会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 53. 发明授权
    • Vacuum processing method
    • 真空加工方法
    • US07331751B2
    • 2008-02-19
    • US10658291
    • 2003-09-10
    • Naoyuki Tamura
    • Naoyuki Tamura
    • B65H1/00C23F1/00H01L21/306C23C16/00
    • H01L21/67259C23C14/54C23C14/566C23C14/568H01L21/67155Y10S414/135Y10S414/136Y10S414/139
    • A vacuum processing method includes an atmospheric transfer step of transferring a wafer in atmospheric air to a vacuum transfer chamber using atmospheric transfer equipment disposed in atmospheric air, a vacuum transfer step of transferring the wafer received from the atmospheric transfer equipment to a position for a predetermined treatment within a vacuum processing chamber using vacuum transfer equipment disposed within the vacuum transfer chamber connecting the atmospheric transfer equipment and the vacuum processing chamber, a step of detecting the displacement of the wafer in a transverse direction with respect to a traveling direction near an ingress path of the wafer to the vacuum processing chamber by comparing a correct position of the wafer passing a line which is predetermined in advance with an actual position of said wafer being transferred by the vacuum transfer equipment, and a step of correcting the detected displacement of the wafer.
    • 一种真空处理方法,其特征在于,包括使用大气输送装置将大气中的晶片转移到真空输送室的大气转移步骤,将从大气压输送装置接收的晶片转移到预定的位置的真空转印工序; 使用设置在连接大气传送设备和真空处理室的真空传送室内的真空转移设备在真空处理室内进行处理;检测晶片相对于进入路径附近的行进方向在横向上的位移的步骤 通过将通过预先确定的线的晶片的正确位置与通过真空传输设备传送的所述晶片的实际位置进行比较来确定晶片的位置,以及校正检测到的晶片位移的步骤 。
    • 57. 发明授权
    • Work-piece processing system
    • 工件加工系统
    • US07246985B2
    • 2007-07-24
    • US10826419
    • 2004-04-16
    • Joseph Ferrara
    • Joseph Ferrara
    • H01L21/677
    • H01L21/67213H01L21/67201H01L21/67742H01L21/67745H01L21/67748H01L21/67778Y10S414/139
    • A transfer system for use with a tool for processing a work-piece at low or vacuum pressure such as an ion implanter for implanting silicon wafers. An enclosure defines a low pressure region for processing of work-pieces placed at a work-piece processing station within the low pressure region. A two tier multiple work-piece isolation load lock transfers work-pieces from a higher pressure region to the lower pressure for processing and back to said higher pressure subsequent to said processing. A first robot transfers work-pieces within the low pressure region from the load locks to a processing station within the low pressure region. Multiple other robots positioned outside the low pressure region transfers work-pieces to and from the two tier work-piece isolation load locks from a source of said work-pieces prior to processing and to a destination of said work-pieces after said processing.
    • 一种用于在低或真空压力下处理工件的工具的转移系统,例如用于注入硅晶片的离子注入机。 外壳限定用于处理放置在低压区域内的工件处理站的工件的低压区域。 两层多件工件隔离负载锁将工件从较高压力区域转移到较低压力以进行处理,并在所述处理之后转回所述较高压力。 第一机器人将低压区域内的工件从负载锁传送到低压区域内的处理站。 位于低压区域之外的多个其它机器人在处理之前将工件与来自所述工件的来源的两层工件隔离负载锁转移到所述工件的所述处理之后的所述工件的目的地。
    • 60. 发明授权
    • Load lock system for supercritical fluid cleaning
    • 超临界流体清洗装载锁系统
    • US07226512B2
    • 2007-06-05
    • US10465906
    • 2003-06-18
    • Michael A. FuryRobert W. Sherrill
    • Michael A. FuryRobert W. Sherrill
    • B08B5/04
    • H01L21/67167H01L21/67017H01L21/67201H01L21/67745Y10S134/902Y10S414/138Y10S414/139Y10S414/141
    • A substrate is transferred from an environment at about vacuum into a load lock through a first door. The substrate is then sealed within the load lock. The pressure within the load lock is raised to a high pressure above vacuum. A second door coupling the load lock to a high-pressure processing chamber is then opened and the substrate moved from the load lock into the high-pressure chamber. The substrate is then sealed within the high-pressure chamber. High-pressure processing, such as high pressure cleaning or high pressure deposition, is then performed on the substrate within the high-pressure chamber. Subsequently, the second door is opened and the substrate transferred into the load lock. The substrate is then sealed within the load lock. The pressure within the load lock is lowered to about vacuum and the first door opened. The substrate is then removed from the load lock into the environment.
    • 将基板从大约真空的环境转移到通过第一门的加载锁定中。 然后将衬底密封在装载锁中。 负载锁中的压力升高到高于真空的高压。 然后打开将负载锁耦合到高压处理室的第二扇门,并且衬底从负载锁移动到高压室中。 然后将衬底密封在高压室内。 然后在高压室内的基板上进行高压处理,例如高压清洗或高压沉积。 随后,打开第二扇门并将基板转移到装载锁中。 然后将衬底密封在装载锁中。 负载锁中的压力降低到大约真空,第一门打开。 然后将衬底从负载锁移除到环境中。