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    • 66. 发明授权
    • Thin film transistor
    • 薄膜晶体管
    • US06501095B2
    • 2002-12-31
    • US09791827
    • 2001-02-26
    • Shinya YamaguchiMutsuko HatanoTakeo ShibaYoshinobu KimuraSeong-Kee Park
    • Shinya YamaguchiMutsuko HatanoTakeo ShibaYoshinobu KimuraSeong-Kee Park
    • H01L2904
    • H01L21/02675H01L21/02532H01L21/02595H01L21/2026H01L27/12H01L27/1285H01L29/045H01L29/78618H01L29/78675H01L29/78696
    • The present invention relates to a thin film transistor device, an object of the invention is to realize the thin film transistor device of high mobility by large-grain sizing (quasi single crystal) a low-temperature poly-Si thin film being an elemental material of the thin film transistor in a state trued up to a crystal orientation having the most stable lattice structure in consideration of strain at the interface with a substrate, and by controlling a crystal position. The object described above can be achieved by realizing a high mobility thin film transistor device in a manner forming a channel with crystal grains having large grain size and controlled crystal orientations by paying attention to a fact that a {110} surface of IV group crystal (crystal composed of either one or a mixed crystal of them selected from a group of C, Si, Ge, Sn, and Pb) has the smallest dangling bond density, by minimizing strain energy at the substrate interface, and by making crystal growth with selection of crystal orientations having growth lengths equivalent to channel lengths.
    • 本发明涉及一种薄膜晶体管器件,其目的是通过大晶粒尺寸(准单晶)实现高迁移率的薄膜晶体管器件,作为元素材料的低温多晶硅薄膜 考虑到与衬底的界面处的应变,并且通过控制晶体位置,在处于具有最稳定的晶格结构的晶体取向的状态下的薄膜晶体管。通过实现高移动性可以实现上述目的 薄膜晶体管器件以通过注意以下事实来形成具有大晶粒尺寸和晶体取向晶体的沟道的方式:注意以下事实:IV族晶体的{110}表面(由它们中的一种或其混晶构成的晶体被选择 通过使基板界面处的应变能最小化,并且通过选择使晶体生长,从C,Si,Ge,Sn和Pb组中获得最小的悬空键密度 具有等同于通道长度的生长长度的晶体取向。
    • 67. 发明申请
    • Display Device and Fabrication Method Thereof
    • 显示装置及其制作方法
    • US20080023704A1
    • 2008-01-31
    • US11782701
    • 2007-07-25
    • TAKESHI NODATakahiro KamoEiji OueMutsuko HatanoTakeshi Sato
    • TAKESHI NODATakahiro KamoEiji OueMutsuko HatanoTakeshi Sato
    • H01L29/04H01L21/00
    • H01L29/04H01L21/02532H01L21/02683H01L21/02691H01L27/1248H01L27/1285
    • The present invention obtains a system-in-panel display device using a high-performance thin film transistor by suppressing aggregation of a molten semiconductor at the time of allowing strip-like pseudo-single crystal to grow continuously with a direction control by radiating beams of continuous oscillation laser to a semiconductor film made of silicon while scanning. A display device includes a silicon nitride film formed on the insulation substrate, a silicon oxide film formed on the silicon nitride film, a semiconductor film formed on the silicon oxide film, and a thin film transistor which uses the semiconductor film. Here, the silicon oxide film is constituted of a first silicon oxide film formed using SiH4 and N2O as raw material gases and a second silicon oxide film formed using a TEOS gas as a raw material gas, and the semiconductor film is made of pseudo-single crystal having strip-like grains.
    • 本发明通过抑制带状伪单晶在通过辐射光束的方向控制而连续生长时,通过抑制熔融半导体的聚集来获得使用高性能薄膜晶体管的面板内系统显示装置 在扫描时对由硅制成的半导体膜进行连续振荡激光。 显示装置包括形成在绝缘基板上的氮化硅膜,形成在氮化硅膜上的氧化硅膜,形成在氧化硅膜上的半导体膜,以及使用该半导体膜的薄膜晶体管。 这里,氧化硅膜由使用SiH 4 N 2和N 2 O作为原料气体形成的第一氧化硅膜和使用TEOS形成的第二氧化硅膜构成 气体作为原料气体,半导体膜由具有带状粒子的假单晶构成。