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51. 发明授权

US5045780A Electrical test probe contact tip 失效
标题翻译：电测探头接触尖端
公开(公告)号：US5045780A
公开(公告)日：1991-09-03
申请号：US445979
申请日：1989-12-04
申请人： Mark A. Swart
发明人： Mark A. Swart
IPC分类号： G01R1/067 , H05K3/00 , H05K13/08
CPC分类号： G01R1/06722
摘要： An electrical test probe comprises an outer barrel, and a plunger extending axially through the barrel and having an outer portion extending through an open end of the barrel and terminating in a contact tip outside the barrel for contact with a test point. The plunger is supported within the barrel by spring pressure for allowing spring biased relative axial motion between the plunger and the barrel. The plunger is rotatable about its axis during relative axial motion between the plunger and barrel against the bias of the spring so that rotation of the plunger causes enhanced contact between the probe and a test point on a circuit board under test. The contact tip comprises a head having a substantially continuous outer blade edge extending around a periphery of the head and positioned thereon to engage the test point on the board, and at least one further substantially continuous inner blade edge inside the outer blade edge and positioned preferably concentrically with respect to the outer blade edge also for contact with the test point on the board. The inner and outer blade edges are able to spin about the axis of the plunger during their contact with the test point without causing the plunger to bind in the barrel as the head is rotated during contact with an irregularly shaped test point on the board.

52. 发明授权

US4720275A Quick termination apparatus and method for electrical connector 失效
标题翻译：电连接器的快速终端设备和方法
公开(公告)号：US4720275A
公开(公告)日：1988-01-19
申请号：US851334
申请日：1986-04-14
申请人： Mark A. Swart , Charles J. Johnston
发明人： Mark A. Swart , Charles J. Johnston
IPC分类号： H01R4/16 , C02F1/467 , H01R4/70 , H01R11/18 , H01R43/04 , H01R13/62
CPC分类号： H01R11/18 , C02F1/4674 , H01R4/70 , Y10T29/49174
摘要： A quick termination assembly for an electrical connector to a flexible wire. The connector comprises an electrical conductive tube. The tube has separate end opening and side opening to the passage and a ramp facing out of and extending towards the side opening from the passage. The end opening and passage are adapted to receive a bare end of the wire upon insertion therein, the ramp, during such insertion, forcing the bare wire to bend and move along the ramp out of the side opening to a position extended away from the tube. A non-conductive sleeve extends around the wire. The sleeve, as it is forced to slide along the wire and tube, engages the extended bare wire, causing the bare wire to bend against an exterior side of the tube and pass over and encircle the bare wire and tube, thereby gripping and retaining the bare wire and tube in electrical and mechanical contact with each other.
摘要翻译：用于电连接器到柔性线的快速端接组件。连接器包括导电管。该管具有分开的端部开口和通向该通道的侧面开口以及从通道朝向侧面开口的斜面。端部开口和通道适于在插入时容纳线的裸露端，斜槽在插入期间迫使裸线弯曲并沿着斜面从侧开口移出到远离管延伸的位置。非导电套筒围绕电线延伸。当被迫沿着电线和管子滑动时，套筒与扩展的裸线接合，导致裸线弯曲抵靠管的外侧，并且越过并围绕裸线和管，从而夹紧并保持裸电线和管子彼此电气和机械接触。

53. 发明授权

US08105119B2 Flat plunger round barrel test probe 有权
标题翻译：圆柱塞圆筒测试探头
公开(公告)号：US08105119B2
公开(公告)日：2012-01-31
申请号：US12683346
申请日：2010-01-06
申请人： Mark A. Swart , Steve B. Sargeant , Charles J. Johnston
发明人： Mark A. Swart , Steve B. Sargeant , Charles J. Johnston
IPC分类号： H01R11/22
CPC分类号： G01R1/06722 , G01R1/06738
摘要： A spring probe utilizing a flat plunger and a round barrel having a compression spring positioned within the barrel and a wiper for internal contact between the plunger and the inside of the barrel.
摘要翻译：使用扁平柱塞的弹簧探针和具有位于筒内的压缩弹簧的圆筒和用于柱塞与筒体内部之间内部接触的擦拭器。

