专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

51. 发明授权

US08305573B2 Method of monitoring and controlling of mixing processes 失效
标题翻译：监测和控制混合过程的方法
公开(公告)号：US08305573B2
公开(公告)日：2012-11-06
申请号：US11990712
申请日：2006-08-22
申请人： Gerhard F. Swiegers , Anton L. Launikonis , John Kraft
发明人： Gerhard F. Swiegers , Anton L. Launikonis , John Kraft
IPC分类号： G01J3/30
CPC分类号： B01F15/00214
摘要： A method for determining the degree of mixing between components in a mixing process, the method including the steps of: a) mixing at least two components and at least two luminescent materials to form a mixture, wherein the luminescent materials are added to the mixture separately from each other, and wherein each luminescent material has a uniquely detectable luminescence emission wavelength; b) detecting emitted luminescence from a sample of the mixture, wherein the emitted luminescence includes different luminescence intensities at the uniquely detectable luminescence emission wavelengths of the luminescent materials; c) wherein the ratio of luminescence intensities and/or the absolute or relative intensities of luminescence at the uniquely detectable luminescence emission wavelengths is indicative of the degree of mixing between the components.
摘要翻译：一种用于确定混合过程中组分之间的混合程度的方法，所述方法包括以下步骤：a）将至少两种组分和至少两种发光材料混合以形成混合物，其中将发光材料分别加入到混合物中并且其中每个发光材料具有唯一可检测的发光发射波长; b）检测来自混合物样品的发射光，其中所发射的发光在发光材料的唯一可检测的发光发射波长处包括不同的发光强度; c）其中在唯一可探测的发光波长处的发光强度和/或发光的绝对或相对强度的比率表示组分之间的混合程度。

52. 发明授权

US08228501B2 Method and apparatus for detecting embedded material within an interaction region of a structure 失效
标题翻译：用于检测结构的相互作用区域内的嵌入材料的方法和装置
公开(公告)号：US08228501B2
公开(公告)日：2012-07-24
申请号：US12957197
申请日：2010-11-30
申请人： Paul E. Denney , Jay R. Eastman , Ta-Chieh Huang
发明人： Paul E. Denney , Jay R. Eastman , Ta-Chieh Huang
IPC分类号： G01J3/30
CPC分类号： B23K26/032 , B23K26/03 , B23K26/034 , B23K26/043 , B23K26/12 , B23K26/123 , B23K26/128 , B23K26/142 , B23K26/16 , G01J3/02 , G01J3/0218 , G01J3/0291 , G01J3/28
摘要： A system and method processes a structure comprising embedded material. The system includes a laser adapted to generate light and to irradiate an interaction region of the structure. The system further includes an optical system adapted to receive light from the interaction region and to generate a detection signal indicative of the presence of embedded material in the interaction region. The system further includes a controller operatively coupled to the laser and the optical system. The controller is adapted to receive the detection signal and to be responsive to the detection signal by selectively adjusting the laser.
摘要翻译：系统和方法处理包括嵌入材料的结构。该系统包括适于产生光并照射结构的相互作用区域的激光器。该系统还包括适于接收来自相互作用区域的光并且产生指示在相互作用区域中存在嵌入材料的检测信号的光学系统。该系统还包括可操作地耦合到激光器和光学系统的控制器。控制器适于接收检测信号，并通过选择性调节激光来响应检测信号。

53. 发明授权

US08184288B2 Method of depositing a silicon-containing material by utilizing a multi-step fill-in process in a deposition machine 有权
标题翻译：通过在沉积机中利用多步填充工艺沉积含硅材料的方法
公开(公告)号：US08184288B2
公开(公告)日：2012-05-22
申请号：US12540001
申请日：2009-08-12
申请人： Tuung Luoh , Sheng-Hui Hsieh , Shing-Ann Luo , Chin-Ta Su , Ta-Hung Yang , Kuang-Chao Chen
发明人： Tuung Luoh , Sheng-Hui Hsieh , Shing-Ann Luo , Chin-Ta Su , Ta-Hung Yang , Kuang-Chao Chen
IPC分类号： G01J3/30
CPC分类号： H01J37/32972 , G01N21/68 , H01J37/32935
摘要： An advance process control (APC) system for a plasma process machine is provided, which includes at least an optical emission spectroscopy (OES) system and an APC analysis apparatus. The OES system is used for monitoring a testing object in the plasma process machine. The APC analysis apparatus is used for analyzing the data received from the OES system.
摘要翻译：提供了一种用于等离子体处理机的先进过程控制（APC）系统，其包括至少一个光发射光谱（OES）系统和APC分析装置。 OES系统用于监测等离子体处理机中的测试对象。 APC分析装置用于分析从OES系统接收到的数据。

