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    • 63. 发明授权
    • Apparatus for semiconductor process including photo-excitation process
    • 包括光激发工艺的半导体工艺装置
    • US5229081A
    • 1993-07-20
    • US670368
    • 1991-03-14
    • Toshikazu Suda
    • Toshikazu Suda
    • C23C16/44C23C16/455C23C16/48
    • C23C16/45502C23C16/455C23C16/45514C23C16/482C23C16/487C23C16/488
    • An apparatus for use in semiconductor fabrication that includes use of a photo-excitation process and is provided with a revolving gas chamber for forming spiral vortices flow of purge gas located at the upper or side part of a gas reaction chamber, an internal or external light source, a partition having a centrally located circular opening provided between the revolving gas chamber and the gas reaction chamber, or without the partition when the revolving gas chamber is made smaller than the gas reaction chamber. The revolving gas chamber has a multiplicity of gas inlets oriented at an angle with respect to the center of the revolving gas chamber to produce a gas flow in one direction to form spiral vortices that revolves and thereby prevents the light source or light transmitting window from becoming contaminated by process reactions.
    • 一种用于半导体制造的装置,包括使用光激发过程,并且设置有旋转气室,用于形成位于气体反应室的上部或侧部的吹扫气体的螺旋涡流,内部或外部光 源,具有设置在旋转气体室和气体反应室之间的中心定位的圆形开口的隔板,或者当旋转气体室比气体反应室小时,没有分隔壁。 旋转气室具有多个气体入口,其相对于旋转气体室的中心以一定角度定向,以在一个方向上产生气流以形成旋转的螺旋涡流,从而防止光源或透光窗口变成 被过程反应污染。
    • 65. 发明授权
    • Photo-CVD apparatus
    • 光CVD装置
    • US4836140A
    • 1989-06-06
    • US245936
    • 1988-09-16
    • Masashi Koji
    • Masashi Koji
    • H01L21/31C23C16/48C23C16/54H01L21/205H01L21/263
    • C23C16/482C23C16/488C23C16/54
    • A photo-CVD (chemical vapor deposition) apparatus is disclosed, in which at least two light transmission plates are used and the light from a light source is introduced into a gas reaction chamber through one of light transmission plates inserted into the chamber to cause the reactions in a reaction gas to thereby deposit a thin film or layer on a substrate located in the gas reaction chamber. In this case, a light transmission plate polluted by the reaction gas is moved to the outside of the chamber, then washed or exchanged with a new one manually or automaticaly while a clean one is inserted into the chamber, so that the photo-CVD process can be carried out continuously without interrupting the irradiation of the light from the light source.
    • 公开了一种光CVD(化学气相沉积)装置,其中使用至少两个光透射板,并且将来自光源的光通过插入室中的一个透光板引入气体反应室,使得 反应气体中的反应,从而在位于气体反应室中的基底上沉积薄膜或层。 在这种情况下,由反应气体污染的透光板被移动到室的外部,然后手动或自动地洗涤或更换新的,同时将清洁的一个插入到室中,使得光CVD过程 可以连续地进行而不中断来自光源的光的照射。
    • 66. 发明授权
    • Method of forming deposition film
    • 形成沉积膜的方法
    • US4683147A
    • 1987-07-28
    • US722468
    • 1985-04-12
    • Ken EguchiHiroshi MatsudaMasahiro HarutaYukuo NishimuraYutaka HiraiTakashi Nakagiri
    • Ken EguchiHiroshi MatsudaMasahiro HarutaYukuo NishimuraYutaka HiraiTakashi Nakagiri
    • B05D3/06B05D7/24C23C16/22C23C16/48H01L21/205
    • B05D1/60C23C16/22C23C16/482C23C16/483C23C16/488H01L21/0237H01L21/0245H01L21/02532H01L21/02576H01L21/02579H01L21/0262B05D3/06
    • A method of forming a silicon-containing film deposited on a substrate, which comprises the steps of forming a gaseous atmosphere of at least one silicon compound selected from the group consisting of compounds represented by general formulas (A), (B), (C), (D), (E) and (F) in a deposition chamber containing the substrate, and applying light energy to the compound to exite and decompose the compound. The compounds of the general formulas (A)-(F) are defined below: (A) Si.sub.n H.sub.m X.sub.l (wherein X is a halogen atom, n is an integer of not less than 3, and m and l are integers of not less than 1, respectively, m+l=2n; if l is an integer of not less than 2, a plurality of X's may represent different halogen atoms) representing a cyclic silicon compound; (B) Si.sub.a X.sub.2a+2 (wherein X is a halogen atom and a is an integer of 1 to 6) representing a chain halogenated silicon compound; (C) Si.sub.b X.sub.2b (wherein X is a halogen atom and b is an integer of 3 to 6) representing a cyclic halogenated silicon compound; (D) Si.sub. c X.sub.d Y.sub.e (wherein X and Y are different halogen atoms, c is an integer of 3 to 6, d and e are integers of not less than 1, and d+e=2c) representing a cyclic halogenated silicon compound; (E) Si.sub.f Y.sub.g Y.sub.h (X and Y are different halogen atoms, f is an integer of 1 to 6, g and h are integers of not less than 1, and g+h=2f+2) representing a chain halogenated silicon compound; and (F) Si.sub.i H.sub.j X.sub.k (wherein X is a halogen atom, i,j and k are integers of not less than 1, and j+k=2i+2) representing a silicon compound.