54. 发明授权

US07071716B2 Apparatus for scan testing printed circuit boards 失效
公开(公告)号：US07071716B2
公开(公告)日：2006-07-04
申请号：US10897182
申请日：2004-07-22
申请人： Mark A. Swart
发明人： Mark A. Swart
IPC分类号： G01R31/02 , G01R31/28
CPC分类号： G01R31/2805 , G01R31/2808
摘要： A scan test apparatus having at least an upper layer of conductive and compliant material and may include a lower layer of conductive and compliant material sized to cover the upper and lower surfaces of the printed circuit board to be tested. Electrical current is introduced into the conductive layers which shorts out the circuits on the printed circuit board. An electrical contactor is positioned on either side of the conductive layers on both sides of the printed circuit board. The printed circuit board is passed through the upper and lower conductive layers and the contactors by rollers positioned on each end of the scan test machine. The contactor sends a test signal from the circuit board to measurement electronics. Other embodiments include the shorting matrix to be movable and the printed circuit board being fixed and include non-contact sensors or arrays of electrical contactors.

55. 发明授权

US06204680B1 Test socket 失效
标题翻译：测试插座
公开(公告)号：US06204680B1
公开(公告)日：2001-03-20
申请号：US09139543
申请日：1998-08-25
申请人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther , Steve B. Sargeant , Roy W. Green
发明人： Mark A. Swart , Charles J. Johnston , Gordon A. Vinther , Steve B. Sargeant , Roy W. Green
IPC分类号： G01R3102
CPC分类号： G01R1/06722 , G01R1/0483
摘要： A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A nonconductive pushrod is positioned between the spring and a beveled edge of the plunger and a nonconductive cap is positioned above the load board for high frequency test signals. For closely spaced test sites a thinner daughter board is electrically connected to the load board through a hole in the load board. The test socket is then positioned on the daughter board.
摘要翻译：一种用于集成电路封装的测试插座，其具有分别固定到负载板的顶表面和底表面的上壳体和下壳体。上壳体具有用于接收集成电路封装的空腔，并且在上壳体的基部中包括孔，以允许多个实心插座柱塞接触集成电路封装上的测试位置。插座柱塞定位在形成在下壳体中的多个通道内并且延伸穿过负载板中的多个孔以接触测试位置。多个弹簧定位在下壳体的通道内，位于插座柱塞下方，以提供弹簧力，以将插座柱塞向上朝向集成电路封装偏置。非导电推杆位于弹簧和柱塞的斜边之间，并且非导电帽位于负载板上方以用于高频测试信号。对于紧密间隔的测试位置，较薄的子板通过负载板上的孔与负载板电连接。然后将测试插座定位在子板上。

56. 发明授权

US6051978A TDR tester for x-y prober 失效
标题翻译： TDR测试仪用于x-y探测器
公开(公告)号：US6051978A
公开(公告)日：2000-04-18
申请号：US66962
申请日：1998-04-27
申请人： Mark A. Swart
发明人： Mark A. Swart
IPC分类号： G01R31/28 , G01R1/06 , G01R27/04 , G01R31/02 , G01R31/11 , H05K3/00
CPC分类号： G01R31/2801 , G01R31/11
摘要： A printed circuit board tester for testing matched impedance test sites on a printed circuit board comprising an x-y prober having a first prober head and a second prober head above the printed circuit board connected to a time domain reflectometer by a coaxial test cable. A signal probe is attached to one of the prober heads. The test cable includes a signal wire which is electrically connected to the signal probe and includes a ground shield electrically connected to a ground shield extender positioned around the signal probe. A separate ground probe is connected to the second prober head and includes a ground spring for temporarily contacting the ground shield extender to transmit ground signals to the ground shield of the test cable.
摘要翻译：一种用于在印刷电路板上测试匹配的阻抗测试点的印刷电路板测试器，包括具有第一探针头和印刷电路板上方的第二探针头的x-y探针，所述第二探针头通过同轴测试电缆连接到时域反射计。信号探针连接到其中一个探测头。测试电缆包括电连接到信号探针的信号线，并且包括电连接到位于信号探针周围的接地屏蔽延长器的接地屏蔽层。单独的接地探针连接到第二探测头，并包括接地弹簧，用于临时接触接地屏蔽延长器，以将接地信号传输到测试电缆的接地屏蔽。