54. 发明授权

US08174692B2 High spatial resolution imaging of a structure of interest in a specimen 有权
标题翻译：样本中感兴趣结构的高空间分辨率成像
公开(公告)号：US08174692B2
公开(公告)日：2012-05-08
申请号：US12949159
申请日：2010-11-18
申请人： Stefan W. Hell , Jonas Fölling , Christian Eggeling , Alexander Egner , Andreas Schönle , Mariano Bossi
发明人： Stefan W. Hell , Jonas Fölling , Christian Eggeling , Alexander Egner , Andreas Schönle , Mariano Bossi
IPC分类号： G01J3/30
CPC分类号： G01N21/6458 , G01N21/6428 , G02B21/16 , G02B21/367 , G02B27/58
摘要： In high spatial resolution imaging, a structure in a specimen is marked with a substance which, in a first electronic state, is excited by light of one wavelength to emit fluorescent light, which is also converted from its first into a second electronic state by that light, and which returns from its second into its first electronic state. The specimen is imaged onto a sensor at a spatial resolution not resolving an average spacing between neighboring molecules of the substance, and exposed to the light at such an intensity that the molecules in the first state are alternately excited to emit fluorescent light and converted into their second state, and that at least 10% of the molecules presently in their first state lie at a distance from their closest neighboring molecules in their first state which is greater than the spatial resolution of the imaging onto the sensor.
摘要翻译：在高空间分辨率成像中，样本中的结构用物质标记，该物质在第一电子状态下被一个波长的光激发以发射荧光，其也从其第一个电子状态转换成第二电子状态光，从第二个回到第一个电子状态。将样本以不分辨物质的相邻分子之间的平均间隔的空间分辨率成像到传感器上，并以如此强度暴露于光，使得第一状态下的分子被交替地激发以发射荧光并转换成它们并且目前处于其第一状态的至少10％的分子处于与它们的第一状态中最接近的相邻分子相距一定距离，其大于成像在传感器上的空间分辨率。

55. 发明申请

US20120099104A1 SPECTROSCOPE 有权
公开(公告)号：US20120099104A1
公开(公告)日：2012-04-26
申请号：US13342379
申请日：2012-01-03
申请人： Katsumi SHIBAYAMA , Tomofumi SUZUKI , Masashi ITO
发明人： Katsumi SHIBAYAMA , Tomofumi SUZUKI , Masashi ITO
IPC分类号： G01J3/30
CPC分类号： G01J3/02 , G01J3/0208 , G01J3/0218 , G01J3/0259 , G01J3/0291
摘要： The spectrometer 1 is provided with a package 2 in which a light guiding portion 7 is provided, a spectroscopic module 3 accommodated inside the package 2, and a support member 29 arranged on an inner wall plane of the package 2 to support the spectroscopic module 3. The spectroscopic module 3 is provided with a body portion 11 for transmitting light made incident from the light guiding portion 7 and a spectroscopic portion 13 for dispersing light passed through the body portion 11 on a predetermined plane of the body portion 11, and the spectroscopic portion 13 is supported by the support member 29 on the predetermined plane in a state of being spaced away from the inner wall plane.
摘要翻译：光谱仪1设置有其中设置有导光部7的封装2，容纳在封装2内部的分光模块3和布置在封装2的内壁面上以支撑光谱模块3的支撑构件29 分光模块3设置有用于透射从导光部7入射的光的主体部11和用于将通过主体部11的光分散在主体部11的预定平面上的分光部13，部分13在与内壁平面间隔开的状态下由支撑构件29支撑在预定平面上。

