mirror-type synchronous circuit, the dummy circuit including an input receiver and an off-chip driver. In the dummy circuit, the input signal is supplied first to the off-chip driver and, then, to the input receiver so as to permit the signal between the off-chip driver and the input receiver to be a small amplitude signal. It follows that the real circuit and the dummy circuit are equal to each other in the signal levels in the input and output portions of each of the input receiver and the off-chip driver. The particular construction makes it possible to minimize the error in the delay time between the real circuit and the dummy circuit relative to the process dispersion so as to improve the synchronizing accuracy and, thus, to achieve a high speed I/O.
    • 本发明提供一种同步信号发生电路,其能够以高精度,高速度且低功耗地操作,而不受处理分散的影响。 本发明的同步信号发生电路包括实际电路,其包括输入接收器,片外驱动器和反射镜型同步电路,以及用于确定镜式同步电路中的延迟时间的虚拟电路, 虚拟电路包括输入接收器和片外驱动器。 在虚拟电路中,首先将输入信号提供给片外驱动器,然后提供给输入接收器,以允许片外驱动器和输入接收器之间的信号为小振幅信号。 因此,实际电路和虚拟电路在每个输入接收器和片外驱动器的输入和输出部分的信号电平中彼此相等。 该特定结构使得可以将实际电路和虚拟电路之间相对于处理色散的延迟时间的误差最小化,从而提高同步精度,从而实现高速I / O。
    • 82. 发明授权
    • Semiconductor memory device
    • US06317382B2
    • 2001-11-13
    • US09812820
    • 2001-03-21
    • Haruki TodaShozo SaitoKaoru Tokushige
    • Haruki TodaShozo SaitoKaoru Tokushige
    • G11C800
    • G11C7/1036G11C7/1018G11C7/1072G11C7/22G11C11/4076G11C11/4096G11C2207/107
    • A semiconductor memory device comprises a memory cell group comprising a plurality of memory cells arranged in matrix; a specification circuit for specifying sequentially memory cells addressed by consecutive addresses in the memory cells, and for enterring them in an active state; a data input/output (I/O) circuit for performing a data read-out/write-in operation (data I/O operation) for the consecutive memory cells specified by the specification circuit under a control based on a read-out/write-in signal provided from an external section; a counter circuit for counting the number of cycles of a basic clock signal provided from an external section; and a controller for receiving at least one or more specification signals provided from an external section, for outputting a control signal per specification signal for specifying a particular cycle as a starting cycle to count the number of the cycles of the basic clock signal, and for instructing the counter circuit to count the number of counts of the basic clock signal based on the control signal, and for controlling a specification operation executed by the specification circuit and the data I/O operation of the data I/O circuit, so that the memory access operations for the memory cell group are controlled.
    • 86. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US6104649A
    • 2000-08-15
    • US447190
    • 1999-11-22
    • Haruki Toda
    • Haruki Toda
    • G11C29/04G11C7/00G11C11/401G11C11/407G11C29/00
    • G11C29/785G11C29/808G11C29/846
    • It is an object of this invention to provide a semiconductor memory device in which a failure can be efficiently remedied even for a larger number of bits. In a multi-bit memory capable of simultaneously exchanging a plurality of data upon reception of an address, square DQ lines (15c) commonly used for each I/O, a spare sense amplifier circuit (13c), a spare column switch (14c), a fuse box (20) for storing the address of a DQ line in which a failure has occurred, and fuse circuits (21-1, 21-2, . . . ) for storing an I/O to which the failure-DQ line belongs are arranged to remedy the failure for each I/O. Since only a memory cell belonging to one I/O where a failure has occurred is replaced, unnecessary replacement is not executed, and the memory cell can be efficiently remedied even for a larger number of bits.
    • 本发明的目的是提供一种半导体存储器件,其中即使对于较大数量的位也可有效地修复故障。 在能够在接收到地址时同时交换多个数据的多位存储器中,通常用于每个I / O的方形DQ线(15c),备用读出放大器电路(13c),备用列开关(14c) ,用于存储其中发生故障的DQ线的地址的保险丝盒(20)和用于存储故障DQ的I / O的熔丝电路(21-1,21-2 ...) 排列的行被排列以补救每个I / O的故障。 由于只有属于发生故障的一个I / O的存储单元被替换,所以不执行不必要的替换,并且即使对于较大数量的位也能够有效地补救存储单元。
    • 88. 发明授权
    • Clock control circuit
    • 时钟控制电路
    • US6034901A
    • 2000-03-07
    • US327592
    • 1999-06-08
    • Haruki Toda
    • Haruki Toda
    • G11C11/407G06F1/10G06F13/42G11C7/22G11C19/00H03K5/135H03L7/00G11C7/00
    • G11C7/225G11C7/22G11C7/222
    • An external clock signal CK is input to a buffer, which generates an internal clock signal CLK having a skew of D1 with respect to the external clock signal CK. The internal clock signal is input first to a delay circuit which has a delay time A, then to a delay array which provides a delay time D2, and finally to a delay circuit which has a delay time of D2. The delay circuit generates a corrected internal clock signal CK' which is synchronous with the external clock signal CK. The delay array is composed of delay units, each having a state-holding section. The state-holding section of any delay unit that has passed a forward pulse is set in a predetermined state. Once its state-holding section is set in the predetermined state, the delay unit provides a correct delay time of 2.times..DELTA..
