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    • 1. 发明授权
    • Low temperature process for depositing an oxide dielectric layer on a
conductive surface and multilayer structures formed thereby
    • 用于在导电表面上沉积氧化物介电层的低温工艺和由此形成的多层结构
    • US4419385A
    • 1983-12-06
    • US305009
    • 1981-09-24
    • John W. Peters
    • John W. Peters
    • C23C16/40H01L21/316B05D5/12B32B9/04C23C11/00
    • H01L21/02164C23C16/402H01L21/02211H01L21/02277H01L21/31608H01L21/31612
    • The specification discloses a low temperature process for forming an effective insulating layer of a selected oxide on the surface of a chosen conductive substrate. The oxide so formed has low pinhole density, good surface morphology, and good step coverage. In addition, the disclosed process simultaneously minimizes the deformation or restructuring of the surface of a temperature-sensitive conductive substrate, which would produce unwanted hillocks or spikes that degrade the insulating properties of the oxide. In accordance with the disclosed process, the substrate is exposed to a chosen vapor phase reactant in the presence of neutral, charge-free atomic oxygen to produce a reaction between the atomic oxygen and the vapor phase reactant to form the selected oxide, which deposits on the surface of the conductive substrate. Improved multilayer structures comprising multiple layers of conductive material separated by an oxide dielectric layer are formed by the disclosed process.
    • 本说明书公开了一种用于在所选择的导电衬底的表面上形成选定氧化物的有效绝缘层的低温工艺。 这样形成的氧化物具有低的针孔密度,良好的表面形态和良好的阶梯覆盖。 此外,所公开的方法同时最小化温度敏感导电基材的表面的变形或重组,这将产生降低氧化物绝缘性能的不希望的小丘或尖峰。 根据所公开的方法,在中性,无电荷的原子氧的存在下,将衬底暴露于所选择的气相反应物,以在原子氧和气相反应物之间产生反应,形成所选择的氧化物,其沉积在 导电基板的表面。 通过公开的方法形成包括由氧化物介电层分离的多层导电材料的改进的多层结构。
    • 3. 发明授权
    • Method for photochemical vapor deposition
    • 光化学气相沉积方法
    • US4597986A
    • 1986-07-01
    • US764815
    • 1985-08-12
    • Robert Y. ScappleJohn W. PetersJacques F. LinderEdward M. Yee
    • Robert Y. ScappleJohn W. PetersJacques F. LinderEdward M. Yee
    • C23C16/44C23C16/455C23C16/48B05D3/06
    • C23C16/45578C23C16/45589C23C16/482C23C16/487C23C16/488
    • An apparatus for photochemical vapor deposition includes an outer reactor shell and a concentric inner shell which define a photochemical reaction zone. A radiation source is centrally located within the transparent inner shell, which isolates the radiation source from the vapor phase reactants present in the reaction zone. A rotating gas manifold is located within the reaction zone to uniformly distribute the vapor phase reactants within the reaction zone. Protective liquid is continually applied to the outer surface of the inner shell and spread into a thin film by wiper blades, to prevent deposition of reaction products onto the outer wall of the inner shell. The central location of the radiation source, along with the protective liquid film, make optimum usage of the reaction-inducing radiation generated by the radiation source. In addition, the rotating gas manifold promotes uniform deposition of layers of selected materials on substrates placed within the reaction zone.
    • 用于光化学气相沉积的装置包括外反应器壳和限定光化学反应区的同心内壳。 辐射源位于透明内壳的中心位置,其将辐射源与反应区中存在的气相反应物隔离。 旋转气体歧管位于反应区内,以使气相反应物在反应区内均匀分布。 保护液体连续地施加到内壳的外表面,并通过刮片传播成薄膜,以防止反应产物沉积到内壳的外壁上。 辐射源的中心位置以及保护液膜可以最佳地利用由辐射源产生的反应诱导辐射。 此外,旋转气体歧管促进了选定材料的层的均匀沉积在放置在反应区内的衬底上。
    • 4. 发明授权
    • Process for forming sulfide layers
    • 形成硫化物层的方法
    • US4513057A
    • 1985-04-23
    • US573267
    • 1984-01-23
    • John W. Peters
    • John W. Peters
    • C23C16/30C23C16/48H01L21/314H01L21/471H01L31/0216H01L31/18H01L21/18
    • C23C16/482C23C16/306H01L21/314H01L21/471H01L31/02161H01L31/18Y10T428/265
    • The specification discloses a low-temperature process for depositing a layer of a sulfide of a chosen element, such as zinc sulfide, on the surface of a substrate while simultaneously avoiding damage to the substrate. The process comprises exposing the substrate to a selected vapor phase reactant containing the chosen metal, such as dimethyl zinc, in the presence of neutral, charge-free sulfur atoms formed in a manner which avoids the generation of charged particles and high energy radiation that would damage the substrate. The sulfur atoms react with the vapor phase reactant to form the sulfide thereof, such as zinc sulfide, which deposits as a layer on the surface of the substrate. In a preferred process embodiment, the neutral sulfur atoms are generated by photochemical dissociation. In addition, there is disclosed a process for forming a native sulfide layer on the surface of a chosen substrate by exposing the substrate to neutral, charge-free sulfur atoms.
