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    • 61. 发明授权
    • Method and apparatus for power driving
    • 动力驾驶方法与装置
    • US08525434B2
    • 2013-09-03
    • US12884255
    • 2010-09-17
    • Daniel ReedJinho Choi
    • Daniel ReedJinho Choi
    • G05F1/00
    • H02M3/33507H05B33/0815
    • Aspects of the disclosure provide a power circuit to provide electric energy with control and protection for driving a load, such as a light emitting diode (LED) array, and the like. The power circuit includes a converter, a voltage feedback module, a current feedback module and a controller. The converter is configured to receive electric energy from an energy source and to deliver the electric energy for driving the load. The voltage feedback module is configured to generate a first feedback signal based on a voltage of the delivered electric energy. The current feedback module is configured to generate a second feedback signal based on a current of the delivered electric energy. The controller is configured to receive the first feedback signal and the second feedback signal, and to control the converter to receive and deliver the electric energy based on the first feedback signal and the second feedback signal.
    • 本公开的方面提供了一种电力电路,以向电能提供用于驱动诸如发光二极管(LED)阵列等的负载的控制和保护。 电源电路包括转换器,电压反馈模块,电流反馈模块和控制器。 转换器被配置为从能量源接收电能并传送用于驱动负载的电能。 电压反馈模块被配置为基于所递送的电能的电压产生第一反馈信号。 电流反馈模块被配置为基于所传送的电能的电流产生第二反馈信号。 控制器被配置为接收第一反馈信号和第二反馈信号,并且基于第一反馈信号和第二反馈信号来控制转换器接收和传递电能。
    • 62. 发明申请
    • MRAM read sequence using canted bit magnetization
    • MRAM使用斜位磁化读取序列
    • US20070109839A1
    • 2007-05-17
    • US11273214
    • 2005-11-14
    • Romney KattiOwen HynesDaniel ReedHassan Kaakani
    • Romney KattiOwen HynesDaniel ReedHassan Kaakani
    • G11C11/00
    • G11C11/16
    • A new read scheme is provided for an MRAM bit having a pinned layer (fixed) and a storage layer (free) sandwiching a nonmagnetic spacer layer. By applying a magnetic field to the bit at least partially orthogonal to the easy axis of the bit, the magnetization direction of the storage layer can be partially rotated or canted without switching the logical state of the MRAM bit. The resistivity of the bit is measured (calculated based on a voltage/current relationship) in two ways: (i) with the magnetization direction of the storage layer partially rotated in a first direction and (ii) with the magnetization direction of the storage layer in its bi-stable orientation parallel to the easy axis. Those measures can then be used to compare and determine the logical state of the storage layer. For instance, if the canted resistivity is greater than the uncanted resistivity then the magnetization directions of the pinned and storage layer are parallel, and if the canted resistivity is less than the uncanted resistivity then the magnetization directions of the pinned and storage layer are opposite.
    • 为具有钉扎层(固定)和夹持非磁性间隔层的存储层(自由)的MRAM位提供了新的读取方案。 通过将至少部分地正交于该位的容易轴的位施加磁场,可以在不切换MRAM位的逻辑状态的情况下部分地旋转或倾斜存储层的磁化方向。 以两种方式测量位的电阻率(基于电压/电流关系计算):(i)存储层的磁化方向在第一方向上部分旋转,并且(ii)与存储层的磁化方向 其平行于易轴的双稳态取向。 然后可以使用这些措施来比较和确定存储层的逻辑状态。 例如,如果倾斜电阻率大于无电阻率,那么被钉扎层和存储层的磁化方向是平行的,并且如果斜面电阻率小于未被覆盖的电阻率,那么被钉扎和存储层的磁化方向相反。