专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

31. 发明授权

US5639257A Bolt-equipped connector 失效
标题翻译：螺栓连接器
公开(公告)号：US5639257A
公开(公告)日：1997-06-17
申请号：US588885
申请日：1996-01-19
申请人： Shinji Yamaguchi , Katsuji Shimazawa , Hiroshi Takeda
发明人： Shinji Yamaguchi , Katsuji Shimazawa , Hiroshi Takeda
IPC分类号： H01R13/621 , H01R13/627
CPC分类号： H01R13/6215
摘要： The invention provides a bolt-equipped connector in which the bolt will be mounted when the connector is mated with a counter connector. Engaging protrusions (25a, 26a) of a bolt holder (20) are engaged with engaging portions (15b, 16b), whereby the bolt holder (20) is fitted to a holder mounting hole (13) of a housing (11) of a male connector (10). In this state, the bolt (40) is pushed into the bolt holder (20) at the time of mating with a female connector. Engaging pieces (44b, 44c) of a stop ring (44) additionally provided to the bolt (40) are engaged with a step portion (22b) of the bolt holder (20), so that the bolt (40) is rotatably held to the housing (11) via the bolt holder (20). Then, a male screw portion (41) of the bolt (40) is screwed in a screw hole of the female connector, whereby the connectors are mated with each other.
摘要翻译：本发明提供了一种螺栓配备的连接器，其中当连接器与对接连接器配合时，螺栓将被安装。螺栓保持器（20）的接合突起（25a，26a）与接合部分（15b，16b）接合，由此螺栓保持器（20）装配到壳体（11）的保持器安装孔（13）公连接器（10）。在该状态下，在与母连接器配合时，将螺栓（40）推入螺栓保持架（20）。额外提供给螺栓（40）的止动环（44）的接合件（44b，44c）与螺栓保持器（20）的台阶部分（22b）接合，使得螺栓（40）可旋转地保持所述壳体（11）经由所述螺栓保持器（20）。然后，将螺栓（40）的外螺纹部（41）拧入阴连接器的螺纹孔中，由此连接器相互配合。

32. 发明授权

US08749263B2 Semiconductor apparatus, inspection method thereof and electric device 有权
标题翻译：半导体装置及其检测方法及电气装置
公开(公告)号：US08749263B2
公开(公告)日：2014-06-10
申请号：US13221007
申请日：2011-08-30
申请人： Masayuki Ohta , Masaki Tatsumi , Yoshiki Sota , Kazuo Tamaki , Shinji Yamaguchi , Masamichi Harada , Shin Ito , Tomoshi Kimura , Yoshifumi Inada
发明人： Masayuki Ohta , Masaki Tatsumi , Yoshiki Sota , Kazuo Tamaki , Shinji Yamaguchi , Masamichi Harada , Shin Ito , Tomoshi Kimura , Yoshifumi Inada
IPC分类号： H01L33/52
CPC分类号： H01L24/97 , H01L23/49827 , H01L24/32 , H01L24/48 , H01L24/73 , H01L33/62 , H01L2224/32225 , H01L2224/48091 , H01L2224/48227 , H01L2224/48465 , H01L2224/73265 , H01L2224/97 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01033 , H01L2924/01047 , H01L2924/01074 , H01L2924/01078 , H01L2924/014 , H01L2924/12041 , H01L2924/15787 , H01L2924/181 , H01L2224/83 , H01L2224/85 , H01L2924/00012 , H01L2924/00 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
摘要： A semiconductor apparatus according to the present invention with a semiconductor element implemented on an insulated substrate comprises: a substrate front surface electrode formed on a front surface side of the insulated substrate and connected with an element electrode of the semiconductor element; a substrate back surface electrode formed on a back surface side of the insulated substrate and electrically connected with the substrate front surface electrode; and a plurality of connection electrodes, extending in a thickness direction of the insulated substrate from one side to the other side of a front surface and a back surface thereof, for electrically connecting the substrate front surface electrode with the substrate back surface electrode, where the substrate front surface electrode or the substrate back surface electrode is formed to have a plane pattern separated for each of the plurality of connection electrodes.
摘要翻译：根据本发明的半导体器件具有实施在绝缘基板上的半导体元件，包括：基板前表面电极，形成在绝缘基板的前表面侧并与半导体元件的元件电极连接; 基板背面电极，其形成在所述绝缘基板的背面侧并与所述基板正面电极电连接; 以及多个连接电极，其在绝缘基板的厚度方向上从前表面和后表面的一侧延伸到另一侧，用于将基板正面电极与基板背面电极电连接，其中基板前表面电极或基板背面电极被形成为具有为多个连接电极中的每一个分开的平面图案。