    • 该说明书公开了一种用于在衬底的表面上沉积所选元素硫化锌的硫化物层的低温工艺,同时避免对衬底的损坏。 该方法包括将所述底物暴露于所选择的含有所选择的金属如二甲基锌的气相反应物中,在不产生带电粒子和高能量辐射的方式形成的中性无电荷硫原子的存在下, 损坏基板。 硫原子与气相反应物反应形成其硫化物,例如硫化锌,其作为一层沉积在基材的表面上。 在优选的方法实施方案中,通过光化学解离产生中性硫原子。 此外,公开了通过将衬底暴露于中性的无电荷硫原子在所选衬底的表面上形成天然硫化物层的方法。
    • 8. 发明授权
    • Low temperature process for depositing epitaxial layers
    • 用于沉积外延层的低温工艺
    • US4623426A
    • 1986-11-18
    • US700051
    • 1985-02-08
    • John W. Peters
    • John W. Peters
    • C30B25/02C30B29/16C30B29/46
    • C30B25/02C30B29/16C30B29/46
    • The specification discloses a low temperature process for depositing an epitaxial layer of a selected oxide or a selected sulfide material on a chosen substrate. The substrate is exposed to a chosen vapor phase reactant in the presence of neutral, charge-free oxygen atoms or sulfur atoms to produce a reaction between the atomic species and the vapor phase reactant to form the desired oxide or sulfide and induce the crystalline growth thereof as an epitaxial layer on the surface of the substrate. The atomic oxygen or the atomic sulfur is formed at a low temperature by the photochemical dissociation of a selected oxygen-containing precursor or a selected sulfur-containing precursor, respectively.
    • 该说明书公开了一种用于在所选择的衬底上沉积所选择的氧化物或选定的硫化物材料的外延层的低温工艺。 在中性,无电荷的氧原子或硫原子的存在下,将衬底暴露于所选择的气相反应物,以在原子物质和气相反应物之间产生反应,形成所需的氧化物或硫化物并诱导其结晶生长 作为衬底表面上的外延层。 分别通过选择的含氧前体或所选择的含硫前体的光化学解离,在低温下形成原子氧或原子硫。
    • 9. 发明授权
    • Barrel reactor and method for photochemical vapor deposition
    • 桶反应器和光化学气相沉积法
    • US4615294A
    • 1986-10-07
    • US636446
    • 1984-07-31
    • Robert Y. ScappleJohn W. PetersJacques F. LinderEdward M. Yee
    • Robert Y. ScappleJohn W. PetersJacques F. LinderEdward M. Yee
    • C23C16/44C23C16/455C23C16/48C23C14/00
    • C23C16/45578C23C16/45589C23C16/482C23C16/488
    • An apparatus for photochemical vapor deposition includes an outer reactor shell and a concentric inner shell which define a photochemical reaction zone. A radiation source is centrally located within the transparent inner shell, which isolates the radiation source from the vapor phase reactants present in the reaction zone. A rotating gas manifold is located within the reaction zone to uniformly distribute the vapor phase reactants within the reaction zone. Protective liquid is continually applied to the outer surface of the inner shell and spread into a thin film by wiper blades, to prevent deposition of reaction products onto the outer wall of the inner shell. The central location of the radiation source, along with the protective liquid film, make optimum usage of the reaction-inducing radiation generated by the radiation source. In addition, the rotating gas manifold promotes uniform deposition of layers of selected materials on substrates placed within the reaction zone.
    • 用于光化学气相沉积的装置包括外反应器壳和限定光化学反应区的同心内壳。 辐射源位于透明内壳的中心位置,其将辐射源与反应区中存在的气相反应物隔离。 旋转气体歧管位于反应区内,以使气相反应物在反应区内均匀分布。 保护液体连续地施加到内壳的外表面,并通过刮片传播成薄膜,以防止反应产物沉积到内壳的外壁上。 辐射源的中心位置以及保护液膜可以最佳地利用由辐射源产生的反应诱导辐射。 此外,旋转气体歧管促进了选定材料的层的均匀沉积在放置在反应区内的衬底上。