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51. 发明授权

US5470707A Hydrogen bond labeling and base sequence determination methods for DNA or RNA 失效
标题翻译： DNA或RNA的氢键标记和碱基序列测定方法
公开(公告)号：US5470707A
公开(公告)日：1995-11-28
申请号：US25997
申请日：1993-03-04
申请人： Yuji Sasaki , Yoshinori Harada
发明人： Yuji Sasaki , Yoshinori Harada
IPC分类号： G01Q30/10 , C12Q1/68 , G01N37/00 , G01Q30/12 , G01Q60/10 , G01Q60/24 , G01Q80/00 , C07H21/00
CPC分类号： B82Y15/00 , C12Q1/6816 , C12Q1/6869
摘要： A hydrogen bond labeling and base sequence determination method for DNA or RNA takes advantage of the complementary nature of the fundamental structure of DNA or RNA bases to bind corresponding chemical species with the base species of a denatured DNA or RNA chain. After providing an aqueous solution containing a nucleic acid, heating the aqueous solution to cleave the nucleic acid; cooling the aqueous solution and adding a base-specific labeling molecule having available hydrogen bonds to the aqueous solution, the base-specific labeling molecules bond to the available bases in a one-to-one fashion via the available hydrogen bonds. The resulting labeled molecule can be microscopically observed to determine the base sequence of the nucleic acid.
摘要翻译：用于DNA或RNA的氢键标记和碱基序列测定方法利用DNA或RNA碱基的基本结构的互补性质来结合相应的化学物质与变性DNA或RNA链的碱基。在提供含有核酸的水溶液之后，加热该水溶液以切割该核酸; 将水溶液冷却并向水溶液中加入具有可用氢键的碱基特异性标记分子，碱基特异性标记分子通过可用的氢键以一对一的方式结合到可用碱基上。可以显微观察得到的标记分子以确定核酸的碱基序列。

52. 发明授权

US5241527A Recording and reproducing apparatus and method using a recording layer having a positioning region 失效
标题翻译：使用具有定位区域的记录层的记录和再现装置和方法
公开(公告)号：US5241527A
公开(公告)日：1993-08-31
申请号：US491289
申请日：1990-03-09
申请人： Ken Eguchi , Kiyoshi Takimoto , Haruki Kawada , Junji Ohyama
发明人： Ken Eguchi , Kiyoshi Takimoto , Haruki Kawada , Junji Ohyama
IPC分类号： G01Q30/10 , G01Q60/00 , G11B9/00 , G11B9/06 , G11B11/03
CPC分类号： G11B9/063 , G11B11/03 , G11B9/14 , B82Y10/00 , G01Q10/06 , G01Q80/00 , Y10S977/947
摘要： A recording-reproducing apparatus comprises a recording medium provided with a recording layer containing at least two kinds of compounds, which compounds respectively form phases, and having regular periodic structure comprising said phases as constituent units; a probe electrode disposed opposingly to said recording medium; a circuit for applying a voltage between said recording medium and probe electrode; and a circuit for detecting an electric current flowing between said recording medium and probe electrode. A recording-reproducing method comprises detecting by the use of a probe electrode, at least one phase on a recording medium of the apparatus and recording information or reproducing the recorded information at the position where said phase has been detected.
摘要翻译：一种记录再现装置，包括：记录介质，其具有含有至少两种化合物的记录层，所述化合物分别形成相，并具有包含所述相的规则周期性结构作为构成单元; 与所述记录介质相对设置的探针电极; 用于在所述记录介质和探针电极之间施加电压的电路; 以及用于检测在所述记录介质和探针电极之间流动的电流的电路。记录再现方法包括通过使用探针电极，装置的记录介质上的至少一个相位进行检测，并且在已经检测到所述相位的位置记录信息或再现记录的信息。