57. 发明授权

US5729146A Quick stacking translator fixture 失效
标题翻译：快速堆垛机
公开(公告)号：US5729146A
公开(公告)日：1998-03-17
申请号：US531720
申请日：1995-09-21
申请人： Mark A. Swart
发明人： Mark A. Swart
IPC分类号： G01R1/073 , G01R31/02
CPC分类号： G01R1/07378 , G01R31/2808
摘要： A quick stacking translator fixture for a printed circuit board tester has a pattern of test probes on a base upon which the translator fixture is mounted. The translator fixture comprises a plurality of essentially parallel and vertically spaced apart rigid translator plates having selected patterns of aligned holes for positioning translator pins for contacting test points on a printed circuit board supported at one end of the translator fixture. The translator pins translate electrical test signals between the test points on the printed circuit board and the test probes on the base of the tester. The translator fixture includes a plurality of translator plate stacking towers of identical construction supporting the translator plates in their fixed positions in the translator fixture. Each stacking tower comprises a rigid support member formed as an integral piece having vertically spaced apart translator plate support surfaces with corresponding recessed upright alignment posts at spaced apart levels of the stacking tower. The translator plate support surfaces and their corresponding alignment posts having respective diameters at each level which are progressively shorter along the length of the tower to define a stair-step arrangement. The translator plates are assembled onto the stacking towers at predetermined levels in a progressive stacking sequence, so that each translator plate is supported by a corresponding translator plate support surface and retained thereon in a fixed position by engagement with the related alignment post.
摘要翻译：用于印刷电路板测试仪的快速堆叠翻译器夹具具有安装转换器夹具的底座上的测试探针的图案。翻译器夹具包括多个基本平行和垂直间隔开的刚性平移板，其具有对准的孔的选定图案，用于定位用于接触位于平移器固定装置的一端的印刷电路板上的测试点的平移销。翻译器引脚在印刷电路板上的测试点和测试仪基座上的测试探针之间转换电气测试信号。翻译器夹具包括多个具有相同构造的翻译板堆叠塔，其在翻译器固定装置中将翻译板支撑在固定位置。每个堆叠塔包括刚性支撑构件，该刚性支撑构件形成为具有垂直间隔开的平移板支撑表面的整体构件，其具有在层叠塔的间隔开的水平面处的相应的凹入的直立对准柱。平移板支撑表面及其对应的对准柱在每个水平面具有相应的直径，其沿着塔的长度逐渐变短，以限定楼梯台阶布置。翻译板以逐级堆叠顺序以预定级别组装到堆叠塔上，使得每个平移板由相应的平移板支撑表面支撑，并通过与相关对准柱的接合而保持在固定位置。