56. 发明申请

US20120062887A1 Plasma Generating Units and Process Monitoring Devices and Semiconductor Process Apparatus Including the Same 有权
标题翻译：等离子体发生单元和过程监控设备及包括其的半导体处理设备
公开(公告)号：US20120062887A1
公开(公告)日：2012-03-15
申请号：US13217699
申请日：2011-08-25
申请人： Se-Yeon Kim , Hun Jung Yi , Sangpyoung Jeon , Hyojin Yun
发明人： Se-Yeon Kim , Hun Jung Yi , Sangpyoung Jeon , Hyojin Yun
IPC分类号： G01J3/30 , H05H1/48
CPC分类号： H05H1/0031 , H05H1/2406 , H05H2001/2431
摘要： A plasma generating unit for a process monitoring device includes a hollow first electrode extending in a length direction and a second electrode extending in the length direction and positioned within and displaced from the first electrode with a distance therebetween. The first electrode has an inner diameter and the second electrode has an outer diameter selected to vary the distance between the electrodes in the length direction so that the plasma generating unit generates a plasma by ionizing a gas flowing between the electrodes at a different position in the length direction based on a pressure of the gas.
摘要翻译：一种用于过程监测装置的等离子体产生装置包括沿长度方向延伸的中空第一电极和沿长度方向延伸的第二电极，并且位于第一电极内并且与第一电极相距一定距离。所述第一电极具有内径，并且所述第二电极具有选择的外径以改变所述电极之间的长度方向上的距离，使得所述等离子体产生单元通过在所述电极中的不同位置处电离在所述电极之间流动的气体来产生等离子体基于气体的压力的长度方向。

57. 发明授权

US08077310B2 System and method of capturing multiple source excitations from a single location on a flow channel 有权
标题翻译：从流通道上的单个位置捕获多个源激励的系统和方法
公开(公告)号：US08077310B2
公开(公告)日：2011-12-13
申请号：US11848229
申请日：2007-08-30
申请人： David C. Olson , Collin A. Rich
发明人： David C. Olson , Collin A. Rich
IPC分类号： G01J3/30
CPC分类号： G01J3/4338 , G01N21/645 , G01N2021/6419 , G01N2021/6421 , G01N2021/6441
摘要： The invention includes a system and a method for capturing multi source excitations from a single location on a flow channel. The system preferably includes a light subsystem that emits light onto a single location on a flow channel, a detector subsystem to detect light emitted from the single location on the flow channel, and a processor to separate the detected light. The method preferably includes emitting light onto a single location on a flow channel, detecting light emitted from the single location on the flow channel, and separating the detected light.
摘要翻译：本发明包括一种用于从流通道上的单个位置捕获多源兴奋的系统和方法。该系统优选地包括将光发射到流动通道上的单个位置的光子系统，用于检测从流动通道上的单个位置发射的光的检测器子系统以及用于分离检测到的光的处理器。该方法优选地包括将光发射到流动通道上的单个位置，检测从流动通道上的单个位置发射的光并分离检测到的光。

58. 发明申请

US20110273702A1 OPTICAL MEASURING METHOD AND SYSTEM 审中-公开
标题翻译：光学测量方法与系统
公开(公告)号：US20110273702A1
公开(公告)日：2011-11-10
申请号：US13145194
申请日：2010-01-20
申请人： Nicholas H. H. Jones , Nicholas J. Weston , Kevyn B. Jonas , Jonathan D. Shephard , Duncan P. Hand , Mateusz Matysiak
发明人： Nicholas H. H. Jones , Nicholas J. Weston , Kevyn B. Jonas , Jonathan D. Shephard , Duncan P. Hand , Mateusz Matysiak
IPC分类号： G01J3/30 , G01N21/88 , G01N21/27
CPC分类号： G01N21/8806 , G01N21/8422 , G01N21/95 , G01N21/9515
摘要： A detecting system for detecting flaws in a sample includes an illumination assembly and detecting assembly. The illumination assembly has an infra-red light source and illumination optics for directing a beam of light from the light source to a spot on or within a sample. The detection assembly has a detector for detecting light from an illuminated spot on or within a sample and detection optics for directing light from an illuminated spot on or within a sample to the detector. Such a system may be used for determining flaws in a sample such as a thermal barrier coating on a turbine blade, or a dental or other medical part. In particular the system may be used for determining flaws in a ceramic sample. A method for detecting flaws in a sample is further described.
摘要翻译：用于检测样本中的缺陷的检测系统包括照明组件和检测组件。照明组件具有红外光源和照明光学器件，用于将来自光源的光束引导到样品上或样品内的斑点。检测组件具有检测器，用于检测来自样本上或样品内的照明点的光，以及检测光学器件，用于将来自样品上的照射斑点的光引导到检测器。这样的系统可用于确定样品中的缺陷，例如涡轮叶片或牙科或其它医疗部件上的热障涂层。特别地，该系统可用于确定陶瓷样品中的缺陷。进一步描述用于检测样品中的缺陷的方法。

