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    • 35. 发明申请
    • NONVOLATILE MEMORY DEVICE AND READ METHOD THEREOF
    • 非易失性存储器件及其读取方法
    • US20120120732A1
    • 2012-05-17
    • US13355834
    • 2012-01-23
    • Changhyun LeeJungdal ChoiByeong-In Choe
    • Changhyun LeeJungdal ChoiByeong-In Choe
    • G11C16/10G11C16/26
    • G11C16/26G11C8/10G11C11/5628G11C11/5642G11C16/0483G11C16/10G11C16/3418G11C16/3436G11C16/3454G11C16/3459G11C29/00
    • A nonvolatile memory device has improved reliability by compensating a threshold voltage of a flash memory cell. A nonvolatile memory device includes a memory cell array and a voltage generator for supplying a select read voltage to a select word line and an unselect read voltage to unselected word lines when a read operation is performed, and supplying a verify voltage to a select word line and the unselect read voltage to unselected word lines when a program operation is performed. The voltage generator supplies a first unselect read voltage to at least one between an upper word line and a lower word line adjacent to the select word line when the program operation is performed, and supplies a second unselected read voltage to at least one between the upper word line and the lower word line adjacent to the select word line when the read operation is performed.
    • 非易失性存储器件通过补偿闪存单元的阈值电压而提高了可靠性。 非易失性存储器件包括:存储单元阵列和电压发生器,用于在执行读取操作时将选择读取电压提供给选择字线,并将未选择读取电压提供给未选择的字线;以及将验证电压提供给选择字线 以及当执行编程操作时,对未选字线的取消选择读取电压。 电压发生器在执行编程操作时将第一未读选择电压提供给与选择字线相邻的上字线和下字线之间的至少一个,并且将第二未选择读电压提供给上 当执行读操作时,字线和与选择字线相邻的下字线。
    • 36. 发明授权
    • Nonvolatile memory device and read method thereof
    • 非易失性存储器件及其读取方法
    • US08107295B2
    • 2012-01-31
    • US12607518
    • 2009-10-28
    • Changhyun LeeJungdal ChoiByeong-In Choi
    • Changhyun LeeJungdal ChoiByeong-In Choi
    • G11C11/34G11C16/06G11C5/14
    • G11C8/08G11C11/5642G11C16/3418G11C29/00
    • An object of the present inventive concept is providing a nonvolatile memory device having improved reliability by compensating a threshold voltage of a flash memory cell.A nonvolatile memory device according to the present inventive concept includes a memory cell array connected to a plurality of word lines; and a voltage generator for supplying a select read voltage to a select word line and an unselect read voltage to an unselect word line among the plurality of word lines when a read operation is performed. The voltage generator generates the unselect read voltage having a different level according to whether the unselect word line is adjacent to the select word line or not.A nonvolatile memory device according to the present inventive concept compensates a threshold voltage increased or decreased due to various causes. According to the present inventive concept, reliability of a nonvolatile memory device is improved.