58. 发明授权

US5447442A Compliant electrical connectors 失效
标题翻译：符合电气连接器
公开(公告)号：US5447442A
公开(公告)日：1995-09-05
申请号：US126179
申请日：1993-09-23
申请人： Mark A. Swart
发明人： Mark A. Swart
IPC分类号： G01R1/073 , G01R31/26 , H01R11/00 , H01R11/18 , H01R13/24 , H01R9/09
CPC分类号： H01R13/2471 , G01R1/07307 , G01R1/07314 , H01R11/18 , H01R12/714 , H01R12/62
摘要： A compliant electrical connector includes a housing, a flexible diaphragm contained in the housing providing independent spring biased pressure contact for movable solid metal contact pins mounted in the housing, and separate electrical leads in the housing for making electrical contact with the movable contact pins and providing terminals for transmitting electrical signals from the contact pins to the exterior of the housing for surface mount contact with corresponding electrical circuits in an external electric/electronic device. In one embodiment, the contact pins are electrically connected internally to separate circuit traces on a flex circuit extending to the outside of the connector housing. The contact pins can be connected directly to the flex circuit, or the housing can contain separate conductive barrels for sliding contact with the contact pins, in which the barrels are electrically connected to the circuit traces. The contact pins can be connected to the flex circuit directly through separate flexible fingers contained on the flex circuit to move with corresponding travel of the contact pins. In a further embodiment, the flexible diaphragm can be replaced with separate compression springs contained in electrically isolated cavities and biased into direct spring contact with the contact pins.
摘要翻译：兼容的电连接器包括壳体，容纳在壳体中的柔性膜片，为安装在壳体中的可移动固体金属触针提供独立的弹簧偏置压力接触，并且壳体中的独立电引线用于与可动触针接触并提供用于将电信号从接触销传送到壳体外部的端子，用于与外部电气/电子设备中的对应电路表面安装接触。在一个实施例中，接触针在内部电连接以在延伸到连接器壳体外部的柔性电路上分离电路迹线。接触引脚可以直接连接到柔性电路，或者外壳可以包含用于与接触销滑动接触的单独的导电套筒，其中导管与电路迹线电连接。接触销可以通过包含在柔性电路上的单独的柔性指状件直接连接到柔性电路，以便通过接触销的相应行程移动。在另一个实施例中，柔性隔膜可以被包含在电隔离空腔中并被偏压成与接触销直接弹簧接触的分开的压缩弹簧代替。

59. 发明授权

US5444387A Test module hanger for test fixtures 失效
标题翻译：用于测试夹具的测试模块挂钩
公开(公告)号：US5444387A
公开(公告)日：1995-08-22
申请号：US196588
申请日：1994-02-10
申请人： David R. Van Loan , Charles J. Johnston , Mark A. Swart
发明人： David R. Van Loan , Charles J. Johnston , Mark A. Swart
IPC分类号： G01R1/04 , G01R31/316 , G01R31/00
CPC分类号： G01R1/0425 , G01R31/316
摘要： Integrated circuit (IC) packages mounted on a loaded printed circuit board (PCB) are tested by a translator module by first placing a corresponding module over each package. Each module has rows of spring contacts for releasably contacting corresponding electrical leads adjacent opposite sides of the IC package. An upper surface of the module has an array of electrically conductive test pads internally connected to corresponding contacts on the module. The test pads match an array of spring probes in the test unit. The module can be a molded plastic housing with metal leaf spring contacts, or it can comprise a composite flex-circuit material with individual contacts comprising flexible spring-like metalized plastic fingers. Contacts on the test module can releasably engage the leads on the IC package directly, or they can contact separate conductive leads on the PCB adjacent the leads on the IC package. During testing, the spring probes contact the test pads on the test modules and circuit continuity is established via the electrical connections from the spring probes through the modules to the leads adjacent the IC packages. The modules translate dense in-line spacing of leads adjacent the IC packages to the oversized in-line spacing of test pads on the module. In another embodiment, the translator module is attached to a flex-circuit cable coupled to the test system electronics. The translator module is manually placed over each IC package during testing. In a further embodiment, an integrated circuit package contains a built-in test verifier system so that standard test probes can be used to test the package without use of a separate translator module.
摘要翻译：安装在加载印刷电路板（PCB）上的集成电路（IC）封装由转换器模块测试，首先在每个封装上放置相应的模块。每个模块具有一排弹簧触点，用于可释放地接触与IC封装相对侧相对应的电引线。模块的上表面具有内部连接到模块上的相应触点的导电测试焊盘阵列。测试垫与测试单元中的一组弹簧探针相匹配。模块可以是具有金属板弹簧触点的模制塑料壳体，或者其可以包括具有包括柔性弹簧状金属化塑料指状物的单独触头的复合柔性电路材料。测试模块上的触点可以直接可释放地接合IC封装上的引线，或者它们可以接触与IC封装上引线相邻的PCB上分开的导电引线。在测试期间，弹簧探头接触测试模块上的测试焊盘，并通过从弹簧探头通过模块到邻近IC封装的引线的电气连接建立电路连续性。这些模块将紧邻IC封装的引线的密集在线间距转换为模块上测试焊盘的过大的在线间距。在另一个实施例中，翻译器模块连接到耦合到测试系统电子装置的柔性电路电缆。翻译器模块在测试期间手动放置在每个IC封装上。在另一实施例中，集成电路封装包含内置的测试验证器系统，使得可以使用标准测试探针来测试封装而不使用单独的转换器模块。