    • 一种形成沉积在基底上的含硅膜的方法,其包括以下步骤:形成至少一种选自以下通式(A),(B),(C ),(D),(E)和(F),并且向化合物施加光能以排出和分解化合物。 通式(A) - (F)的化合物定义如下:(A)SinHmX1(其中X是卤素原子,n是不小于3的整数,m和l是不小于1的整数 分别为m + 1 = 2n;如果l为不小于2的整数,多个X可以表示不同的卤原子),代表环状硅化合物; (B)代表链卤化硅化合物的SiaX2a + 2(其中X是卤素原子,a是1至6的整数); (C)表示环状卤代硅化合物的SibX2b(其中,X为卤素原子,b为3〜6的整数) (D)Si cXdYe(其中X和Y是不同的卤素原子,c是3至6的整数,d和e是不小于1的整数,d + e = 2c)表示环状卤化硅化合物; (E)SifYgYh(X和Y是不同的卤素原子,f是1至6的整数,g和h是不小于1的整数,g + h = 2f + 2)代表链卤化硅化合物; 和(F)SiiHjXk(其中X是卤素原子,i,j和k是不小于1的整数,j + k = 2i + 2)表示硅化合物。
    • 67. 发明授权
    • Method for photochemical vapor deposition
    • 光化学气相沉积方法
    • US4597986A
    • 1986-07-01
    • US764815
    • 1985-08-12
    • Robert Y. ScappleJohn W. PetersJacques F. LinderEdward M. Yee
    • Robert Y. ScappleJohn W. PetersJacques F. LinderEdward M. Yee
    • C23C16/44C23C16/455C23C16/48B05D3/06
    • C23C16/45578C23C16/45589C23C16/482C23C16/487C23C16/488
    • An apparatus for photochemical vapor deposition includes an outer reactor shell and a concentric inner shell which define a photochemical reaction zone. A radiation source is centrally located within the transparent inner shell, which isolates the radiation source from the vapor phase reactants present in the reaction zone. A rotating gas manifold is located within the reaction zone to uniformly distribute the vapor phase reactants within the reaction zone. Protective liquid is continually applied to the outer surface of the inner shell and spread into a thin film by wiper blades, to prevent deposition of reaction products onto the outer wall of the inner shell. The central location of the radiation source, along with the protective liquid film, make optimum usage of the reaction-inducing radiation generated by the radiation source. In addition, the rotating gas manifold promotes uniform deposition of layers of selected materials on substrates placed within the reaction zone.
    • 用于光化学气相沉积的装置包括外反应器壳和限定光化学反应区的同心内壳。 辐射源位于透明内壳的中心位置,其将辐射源与反应区中存在的气相反应物隔离。 旋转气体歧管位于反应区内,以使气相反应物在反应区内均匀分布。 保护液体连续地施加到内壳的外表面,并通过刮片传播成薄膜,以防止反应产物沉积到内壳的外壁上。 辐射源的中心位置以及保护液膜可以最佳地利用由辐射源产生的反应诱导辐射。 此外,旋转气体歧管促进了选定材料的层的均匀沉积在放置在反应区内的衬底上。