    • 本发明构思的目的是通过补偿闪存单元的阈值电压来提供具有改善的可靠性的非易失性存储器件。 根据本发明构思的非易失性存储器件包括连接到多个字线的存储单元阵列; 以及电压发生器,用于当执行读取操作时,将选择读取电压提供给选择字线和取消选择读取电压到多个字线中的未选择字线。 电压发生器根据取消选择字线是否与选择字线相邻而产生具有不同电平的取消读取电压。 根据本发明构思的非易失性存储器件补偿由于各种原因而增加或减少的阈值电压。 根据本发明构思,提高了非易失性存储装置的可靠性。
    • 37. 发明申请
    • Nonvolatile Memory Device, Programming Method Thereof And Memory System Including The Same
    • 非易失性存储器件,其编程方法和包括其的存储器系统
    • US20110199829A1
    • 2011-08-18
    • US13029518
    • 2011-02-17
    • Changhyun LeeJinman HanDoogon KimSunghoi HurJongin Yun
    • Changhyun LeeJinman HanDoogon KimSunghoi HurJongin Yun
    • G11C16/04G11C16/10
    • G11C16/107G11C16/0483G11C16/10G11C2213/71H01L27/11578H01L27/11582H01L29/7926
    • Provided is a programming method of a nonvolatile memory device. The nonvolatile memory device includes a substrate and a plurality of memory cells which are stacked in the direction perpendicular to the substrate. The programming method applies a first voltage to a selected bit line connected to at least two memory strings in same column including a memory cell of the plurality of memory cell to be programmed, applies a second voltage to an unselected bit line connected to at least two memory strings in same column including a memory cell of the plurality of memory cell to be program-prohibited, applies a third voltage to a selected string selection line connected to at least two memory strings in same row, applies a fourth voltage to an unselected string selection line connected to at least two memory strings in same row, and applies a program operation voltage to a plurality of word lines, each word line connected to each corresponding memory cell in the memory string, wherein the first to third voltages are positive voltages.
    • 提供了一种非易失性存储器件的编程方法。 非易失性存储器件包括基板和沿垂直于基板的方向堆叠的多个存储单元。 编程方法将第一电压施加到连接到包括要编程的多个存储器单元的存储单元的同一列中的至少两个存储器串的选定位线,将第二电压施加到连接至少两个的未选定位线 包含要被编程禁止的多个存储单元的存储单元的同一列中的存储器串向同一行中连接到至少两个存储器串的所选择的串选择线施加第三电压,将第四电压施加到未选择的串 选择线连接到同一行中的至少两个存储器串,并且将编程操作电压施加到多个字线,每个字线连接到存储器串中的每个对应的存储单元,其中第一至第三电压是正电压。
    • 39. 发明授权
    • Nonvolatile memory device, programming method thereof and memory system including the same
    • 非易失性存储器件,其编程方法和包括其的存储器系统
    • US08929145B2
    • 2015-01-06
    • US14043256
    • 2013-10-01
    • Changhyun LeeJinman HanDoogon KimSunghoi HurJongin Yun
    • Changhyun LeeJinman HanDoogon KimSunghoi HurJongin Yun
    • G11C16/04H01L27/115G11C16/10H01L29/792
    • G11C16/107G11C16/0483G11C16/10G11C2213/71H01L27/11578H01L27/11582H01L29/7926
    • Provided is a programming method of a nonvolatile memory device. The nonvolatile memory device includes a substrate and a plurality of memory cells which are stacked in the direction perpendicular to the substrate. The programming method applies a first voltage to a selected bit line connected to at least two memory strings in same column including a memory cell of the plurality of memory cell to be programmed, applies a second voltage to an unselected bit line connected to at least two memory strings in same column including a memory cell of the plurality of memory cell to be program-prohibited, applies a third voltage to a selected string selection line connected to at least two memory strings in same row, applies a fourth voltage to an unselected string selection line connected to at least two memory strings in same row, and applies a program operation voltage to a plurality of word lines, each word line connected to each corresponding memory cell in the memory string, wherein the first to third voltages are positive voltages.
    • 提供了一种非易失性存储器件的编程方法。 非易失性存储器件包括基板和沿垂直于基板的方向堆叠的多个存储单元。 编程方法将第一电压施加到连接到包括要编程的多个存储器单元的存储单元的同一列中的至少两个存储器串的选定位线,将第二电压施加到连接至少两个的未选定位线 包含要被编程禁止的多个存储单元的存储单元的同一列中的存储器串向同一行中连接到至少两个存储器串的所选择的串选择线施加第三电压,将第四电压施加到未选择的串 选择线连接到同一行中的至少两个存储器串,并且将编程操作电压施加到多个字线,每个字线连接到存储器串中的每个对应的存储单元,其中第一至第三电压是正电压。