53. 发明授权

US5088290A Transfer vessel apparatus and method of storing samples 失效
标题翻译：转移容器装置和储存样品的方法
公开(公告)号：US5088290A
公开(公告)日：1992-02-18
申请号：US570809
申请日：1990-08-22
申请人： Takao Yasue
发明人： Takao Yasue
IPC分类号： G01N1/00 , B01J3/00 , B01J3/02 , B01J19/14 , B01L1/02 , C30B35/00 , G01Q30/08 , G01Q30/10 , G01Q30/16 , G01Q30/20 , H01J37/20
CPC分类号： B01J3/006 , B01J19/14 , B01L1/02
摘要： A transfer vessel apparatus has a device for introducing gas from a liquid nitrogen trap into a vessel body to form and maintain an inert atmosphere in the vessel body. The inert atmosphere maintained in the vessel body enables a sample to be stored for long periods and enables transfer of the sample between different vacuum systems.
摘要翻译：转移容器装置具有用于将气体从液氮阱导入容器主体中以在容器主体中形成和保持惰性气氛的装置。保持在容器主体中的惰性气氛使得样品能够长时间储存并且能够在不同的真空系统之间传送样品。

54. 发明授权

US4941753A Absorption microscopy and/or spectroscopy with scanning tunneling microscopy control 失效
标题翻译：吸收显微镜和/或光谱与扫描隧道显微镜控制
公开(公告)号：US4941753A
公开(公告)日：1990-07-17
申请号：US334833
申请日：1989-04-07
申请人： Hemantha K. Wickramasinghe
发明人： Hemantha K. Wickramasinghe
IPC分类号： G01N25/00 , G01B7/02 , G01K1/16 , G01N1/28 , G01N21/00 , G01N27/00 , G01N37/00 , G01Q30/10 , G01Q60/12 , H01J37/28
CPC分类号： G01Q60/12 , B82Y35/00 , G01B7/023 , Y10S977/852 , Y10S977/867
摘要： High resolution absorption microscopy, spectroscopy and similar applications are implemented by providing for a measurement tip which is maintained spaced from a sample under investigation sufficiently close so as to equalize thermal levels in the tip and the sample; generally within about 10 Angstroms. Energy is applied to the sample being investigated and either a steady state or dynamic junction potential is measured. The junction potential is representative of local sample temperature. The close separation can be maintained by techniques employed in scanning tunneling microscopy, atomic force microscopy or capacitance microscopy. In the event the close separation is maintained using scanning tunneling microscopy techniques, then a switching arrangement is provided for connecting a conductive film (either of the sample or supported on a sample) to either a suitable potential or ground and simultaneously connecting the STM tip either in a feedback loop or to a device for measuring the junction potential. The feedback loop, in addition to conventional operational amplifier components, includes a sample and hold element to maintain the input voltage to an operational amplifier in the feedback loop during those times that the measurement tip is connected to the junction potential measurement device, as opposed to being connected in the STM feedback loop. The spectroscopy application uses similar architecture, althrough the energy source is tunable.

55. 发明授权

US4860224A Surface analysis spectroscopy apparatus 失效
标题翻译：表面分析光谱仪
公开(公告)号：US4860224A
公开(公告)日：1989-08-22
申请号：US866062
申请日：1986-05-21
申请人： Edmund M. Cashell , Liam McDonnell
发明人： Edmund M. Cashell , Liam McDonnell
IPC分类号： G01N23/225 , G01N23/22 , G01N23/227 , G01N25/72 , G01Q30/10 , G01Q30/16 , G01Q30/20 , H01J37/252 , H01J49/06 , H01J49/48
CPC分类号： G01N23/2206 , G01N25/72 , H01J37/252 , H01J49/06 , H01J49/482 , G01N21/1702
摘要： In an apparatus for surface analysis microscopy, a number of analysis device are mounted on an ultra-high vacuum chamber. The devices include a beam source of locally heating a selected region of a specimen and a temperature-detector for monitoring the heating of the selected region, as well as an electron gun and an analyzer for detecting emission from a specimen region subjected to electron bombardment. An ion gun may also be provided. The apparatus enables thermal microscopy of a specimen to be carried out in conjunction with other surface analysis techniques including, inter alia, scanning electron microscopy and Auger electron microscopy, within a single apparatus and during a single experimental operation. A novel configuration of cylindrical mirror analyser facilitates mounting a multiplicity of analysis devices on the chamber in a compact manner for studying a specimen at a single position.
摘要翻译：在用于表面分析显微镜的装置中，多个分析装置安装在超高真空室上。这些装置包括局部加热试样的选定区域的束源和用于监测所选区域的加热的温度检测器，以及用于检测经受电子轰击的样本区域的发射的电子枪和分析器。也可以提供离子枪。该装置能够在单个装置内和在单个实验操作期间结合其它表面分析技术（包括扫描电子显微镜和俄歇电子显微镜）进行样品的热显微镜检查。圆柱形镜面分析仪的新颖结构便于以紧凑的方式在腔室上安装多个分析装置，以便在单个位置上研究样本。