    • 外部时钟信号CK被输入到缓冲器,其产生相对于外部时钟信号CK具有D1偏斜的内部时钟信号CLK。 内部时钟信号首先输入到具有延迟时间A的延迟电路,然后输入到提供延迟时间D2的延迟阵列,最后输入延迟时间为D2的延迟电路。 延迟电路产生与外部时钟信号CK同步的经校正的内部时钟信号CK'。 延迟阵列由延迟单元组成,每个延迟单元具有状态保持部分。 已经通过正向脉冲的任何延迟单元的状态保持部分被设置在预定状态。 一旦其状态保持部分被设置在预定状态,则延迟单元提供2x DELTA的正确的延迟时间。
    • 89. 发明授权
    • Clock-synchronous semiconductor memory device and access method thereof
    • 时钟同步半导体存储器件及其访问方法
    • US5986968A
    • 1999-11-16
    • US113570
    • 1998-07-10
    • Haruki TodaHitoshi Kuyama
    • Haruki TodaHitoshi Kuyama
    • G11C7/10G11C8/04G11C7/00
    • G11C8/04G11C7/1045G11C7/1072
    • A clock-synchronous semiconductor memory device includes many memory cells arranged in matrix, a count section for counting the actual number of cycles of a continuous, externally-supplied basic clock signal, a control section for inputting a row enable control signal (/RE) and the column enable control signal (/CE) provided from an external device, other than the basic clock signal, for which the control signals are at a specified level, synchronized with the basic control signal, and for setting the initial address for data access of the memory cells, and a data I/O section for executing a data access operation for the address set by the control section. In the device, the output of data from the memory cells through the data I/O section is started after the setting of the initial address by the control sections and after a specified number of basic clock signals has been counted by the count section.
    • 时钟同步半导体存储器件包括以矩阵形式布置的许多存储器单元,用于对连续的外部供给的基本时钟信号的实际循环次数进行计数的计数部分,用于输入行使能控制信号(/ RE)的控制部分, 以及与基本时钟信号不同的外部设备提供的与基本控制信号同步的指令级别的列使能控制信号(/ CE),并且用于设置用于数据访问的初始地址 以及用于执行由控制部分设置的地址的数据访问操作的数据I / O部分。 在设备中,通过控制部分设置初始地址之后,在计数部分计数了指定数量的基本时钟信号之后,通过数据I / O部分从存储器单元输出数据。
    • 90. 发明授权
    • Semiconductor memory device
    • 半导体存储器件
    • US5926436A
    • 1999-07-20
    • US17948
    • 1998-02-03
    • Haruki TodaShozo SaitoKaoru Tokushige
    • Haruki TodaShozo SaitoKaoru Tokushige
    • G11C11/401G11C7/00G11C7/10G11C7/22G11C8/04G11C11/407G11C11/41G11C11/413H01L27/10G11C8/00
    • G11C7/1072G11C7/1018G11C7/22
    • A semiconductor memory device comprises a memory cell group comprising a plurality of memory cells arranged in matrix; a specification circuit for specifying sequentially memory cells addressed by consecutive addresses in the memory cells, and for entering them in an active state; a data input/output (I/O) circuit for performing a data read-out/write-in operation (data I/O operation) for the consecutive memory cells specified by the specification circuit under a control based on a read-out/write-in signal provided from an external section; a counter circuit for counting the number of cycles of a basic clock signal provided from an external section; and a controller for receiving at least one or more specification signals provided from an external section, for outputting a control signal per specification signal for specifying a particular cycle as a starting cycle to count the number of the cycles of the basic clock signal, and for instructing the counter circuit to count the number of counts of the basic clock signal based on the control signal, and for controlling a specification operation executed by the specification circuit and the data I/O operation of the data I/O circuit, so that the memory access operations for the memory cell group are controlled.
    • 半导体存储器件包括存储单元组,所述存储单元组包括排列成矩阵的多个存储器单元; 指定电路,用于依次指定存储器单元中由连续地址寻址的存储器单元,并将其输入激活状态; 用于对由指定电路指定的连续存储单元进行数据读出/写入操作(数据I / O操作)的数据输入/输出(I / O)电路,该控制基于读出/ 从外部部分提供的写入信号; 用于对从外部提供的基本时钟信号的周期数进行计数的计数器电路; 以及控制器,用于接收从外部部分提供的至少一个或多个指定信号,用于每个指定信号输出用于指定特定周期的控制信号作为开始周期,以对基本时钟信号的周期数进行计数,并且 指示计数器电路基于控制信号对基本时钟信号的计数数进行计数,并且用于控制由指定电路执行的指定操作和数据I / O电路的数据I / O操作,使得 控制存储单元组的存储器访问操作。