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    • 43. 发明申请
    • Devices using addressable magnetic tunnel junction array to detect magnetic particles
    • 使用可寻址磁隧道结阵列检测磁性颗粒的装置
    • US20090186770A1
    • 2009-07-23
    • US12009366
    • 2008-01-18
    • Xizeng ShiPokang WangHsu Kai Yang
    • Xizeng ShiPokang WangHsu Kai Yang
    • C40B20/08C40B60/10
    • G01R33/098G01R33/1269Y10S436/806
    • A magnetic sensor for identifying small superparamagnetic particles bonded to a substrate contains a regular orthogonal array of MTJ cells formed beneath that substrate. A magnetic field imposed on the particle, perpendicular to the substrate, induces a magnetic field that has a component within the MTJ cells that is along the plane of the MTJ free layer. If that free layer has a low switching threshold, the induced field of the particle will create resistance changes in a group of MTJ cells that lie beneath it. These resistance changes will be distributed in a characteristic formation or signature that will indicate the presence of the particle. If the particle's field is insufficient to produce the free layer switching, then a biasing field can be added in the direction of the hard axis and the combination of this field and the induced field allows the presence of the particle to be determined.
    • 用于识别结合到衬底的小超顺磁性颗粒的磁传感器包含在该衬底下面形成的MTJ电池的规则正交阵列。 垂直于衬底施加在颗粒上的磁场诱导磁场,该磁场在MTJ单元内具有沿着MTJ自由层的平面的分量。 如果自由层具有低切换阈值,则颗粒的感应场将在其下面的一组MTJ细胞中产生电阻变化。 这些电阻变化将分布在表征粒子存在的特征形成或特征中。 如果粒子的场不足以产生自由层切换,则可以在硬轴的方向上添加偏置场,并且该场与感应场的组合允许确定粒子的存在。
    • 44. 发明申请
    • Reference cell scheme for MRAM
    • MRAM参考单元方案
    • US20080094884A1
    • 2008-04-24
    • US12002161
    • 2007-12-14
    • Hsu YangPo-Kang WangXizeng Shi
    • Hsu YangPo-Kang WangXizeng Shi
    • G11C11/00
    • G11C7/14G11C11/16
    • An MRAM reference cell sub-array provides a mid-point reference current to sense amplifiers. The MRAM reference cell sub-array has MRAM cells arranged in rows and columns. Bit lines are associated with each column of the sub-array. A coupling connects the bit lines of pairs of the columns together at a location proximally to the sense amplifiers. The MRAM cells of a first of the pair of columns are programmed to a first magneto-resistive state and the MRAM cells of a second of the pair of columns are programmed to a second magneto-resistive state. When one row of data MRAM cells is selected for reading, a row of paired MRAM reference cells are placed in parallel to generate the mid-point reference current for sensing. The MRAM reference sub-array may be programmed electrically or aided by a magnetic field. A method for verifying programming of the MRAM reference sub-array is discussed.
    • MRAM参考单元子阵列提供了一个中点参考电流来检测放大器。 MRAM参考单元子阵列具有以行和列排列的MRAM单元。 位线与子阵列的每一列相关联。 耦合将位列对的位线连接到读出放大器的近端位置。 一对列中的第一列的MRAM单元被编程为第一磁阻状态,并且该对列中的第二对的MRAM单元被编程为第二磁阻状态。 当选择一行数据MRAM单元进行读取时,并行放置一对配对的MRAM参考单元,以生成用于检测的中点参考电流。 MRAM参考子阵列可以被电场编程或由磁场辅助。 讨论了一种用于验证MRAM参考子阵列的编程的方法。
    • 46. 发明申请
    • Reference cell scheme for MRAM
    • MRAM参考单元方案
    • US20070115717A1
    • 2007-05-24
    • US11284299
    • 2005-11-21
    • Hsu YangPo-Kang WangXizeng Shi
    • Hsu YangPo-Kang WangXizeng Shi
    • G11C11/14
    • G11C7/14G11C11/16
    • An MRAM reference cell sub-array provides a mid-point reference current to sense amplifiers. The MRAM reference cell sub-array has MRAM cells arranged in rows and columns. Bit lines are associated with each column of the sub-array. A coupling connects the bit lines of pairs of the columns together at a location proximally to the sense amplifiers. The MRAM cells of a first of the pair of columns are programmed to a first magneto-resistive state and the MRAM cells of a second of the pair of columns are programmed to a second magneto-resistive state. When one row of data MRAM cells is selected for reading, a row of paired MRAM reference cells are placed in parallel to generate the mid-point reference current for sensing. The MRAM reference sub-array may be programmed electrically or aided by a magnetic field. A method for verifying programming of the MRAM reference sub-array is discussed.
    • MRAM参考单元子阵列提供了一个中点参考电流来检测放大器。 MRAM参考单元子阵列具有以行和列排列的MRAM单元。 位线与子阵列的每一列相关联。 耦合将位列对的位线连接到读出放大器的近端位置。 一对列中的第一列的MRAM单元被编程为第一磁阻状态,并且该对列中的第二对的MRAM单元被编程为第二磁阻状态。 当选择一行数据MRAM单元进行读取时,并行放置一对配对的MRAM参考单元,以生成用于检测的中点参考电流。 MRAM参考子阵列可以被电场编程或由磁场辅助。 讨论了一种用于验证MRAM参考子阵列的编程的方法。
    • 49. 发明授权
    • Shielded magnetic ram cells
    • 屏蔽磁性柱塞电池
    • US06888184B1
    • 2005-05-03
    • US10074394
    • 2002-02-11
    • Xizeng ShiMatthew GibbonsHua-Ching TongKyusik Sin
    • Xizeng ShiMatthew GibbonsHua-Ching TongKyusik Sin
    • G11C11/16H01L21/336H01L27/22
    • G11C11/16H01L27/222
    • A magnetic memory fabricated on a semiconductor substrate is disclosed. The method and system include a plurality of magnetic tunneling junctions and a plurality of shields for magnetically shielding the plurality of magnetic tunneling junctions. Each of the plurality of magnetic tunneling junctions includes a first ferromagnetic layer, a second ferromagnetic layer and an insulating layer between the first ferromagnetic layer and the second ferromagnetic layer. At least a portion of the plurality of shields have a high moment and a high permeability and are conductive. The plurality of shields are electrically isolated from the plurality of magnetic tunneling junctions. The plurality of magnetic tunneling junctions are between the plurality of shields.
    • 公开了一种在半导体衬底上制造的磁存储器。 该方法和系统包括多个磁性隧道结和用于磁屏蔽多个磁性隧道结的多个屏蔽。 多个磁隧道结中的每一个包括第一铁磁层,第二铁磁层和第一铁磁层与第二铁磁层之间的绝缘层。 多个屏蔽件的至少一部分具有高的力矩和高的磁导率并且是导电的。 多个屏蔽件与多个磁性隧道结电隔离。 多个磁隧道结在多个屏蔽之间。