56. 发明授权

US4687930A Ion beam apparatus 失效
标题翻译：离子束装置
公开(公告)号：US4687930A
公开(公告)日：1987-08-18
申请号：US736123
申请日：1985-05-20
申请人： Hifumi Tamura , Shigehiko Yamamoto , Hiroyasu Shichi , Toru Ishitani
发明人： Hifumi Tamura , Shigehiko Yamamoto , Hiroyasu Shichi , Toru Ishitani
IPC分类号： H01J37/08 , G01Q30/10 , G01Q30/12 , H01J37/02 , H01J37/20 , H01J37/252 , H01J37/30 , H01J49/14 , G01N23/00
CPC分类号： H01J37/3002 , H01J37/02 , H01J49/142
摘要： The surface of a specimen such as a semiconductor wafer is processed and analyzed by the irradiator of the surface with an ion beam. The zone of the specimen to be processed and analyzed is kept by heating at a temperature higher than the melting point of an element or compound forming the ion species used for the irradiation. The means used for this heating may be an electron beam source, a light source, a resistance heating source, or a high-frequency heating source.
摘要翻译：通过离子束的表面的照射器对诸如半导体晶片的样品的表面进行处理和分析。通过在高于形成用于照射的离子种的元素或化合物的熔点的温度下加热来保持待处理和分析的样品的区域。用于该加热的装置可以是电子束源，光源，电阻加热源或高频加热源。

57. 发明授权

US3930155A Ion microprobe analyser 失效
标题翻译：离子微探针分析仪
公开(公告)号：US3930155A
公开(公告)日：1975-12-30
申请号：US43406174
申请日：1974-01-17
申请人： HITACHI LTD
发明人： KANOMATA ICHIRO , DOI HIROSHI , TAMURA HIFUMI
IPC分类号： G01Q30/02 , G01Q30/10 , G01Q30/12 , H01J37/252 , H01J49/14 , H01J49/32 , H01J37/00
CPC分类号： H01J49/322 , H01J37/252 , H01J49/142
摘要： An ion microprobe analyser in which a specimen to be analysed is irradiated with primary ions of non-reactive gas and the mass-tocharge ratio and intensity of secondary ions emitted from the specimen are measured for the qualitative and quantitative analysis of elements constituting the specimen. In the analyser, means for directing a reactive gas toward a desired spot on the surface of the specimen to be analysed is provided so as to eliminate serious limitations and undesirable side effects due to the use of the reactive gas atmosphere thereby improving the sensitivity and quantitativity of analysis.
摘要翻译：一种离子微探针分析仪，其中待分析样品用非反应性气体的一次离子照射，并且测量从样品发射的二次离子的质荷比和强度，用于定量和定量分析构成标本。在分析仪中，提供了将反应性气体引导到待分析试样的表面上的期望点的装置，以消除由于使用反应气体气氛引起的严重限制和不期望的副作用，从而提高灵敏度和定量性的分析。

