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    • 42. 发明授权
    • Gate metal routing for transistor with checkerboarded layout
    • 晶体管的栅极金属布线,具有棋盘布局
    • US07732860B2
    • 2010-06-08
    • US12291569
    • 2008-11-12
    • Vijay Parthasarathy
    • Vijay Parthasarathy
    • H01L29/78
    • H01L29/7813H01L21/77H01L29/0696H01L29/0878H01L29/407H01L29/41741H01L29/4236H01L29/42372H01L29/4238
    • In one embodiment, a transistor fabricated on a semiconductor die is arranged into sections of elongated transistor segments. The sections are arranged in rows and columns substantially across the semiconductor die. Adjacent sections in a row or a column are oriented such that the length of the transistor segments in a first one of the adjacent sections extends in a first direction, and the length of the transistor segments in a second one of the adjacent sections extends in a second direction, the first direction being substantially orthogonal to the second direction. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure.
    • 在一个实施例中,制造在半导体管芯上的晶体管被​​布置成细长晶体管段的部分。 这些部分基本上跨越半导体管芯排列成行和列。 一行或一列的相邻部分定向成使得相邻部分中的第一个部分中的晶体管段的长度在第一方向上延伸,并且相邻部分中的第二个中的晶体管段的长度在 第二方向,第一方向基本上与第二方向正交。 要强调的是,该摘要被提供以符合要求抽象的规则,允许搜索者或其他读者快速确定技术公开内容的主题。
    • 43. 发明申请
    • High-voltage vertical transistor with a varied width silicon pillar
    • 具有不同宽度硅柱的高压立式晶体管
    • US20100065903A1
    • 2010-03-18
    • US12284086
    • 2008-09-18
    • Vijay ParthasarathySujit BanerjeeLin Zhu
    • Vijay ParthasarathySujit BanerjeeLin Zhu
    • H01L47/00
    • H01L29/7802H01L29/0657H01L29/0696H01L29/407H01L29/4238H01L29/7397H01L29/7813H01L29/872
    • In one embodiment, a vertical HVFET includes a pillar of semiconductor material a pillar of semiconductor material arranged in a loop layout having at least two substantially parallel and substantially linear fillet sections each having a first width, and at least two rounded sections, the rounded sections having a second width narrower than the first width, a source region of a first conductivity type being disposed at or near a top surface of the pillar, and a body region of a second conductivity type being disposed in the pillar beneath the source region. First and second dielectric regions are respectively disposed on opposite sides of the pillar, the first dielectric region being laterally surrounded by the pillar, and the second dielectric region laterally surrounding the pillar. First and second field plates are respectively disposed in the first and second dielectric regions.
    • 在一个实施例中,垂直HVFET包括半导体材料的柱状半导体材料的柱,其布置成具有至少两个具有第一宽度的至少两个基本上平行且基本上线性的圆角部分的环形布局,以及至少两个圆形部分, 具有比第一宽度窄的第二宽度,第一导电类型的源极区域设置在柱的顶表面处或附近,并且第二导电类型的主体区域设置在源极区域下方的柱中。 第一和第二电介质区域分别设置在柱的相对侧上,第一介质区域被柱侧向包围,第二介质区域横向围绕柱。 第一和第二场板分别设置在第一和第二电介质区域中。
    • 44. 发明申请
    • High-voltage vertical transistor structure
    • 高压立式晶体管结构
    • US20090315105A1
    • 2009-12-24
    • US12583745
    • 2009-08-25
    • Vijay ParthasarathyMartin H. Manley
    • Vijay ParthasarathyMartin H. Manley
    • H01L29/78
    • H01L29/7813H01L21/77H01L29/0696H01L29/0878H01L29/407H01L29/41741H01L29/4236H01L29/42368H01L29/42372H01L29/4238H01L29/7811H01L2924/13055H01L2924/19043
    • In one embodiment, a transistor includes a pillar of semiconductor material arranged in a racetrack-shaped layout having a substantially linear section that extends in a first lateral direction and rounded sections at each end of the substantially linear section. First and second dielectric regions are disposed on opposite sides of the pillar. First and second field plates are respectively disposed in the first and second dielectric regions. First and second gate members respectively disposed in the first and second dielectric regions are separated from the pillar by a gate oxide having a first thickness in the substantially linear section. The gate oxide being substantially thicker at the rounded sections. It is emphasized that this abstract is provided to comply with the rules requiring an abstract that will allow a searcher or other reader to quickly ascertain the subject matter of the technical disclosure.
    • 在一个实施例中,晶体管包括以跑道形布置布置的半导体材料柱,其具有在第一横向方向上延伸的基本上线性的部分,并且在基本线性部分的每个端部处具有圆形部分。 第一和第二电介质区域设置在柱的相对侧上。 第一和第二场板分别设置在第一和第二电介质区域中。 分别设置在第一和第二电介质区域中的第一和第二栅极部件通过在基本线性部分中具有第一厚度的栅极氧化物与柱分离。 栅极氧化物在圆形部分处基本上更厚。 要强调的是,该摘要被提供以符合要求抽象的规则,允许搜索者或其他读者快速确定技术公开内容的主题。
    • 46. 发明申请
    • Process insensitive ESD protection device
    • 过程不敏感的ESD保护装置
    • US20060202265A1
    • 2006-09-14
    • US11078026
    • 2005-03-11
    • Hongzhong XuRichard IdaVijay Parthasarathy
    • Hongzhong XuRichard IdaVijay Parthasarathy
    • H01L29/76
    • H01L29/0847H01L27/0266H01L29/1045H01L29/1083H01L29/7835
    • Methods and apparatus for ESD protection of LDMOS devices are provided. The apparatus comprises two LDMOS devices, with source, drain and gate contacts parallel coupled. One is the protected device and the other is the protecting device. Each has source region, drain region, gate, first body well region containing the source, second body well region containing the drain and separated from the first body well region by a drift region, an isolation region separated from the first and second body well regions and a buried layer contacting the isolation region. The protecting device has a further region of the same type as the drain, coupling the drain to the isolation region. Its drain connection is made via a contact to its isolation region rather than its drain region. The drift region of the protecting device is desirably smaller and the isolation-body well separation larger than for the protected device.
    • 提供了LDMOS器件的ESD保护方法和设备。 该装置包括两个LDMOS器件,源极,漏极和栅极触点并联耦合。 一个是受保护的设备,另一个是保护设备。 每个具有源极区,漏极区,栅极,包含源极的第一体阱区域,含有漏极的第二体阱区域和通过漂移区域与第一体阱区域分离的隔离区域,与第一和第二体阱区域分离的隔离区域 以及与隔离区域接触的掩埋层。 保护装置具有与漏极相同类型的另一区域,将漏极耦合到隔离区域。 其漏极连接通过与其隔离区而不是漏极区的接触进行。 保护装置的漂移区域希望更小,并且隔离体阱分离比对于受保护的装置大。