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    • 61. 发明申请
    • Memory device and control method therefor
    • 存储器及其控制方法
    • US20060227629A1
    • 2006-10-12
    • US11378444
    • 2006-03-16
    • Koji ShimbayashiTakaaki FuruyamaKenji Shibata
    • Koji ShimbayashiTakaaki FuruyamaKenji Shibata
    • G11C7/06
    • G11C7/08G11C7/1018G11C16/26G11C16/32
    • An access identification circuit (4) identifies a first access operation or a second access operation and outputs an identification signal S. During the first access operation, stored data is read out after detecting a column address CADD, a burst address, and updating a word line to newly select memory cells MC. In the second access operation, the memory cells MC connected to the common word line which has been selected are selected by sequentially switching column selector switches. Operating condition information Dx (DAx and/or DBx) used for setting a load condition in a dummy load circuit (5) and/or setting a pulse width for an equalize signal EQ in an amplification control circuit (6) is stored in each of first and second storage sections (1, 2) that are provided for the first and second access operations, respectively. The operating condition information Dx is selected by a selector circuit (3) in response to the identification signal S and fed to the dummy load circuit (5) and/or the amplification control circuit (6). A suitable operating condition is selected for each of the access operations.
    • 访问识别电路(4)识别第一访问操作或第二访问操作并输出识别信号S.在第一访问操作期间,在检测列地址CADD,突发地址和更新字之后读出存储的数据 行新选择存储单元MC。 在第二访问操作中,通过依次切换列选择器开关来选择连接到所选择的公共字线的存储单元MC。 在放大控制电路(6)中用于设置虚拟负载电路(5)中的负载条件和/或设定均衡信号EQ的脉冲宽度的工作条件信息Dx(DAx和/或DBx)被存储在 分别为第一和第二存取操作提供的第一和第二存储部分(1,2)。 操作条件信息Dx由选择器电路(3)响应于识别信号S选择并馈送到虚拟负载电路(5)和/或放大控制电路(6)。 为每个访问操作选择合适的操作条件。
    • 62. 发明申请
    • Semiconductor memory device having N-bit prefetch type and method of transferring data thereof
    • 具有N位预取类型的半导体存储器件及其数据传送方法
    • US20060171218A1
    • 2006-08-03
    • US11148231
    • 2005-06-09
    • Jun Chun
    • Jun Chun
    • G11C29/00
    • G11C7/12G11C7/1018G11C11/4094
    • A semiconductor memory device in which only global I/O buses, which receive one or more data groups that must be output first among a N number of data groups that are prefetched in a N-bit prefetch type, from an array of memory cells are precharged with a ½ power supply voltage, thereby making the output speed of the data groups that must be output first thing faster than that of the remaining data groups. The semiconductor memory device includes a data bus controller for precharging predetermined data buses that receive one or more data group that must be output to the outside first among a N number of data groups that are prefetched in a N-bit prefetch type from an array of memory cells, using information to decide an I/O sequence of the N number of the data groups.
    • 一种半导体存储器件,其中仅存储一个或多个数据组的全局I / O总线,所述I / O总线从存储器单元阵列接收在N个预取类型中预取的N个数据组中必须首先输出的一个或多个数据组, 用1/2电源电压预充电,从而使必须输出的数据组的输出速度比其余数据组的输出速度快。 半导体存储器件包括一个数据总线控制器,用于预先接收预定数据总线,该数据总线接收一个或多个数据组,该数据组必须首先从N位预取类型中预取的N个数据组中输出, 使用信息来决定N个数据组的I / O序列。
    • 64. 发明授权
    • Burst write in a non-volatile memory device
    • 突发写入非易失性存储设备
    • US07051178B2
    • 2006-05-23
    • US10747416
    • 2003-12-29
    • Frankie F. Roohparvar
    • Frankie F. Roohparvar
    • G06F12/00
    • G11C7/1027G11C7/1018G11C7/1072G11C16/10G11C16/22G11C16/26G11C16/32
    • A synchronous flash memory has been described that includes an array of non-volatile memory cells. The memory device has a package configuration that is compatible with an SDRAM. The synchronous flash memory device includes an array of non-volatile memory cells arranged in a plurality of rows and columns. During a read operation, a row of the memory array can be accessed and data written to a group of columns during a burst write operation. The burst columns are generated using an internal counter and an externally provided start address. Repeating sequences of commands and data packets are provided to the memory device. An externally provided data mask signal is used to write one of the data packets to the memory on each of the sequences.
    • 已经描述了包括非易失性存储器单元阵列的同步闪存。 存储器件具有与SDRAM兼容的封装配置。 同步闪速存储器件包括排列成多个行和列的非易失性存储单元阵列。 在读取操作期间,可以访问存储器阵列的一行并且在突发写入操作期间将数据写入一组列。 脉冲串列使用内部计数器和外部提供的起始地址生成。 命令和数据包的重复序列被提供给存储器件。 外部提供的数据掩码信号用于将每个数据包中的一个数据包写入每个序列上的存储器。
    • 70. 发明授权
    • Semiconductor memory device capable of accessing data in continuous burst mode regardless of location of accessed data
    • 能够以连续脉冲串模式访问数据而不管访问数据的位置如何的半导体存储器件
    • US06930951B2
    • 2005-08-16
    • US10744322
    • 2003-12-22
    • Jin-Hong AhnSang-Hoon HongJae-Bum KoSe-Jun Kim
    • Jin-Hong AhnSang-Hoon HongJae-Bum KoSe-Jun Kim
    • G11C8/08G11C7/10G11C8/00G11C8/12
    • G11C7/1018
    • There is provided a semiconductor memory device and a method for driving the same, which is capable of accessing data in a continuous burst mode regardless of locations of accessed data. The semiconductor memory device includes: a first bank including a first word line corresponding to a first row address; and a second bank including a second word line corresponding to a second row address, wherein the second row address is consecutive to the first row address. The method for driving a semiconductor memory device includes the steps of: receiving a first row address corresponding to a command; activating a word line of a first bank corresponding to the first row address; activating a word line of a second bank corresponding to a second row address, in which the second row address is consecutive to the first row address; sequentially accessing the predetermined number of data among the N data in a plurality of unit cells corresponding to the word line of the first bank; and sequentially accessing the remaining data in a plurality of unit cells corresponding to a word line of the second bank.
    • 提供了一种半导体存储器件及其驱动方法,其能够以连续的突发模式访问数据,而不管访问数据的位置如何。 半导体存储器件包括:第一存储体,包括对应于第一行地址的第一字线; 以及包括对应于第二行地址的第二字线的第二存储体,其中所述第二行地址与所述第一行地址连续。 驱动半导体存储器件的方法包括以下步骤:接收与命令对应的第一行地址; 激活对应于第一行地址的第一存储体的字线; 激活对应于第二行地址的第二存储体的字线,其中第二行地址与第一行地址连续; 在对应于第一存储单元的字线的多个单位单元中,依次访问N个数据中的预定数量的数据; 并且依次访问与第二存储体的字线对应的多个单位单元中的剩余数据。