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    • 31. 发明授权
    • Buffer device with dual supply voltage for low supply voltage applications
    • 用于低电源电压应用的双电源电压缓冲器件
    • US06320361B2
    • 2001-11-20
    • US09736984
    • 2000-12-13
    • Vincenzo DimaLorenzo BedaridaAntonino GeraciSimone Bartoli
    • Vincenzo DimaLorenzo BedaridaAntonino GeraciSimone Bartoli
    • G05F140
    • G05F3/242
    • An output buffer device having first and second supply voltage references, the first voltage reference being lower in value than the second voltage reference. The output buffer device includes first and second complementary MOS transistors, which transistors are connected in series together between one of the supply voltage references and a further voltage reference, have gate terminals connected together and to an input terminal of this buffer device, and have drain terminals connected together and to an output terminal of the buffer device. Advantageously, the first transistor is connected to the first supply voltage reference. Furthermore, the output buffer device comprises at least one additional drive MOS transistor of the same type as the first MOS transistor and placed between the second supply voltage reference and the output terminal of the buffer device.
    • 一种具有第一和第二电源电压基准的输出缓冲器装置,该第一参考电压值低于第二电压基准。 输出缓冲器件包括第一和第二互补MOS晶体管,这些晶体管串联连接在一个电源电压基准和另一个电压基准之间,栅极端子连接在一起并连接到该缓冲器件的输入端,并且具有漏极 连接在一起的端子和缓冲器的输出端子。 有利地,第一晶体管连接到第一电源电压基准。 此外,输出缓冲器件包括与第一MOS晶体管相同类型的至少一个额外的驱动MOS晶体管,并且放置在第二电源电压基准和缓冲器件的输出端之间。
    • 34. 发明申请
    • Compensated current offset in a sensing circuit
    • 感测电路中的补偿电流偏移
    • US20080170455A1
    • 2008-07-17
    • US11652742
    • 2007-01-12
    • Lorenzo BedaridaGabriele PelliSimone BartoliMauro Chinosi
    • Lorenzo BedaridaGabriele PelliSimone BartoliMauro Chinosi
    • G11C7/08
    • G11C7/062G11C7/02G11C7/067G11C16/26G11C2207/063
    • A sensing circuit with current offset functionality. In one embodiment, the sensing circuit includes a memory circuit having a first offset circuit operative to offset a first current. The sensing circuit also includes a reference circuit coupled to the memory circuit, where the reference circuit includes a second offset circuit operative to offset a second current. The sensing circuit also includes a compare circuit coupled to the memory circuit and the reference circuit, where the compare circuit determines the state of a memory cell based on first current and the second current. According to the system disclosed herein, the first and second offset circuits optimize the performance of the sensing circuit and prevent errors when determining the state of the memory cell.
    • 具有电流偏移功能的感测电路。 在一个实施例中,感测电路包括存储器电路,该存储器电路具有可操作以偏移第一电流的第一偏移电路。 感测电路还包括耦合到存储器电路的参考电路,其中参考电路包括可操作以偏移第二电流的第二偏移电路。 感测电路还包括耦合到存储器电路和参考电路的比较电路,其中比较电路基于第一电流和第二电流确定存储器单元的状态。 根据本文公开的系统,第一和第二偏移电路优化感测电路的性能并且在确定存储器单元的状态时防止错误。
    • 39. 发明授权
    • Non-volatile memory device with burst mode reading and corresponding reading method
    • 具有突发模式读取的非易失性存储器件和相应的读取方法
    • US06854040B1
    • 2005-02-08
    • US09717938
    • 2000-11-21
    • Simone BartoliAntonino GeraciMauro SaliLorenzo Bedarida
    • Simone BartoliAntonino GeraciMauro SaliLorenzo Bedarida
    • G11C7/10G06F12/00G06F13/28G11C8/04
    • G11C7/1072G11C7/1033G11C7/1045
    • A read control circuit and a reading method for an electronic memory device integrated on a semiconductor includes a non-volatile memory matrix with associated row and column decoders connected to respective outputs of an address counter. An address transition detect (ATD) circuit detects an input transition as the memory device is being accessed, and read amplifiers and attendant registers transfer the data read from the memory matrix to the output. The read control circuit includes a detection circuit to which is input a clock signal and a logic signal to enable reading in the burst mode. A burst read mode control logic circuit is connected downstream of the detection circuit. The method includes accessing the memory matrix in a random read mode, detecting a request for access in the burst read mode, and executing the parallel reading of a plurality of memory words during a single period of time clocked by the clock signal.
    • 集成在半导体上的电子存储装置的读取控制电路和读取方法包括具有连接到地址计数器的相应输出的相关联的行和列解码器的非易失性存储器矩阵。 地址转换检测(ATD)电路在正在访问存储器件时检测输入转换,并且读取放大​​器和伴随寄存器将从存储器矩阵读取的数据传送到输出。 读取控制电路包括检测电路,在该检测电路中输入时钟信号和逻辑信号,使得能够以突发模式进行读取。 突发读模式控制逻辑电路连接在检测电路的下游。 该方法包括以随机读取模式访问存储器矩阵,以突发读取模式检测访问请求,以及在由时钟信号计时的单个时间段内执行多个存储器字的并行读取。
    • 40. 发明授权
    • Sectored semiconductor memory device with configurable memory sector addresses
    • 具有可配置存储器扇区地址的扇区半导体存储器件
    • US06401164B1
    • 2002-06-04
    • US09159322
    • 1998-09-23
    • Simone BartoliVincenzo DimaMauro Luigi Sali
    • Simone BartoliVincenzo DimaMauro Luigi Sali
    • G06F1206
    • G11C8/12G11C16/08
    • A memory device comprises a plurality of independent memory sectors, external address signal inputs for receiving external address signals that address individual memory locations of the memory device, the external address signals including external memory sector address signals allowing for individually addressing each memory sector, and a memory sector selection circuit for selecting one of the plurality of memory sectors according to a value of the external memory sector address signals. A first and a second alternative internal memory sector address signal paths are provided for supplying the external memory sector address signals to the memory sector selection circuit, the first path providing no logic inversion and the second path providing logic inversion. A programmable circuit activates either one or the other of the first and second internal memory sector address signal paths, so that a position of each memory sector in a space of values (00000h-3FFFFh) of the external address signals can be changed by activating either one or the other of the first and second internal memory sector address signal paths.
    • 存储器件包括多个独立存储器扇区,外部地址信号输入用于接收寻址存储器件的各个存储器位置的外部地址信号,外部地址信号包括允许单独寻址每个存储器扇区的外部存储器扇区地址信号,以及 存储器扇区选择电路,用于根据外部存储器扇区地址信号的值来选择多个存储器扇区之一。 提供第一和第二替代的内部存储器扇区地址信号路径用于将外部存储器扇区地址信号提供给存储器扇区选择电路,第一路径不提供逻辑反转,而第二路径提供逻辑反转。 可编程电路激活第一和第二内部存储器扇区地址信号路径中的一个或另一个,使得外部地址信号的值(00000h-3FFFFh)的空间中的每个存储器扇区的位置可以通过激活 第一和第二内部存储器扇区地址信号路径中的一个或另一个。