58. 发明授权

US3919558A Hot sub-stage for a scanning electron microscope 失效
标题翻译：扫描电子显微镜的热次级
公开(公告)号：US3919558A
公开(公告)日：1975-11-11
申请号：US52060974
申请日：1974-11-04
申请人： GEN ELECTRIC
发明人： BROUILLETTE JOSEPH W , LEYSHON WILLIAM E
IPC分类号： G01Q30/10 , H01J37/20
CPC分类号： H01J37/20
摘要： The present invention relates to a hot sub-stage for a scanning electron microscope characterized by a minimum heated mass, easy outgassing and capable of operation at temperatures in the vicinity of 2500*K. The hot sub-stage employs a boat for holding the sample, formed of a flexible, reflective, refractory conductive foil, through which heating current passes. The sample is enfolded in the boat and disposed so that image forming secondary electrons may pursue both rectilinear and curved paths from the sample through a thermionic electron suppression grid to the secondary electron collection means. This geometry provides excellent discrimination against unwanted thermionic electrons and yet minimizes velocity selection of the more energetic secondary electrons. Heater magnetic field neutralization for avoiding beam offset is also provided.
摘要翻译：本发明涉及一种用于扫描电子显微镜的热次级，其特征在于最小加热质量，容易脱气，并且能够在2500°K附近的温度下运行。热次级采用一个用于容纳样品的船由柔性的反射性难熔导电箔形成，加热电流通过该箔。样品被包裹在船中并且被设置成使得形成二次电子的图像可以追求从样品通过热离子电子抑制栅格到二次电子收集装置的直线和弯曲路径。这种几何形状提供了对不需要的热离子电子的极好的区分，并且使得能量更高的二次电子的速度选择最小化。还提供了用于避免光束偏移的加热器磁场中和。

59. 发明授权

US3790793A Molecular scanner 失效
标题翻译：分子扫描仪
公开(公告)号：US3790793A
公开(公告)日：1974-02-05
申请号：US3790793D
申请日：1971-11-05
申请人： MASSACHUSETTS INST TECHNOLOGY
发明人： KING J
IPC分类号： G01Q30/10 , G01N23/22 , G01Q60/00 , G01N27/78 , H01S1/00
CPC分类号： G01N23/22 , G01N2223/07 , G01N2223/102 , G01N2223/406
摘要： A device and method in which neutral atoms or molecules are used to observe surfaces of samples and capable in particular of producing information from inhomogeneous samples where the forces and interactions are of strength characterized by moderate temperatures in the range of 100*K to 500*K. Molecules evaporating from the surface of a sample are shown selected by a pin-hole and detected and converted to an ion current by a surface ionizing detector. With relative scanning movement of components of the system, the ion current is monitored and recorded, indicating the spatial variation in evaporation of the molecules from the sample.
摘要翻译：使用中性原子或分子来观察样品表面的装置和方法，特别是能够从不均匀的样品产生信息，其中力和相互作用强度的特征在于温度在100°K至500°K 从样品表面蒸发的分子由针孔选出，并通过表面电离检测器检测并转换为离子电流。通过系统组件的相对扫描运动，监测和记录离子电流，指示分子从样品中蒸发的空间变化。

60. 发明申请

US20220057430A1 SCANNING PROBE MICROSCOPE, SCAN HEAD AND METHOD 有权
公开(公告)号：US20220057430A1
公开(公告)日：2022-02-24
申请号：US17299431
申请日：2019-12-03
申请人： Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
发明人： Roelof Willem HERFST , Hamed SADEGHIAN MARNANI
IPC分类号： G01Q20/04 , G01Q10/04 , G01Q30/10 , G01Q70/04
摘要： The present invention relates to a scan head for a scanning probe microscope arranged for moving a probe including a conductive cantilever relatively to a substrate surface, the head comprising: a first electrode positioned such that a capacitor is formed across a gap between the first electrode and a second electrode, wherein the second electrode is formed by the conductive cantilever; a voltage source for actuating the conductive cantilever by applying a voltage to the capacitor; and at least a first resistor arranged in series between the voltage source and one of the first and second electrodes such as to form an RC circuit for damping a vibration of the cantilever.

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