33. 发明授权

US08675100B2 Zoom lens system, imaging device and camera 有权
标题翻译：变焦镜头系统，成像设备和相机
公开(公告)号：US08675100B2
公开(公告)日：2014-03-18
申请号：US13093861
申请日：2011-04-26
申请人： Yasunori Touchi , Takakazu Bito , Shinji Yamaguchi
发明人： Yasunori Touchi , Takakazu Bito , Shinji Yamaguchi
IPC分类号： H04N5/262
CPC分类号： G02B15/173
摘要： A zoom lens system comprising a first lens unit having positive optical power, a second lens unit having negative optical power, a third lens unit having positive optical power, a fourth lens unit having negative optical power, and a fifth lens unit having positive optical power, wherein the third lens unit includes at least one lens element having positive optical power and at least one lens element having negative optical power, at least the first to third lens units are moved along an optical axis in zooming so that air spaces between the respective lens units vary, thereby performing magnification change, a lens unit positioned on the image side relative to an aperture diaphragm is moved along the optical axis in focusing, and the conditions: 8.1
摘要翻译：一种变焦透镜系统，包括具有正光焦度的第一透镜单元，具有负光焦度的第二透镜单元，具有正光焦度的第三透镜单元，具有负光焦度的第四透镜单元和具有正光焦度的第五透镜单元，其中所述第三透镜单元包括具有正光焦度的至少一个透镜元件和具有负光焦度的至少一个透镜元件，至少所述第一至第三透镜单元在变焦时沿光轴移动，使得所述第一透镜单元透镜单元变化，从而进行放大率变化，相对于孔径光阑位于像侧的透镜单元在聚焦时沿光轴移动，条件为：8.1 = 9.0（fG1：第一透镜单元的复合焦距，Ir = fT×tan（ω）），ω：在远摄极限处的半视角，fT和fW：整个系统在远摄极限和广角限制）满足; 成像装置; 并提供相机。

34. 发明授权

US08669522B2 Mask inspection apparatus and mask inspection method 失效
标题翻译：面膜检查仪和面膜检查方法
公开(公告)号：US08669522B2
公开(公告)日：2014-03-11
申请号：US13416282
申请日：2012-03-09
申请人： Shinji Yamaguchi , Masato Naka , Hiroyuki Kashiwagi , Masamitsu Itoh
发明人： Shinji Yamaguchi , Masato Naka , Hiroyuki Kashiwagi , Masamitsu Itoh
IPC分类号： H01J37/28
CPC分类号： G03F1/84 , G01N23/225 , G01N2021/95676
摘要： According to one embodiment, a mask inspection apparatus includes a decompression chamber, a holder, a light irradiation unit, a detection unit, an electrode, and a control unit. The holder is provided in the decompression chamber and holds a mask. The light irradiation unit irradiates a major surface of the mask held by the holder with a light. The detection unit is provided in the decompression chamber to detect electrons generated when the major surface of the mask is irradiated with the light. The electrode is provided between the holder and the detection unit and guides the electrons in a direction from the holder toward the detection unit. The control unit compares a detection result of the electrons detected by the detection unit with a reference value.
摘要翻译：根据一个实施例，掩模检查装置包括减压室，保持器，光照射单元，检测单元，电极和控制单元。保持器设置在减压室中并保持面罩。光照射单元用光照射由保持器保持的面罩的主表面。检测单元设置在减压室中以检测当用光照射掩模的主表面时产生的电子。电极设置在保持器和检测单元之间并且引导电子沿着保持器朝向检测单元的方向。控制单元将由检测单元检测的电子的检测结果与参考值进行比较。

35. 发明申请

US20120092457A1 STEREOSCOPIC IMAGE DISPLAY APPARATUS 审中-公开
标题翻译：立体图像显示装置
公开(公告)号：US20120092457A1
公开(公告)日：2012-04-19
申请号：US13240630
申请日：2011-09-22
申请人： Yoichi Sugino , Michihiro Yamagata , Kenichi Hayashi , Shinji Yamaguchi , Keiki Yoshitsugu
发明人： Yoichi Sugino , Michihiro Yamagata , Kenichi Hayashi , Shinji Yamaguchi , Keiki Yoshitsugu
IPC分类号： H04N13/02
CPC分类号： H04N13/286
摘要： A display apparatus 100 of the present invention includes: a memory 130; a display 101; an operation part 110; and a controller 150. The controller 150 controls the display 101, in the case where the image of image data acquired in the memory 130 is displayed as a stereoscopic image, such that the image of the image data acquired in the memory 130 is displayed as a planar image when an instruction for selection becomes receivable by the operation part 110.
摘要翻译：本发明的显示装置100包括：存储器130; 显示器101; 操作部110; 控制器150控制显示器101，在将存储器130中获取的图像数据的图像显示为立体图像的情况下，使得在存储器130中获取的图像数据的图像被显示为当选择指令变得可由操作部110接收时的平面图像。