59. 发明申请

US20110267617A1 Second-Order Nonlinear Susceptibility of a Nanoparticle Using Coherent Confocal Microscopy 有权
标题翻译：使用相干共聚焦显微镜对纳米粒子的二阶非线性敏感性
公开(公告)号：US20110267617A1
公开(公告)日：2011-11-03
申请号：US13154014
申请日：2011-06-06
申请人： Paul Scott Carney , Kimani C. Toussaint , Brynmor J. Davis , Santosh Tripathi
发明人： Paul Scott Carney , Kimani C. Toussaint , Brynmor J. Davis , Santosh Tripathi
IPC分类号： G01N21/47 , G01J3/30
CPC分类号： G01N21/636 , G01N21/23 , G01N2021/4792 , G02B21/0056
摘要： A coherent confocal microscope and methods for measuring elements of the non-linear susceptibility of a nanoparticle, including, more particularly, all of the elements of the second-order susceptibility tensor of a single nanoparticle under permutation and Kleinman symmetry. Using a high numerical aperture lens, two-dimensional scanning and a vector beam shaper, the second-order nonlinear susceptibility is derived from a single confocal image. A forward model for the problem is presented and a computationally efficient data processing method robustly solves the inverse problem.
摘要翻译：一种相干共焦显微镜和用于测量纳米颗粒的非线性磁化率的元素的方法，更具体地，包括在排列和克莱曼对称下的单个纳米颗粒的二阶磁敏度张量的所有元素。使用高数值孔径透镜，二维扫描和矢量光束整形器，从单个共焦图像导出二阶非线性磁化率。提出了一个问题的前向模型，并且计算效率高的数据处理方法可以很好地解决逆问题。

60. 发明申请

US20110255085A1 SPECTROMETER, SPECTROMETRY, AND SPECTROMETRY PROGRAM 有权
标题翻译：光谱仪，光谱仪和光谱计划
公开(公告)号：US20110255085A1
公开(公告)日：2011-10-20
申请号：US13141152
申请日：2009-09-08
申请人： Motoyuki Watanabe , Kazuya Iguchi , Kengo Suzuki
发明人： Motoyuki Watanabe , Kazuya Iguchi , Kengo Suzuki
IPC分类号： G01J3/30
CPC分类号： G01N21/645 , G01J3/02 , G01J3/0262 , G01J3/0267 , G01J3/0291 , G01J3/4406 , G01J3/443 , G01N2201/0632 , G01N2201/065
摘要： A spectroscopic measurement apparatus 1A comprises an integrating sphere 20 in which a sample S is located, a spectroscopic analyzer 30 dispersing the light to be measured from the sample S and obtaining a wavelength spectrum, and a data analyzer 50. The analyzer 50 includes an object range setting section which sets a first object range corresponding to excitation light and a second object range corresponding to light emission from the sample S in a wavelength spectrum, and a sample information analyzing section which determines a luminescence quantum yield of the sample S, determines a measurement value Φ0 of the luminescence quantum yield from results of a reference measurement and a sample measurement, and determines, by using factors β, γ regarding stray light in the reference measurement, an analysis value Φ of the luminescence quantum yield with the effect of stray light reduced by Φ=βΦ0+γ. This realizes a spectroscopic measurement apparatus, a measurement method, and a measurement program which can reduce the effect of stray light generated in a spectrometer.
摘要翻译：分光测量装置1A包括其中位于样品S的积分球20，从样品S分散被测光并获得波长谱的光谱分析仪30和数据分析器50.分析器50包括物体范围设定部，其设定与激发光对应的第一对象范围和与波长光谱中的来自样品S的发光对应的第二对象范围，以及确定样品S的发光量子产率的样本信息分析部，通过参考测量和样品测量的结果，发光量子产率的测量值Φ0，并且通过使用参考测量中关于杂散光的因子＆bgr;γ来确定发光量子产率的分析值Φ，其效果为杂散光减少Φ=＆bgr;Φ0+γ。这实现了可以降低在光谱仪中产生的杂散光的影响的光谱测量装置，测量方法和测量程序。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式