60. 发明授权

US5422575A Test fixture with adjustable bearings and optical alignment system 失效
标题翻译：带可调节轴承和光学对准系统的测试夹具
公开(公告)号：US5422575A
公开(公告)日：1995-06-06
申请号：US224006
申请日：1994-04-05
申请人： Mary E. Ferrer , Gary F. St. Onge , Charles J. Johnston , Mark A. Swart
发明人： Mary E. Ferrer , Gary F. St. Onge , Charles J. Johnston , Mark A. Swart
IPC分类号： G01R31/02 , G01R1/073 , G01R31/28
CPC分类号： G01R1/07328
摘要： A test fixture for testing circuit boards has a vacuum chamber between a stationary probe plate and a movable top plate. Separate adjustable linear bearings located in quadrants of the fixture provide parallel alignment between the top plate and the probe plate. A continuous vacuum seal between the probe plate and top plate bypasses the bearings so the bearings are outside the vacuum area. Spring loaded test probes in the probe plate extend through holes in the top plate for access to a circuit board under test. The probes contact the board when the top plate moves down toward the probes under a vacuum. The top plate is secured to the probe plate by separate quick-release latch pins extending through the linear bearings. The moving top plate carries fixed tooling pins for mounting the board to the top plate. Movable bearing blocks support the bearings. The top plate is movable for aligning the board with the test probes. The top plate, latch pins, bearings and bearing blocks are movable as a unit relative to the probe plate. After the top plate is aligned with the probes to compensate for art shift among circuit board lots, the quick-release latches are engaged to retain the alignment. The latches are part of a guide post assembly for guiding vertical travel of the top plate during vacuum cycling of the test fixture. An optical alignment system in combination with the movable bearings provides a quick and easy means of aligning the board and the probes with extremely high accuracy.
摘要翻译：用于测试电路板的测试夹具在固定探针板和可移动顶板之间具有真空室。位于夹具象限中的可分离的可调直线轴承提供顶板和探针板之间的平行对准。探头板和顶板之间的连续真空密封件绕过轴承，因此轴承位于真空区域之外。探针板中的弹簧加载的测试探针延伸穿过顶板中的孔，用于进入被测电路板。当顶板在真空下向下移动探针时，探针接触板。顶板通过延伸穿过直线轴承的单独的快速释放闩锁销固定到探针板上。移动的顶板承载用于将板安装到顶板的固定工具销。可移动轴承座支撑轴承。顶板可移动以使板与测试探针对准。顶板，闩锁销，轴承和轴承座可作为相对于探针板的单元移动。在顶板与探针对准以补偿电路板批次之间的技术偏移之后，快速释放闩锁被接合以保持对准。闩锁是用于在测试夹具的真空循环期间引导顶板的垂直行进的引导柱组件的一部分。与可移动轴承结合的光学对准系统提供了一种快速且简便的方法，可以极高的精度对准电路板和探头。

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