36. 发明申请

US20120049882A1 SEMICONDUCTOR APPARATUS, INSPECTION METHOD THEREOF AND ELECTRIC DEVICE 有权
标题翻译：半导体设备及其检测方法及电气设备
公开(公告)号：US20120049882A1
公开(公告)日：2012-03-01
申请号：US13221007
申请日：2011-08-30
申请人： Masayuki OHTA , Masaki Tatsumi , Yoshiki Sota , Kazuo Tamaki , Shinji Yamaguchi , Masamichi Harada , Shin Ito , Tomoshi Kimura , Yoshifumi Inada
发明人： Masayuki OHTA , Masaki Tatsumi , Yoshiki Sota , Kazuo Tamaki , Shinji Yamaguchi , Masamichi Harada , Shin Ito , Tomoshi Kimura , Yoshifumi Inada
IPC分类号： H01L33/52 , G01R31/26
CPC分类号： H01L24/97 , H01L23/49827 , H01L24/32 , H01L24/48 , H01L24/73 , H01L33/62 , H01L2224/32225 , H01L2224/48091 , H01L2224/48227 , H01L2224/48465 , H01L2224/73265 , H01L2224/97 , H01L2924/00014 , H01L2924/01005 , H01L2924/01006 , H01L2924/01033 , H01L2924/01047 , H01L2924/01074 , H01L2924/01078 , H01L2924/014 , H01L2924/12041 , H01L2924/15787 , H01L2924/181 , H01L2224/83 , H01L2224/85 , H01L2924/00012 , H01L2924/00 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
摘要： A semiconductor apparatus according to the present invention with a semiconductor element implemented on an insulated substrate comprises: a substrate front surface electrode formed on a front surface side of the insulated substrate and connected with an element electrode of the semiconductor element; a substrate back surface electrode formed on a back surface side of the insulated substrate and electrically connected with the substrate front surface electrode; and a plurality of connection electrodes, extending in a thickness direction of the insulated substrate from one side to the other side of a front surface and a back surface thereof, for electrically connecting the substrate front surface electrode with the substrate back surface electrode, where the substrate front surface electrode or the substrate back surface electrode is formed to have a plane pattern separated for each of the plurality of connection electrodes.
摘要翻译：根据本发明的半导体器件具有实施在绝缘基板上的半导体元件，包括：基板前表面电极，形成在绝缘基板的前表面侧并与半导体元件的元件电极连接; 基板背面电极，其形成在所述绝缘基板的背面侧并与所述基板正面电极电连接; 以及多个连接电极，其在绝缘基板的厚度方向上从前表面和后表面的一侧延伸到另一侧，用于将基板正面电极与基板背面电极电连接，其中基板前表面电极或基板背面电极被形成为具有为多个连接电极中的每一个分开的平面图案。

37. 发明授权

US07952810B2 Zoom lens system, imaging device and camera 有权
标题翻译：变焦镜头系统，成像设备和相机
公开(公告)号：US07952810B2
公开(公告)日：2011-05-31
申请号：US12639748
申请日：2009-12-16
申请人： Takakazu Bito , Keiki Yoshitsugu , Shinji Yamaguchi
发明人： Takakazu Bito , Keiki Yoshitsugu , Shinji Yamaguchi
IPC分类号： G02B15/14 , G02B27/00 , H04N5/262
CPC分类号： G02B15/173
摘要： An object is to provide: a zoom lens system that has a reduced overall length, a high resolution, and a variable magnification ratio as high as 9 or greater and that is satisfactorily adaptable for wide-angle image taking where the view angle at a wide-angle limit is 70° or greater; an imaging device employing this zoom lens system; and a thin and compact camera. The zoom lens system has a plurality of lens units each consisting of at least one lens element, and, in order from the object side to the image side, comprises a first lens unit having positive optical power, a second lens unit having negative optical power, a third lens unit having positive optical power, a fourth lens unit and a fifth lens unit. In zooming from a wide-angle limit to a telephoto limit at the time of image taking, at least the first lens unit and the second lens unit move in an optical axis direction, while the fourth lens unit and the fifth lens unit are each consists of one lens element. An imaging device and a camera employ this zoom lens system.
摘要翻译：本发明的目的是提供一种变焦透镜系统，其具有缩小的总长度，高分辨率和高达9或更大的可变放大率，并且令人满意地适用于广角图像拍摄，其中宽视角角度限制为70°以上; 使用该变焦透镜系统的成像装置; 和一个薄而紧凑的相机。变焦透镜系统具有多个透镜单元，每个透镜单元由至少一个透镜元件组成，并且从物体侧到像侧依次包括具有正光焦度的第一透镜单元，具有负光焦度的第二透镜单元具有正光焦度的第三透镜单元，第四透镜单元和第五透镜单元。在从拍摄时的广角限制到远摄限制的情况下，至少第一透镜单元和第二透镜单元沿光轴方向移动，而第四透镜单元和第五透镜单元各自组成的一个透镜元件。成像装置和相机采用该变焦透镜系统。

38. 发明授权

US07821628B2 Mask defect inspection computer program product 有权
标题翻译：面膜缺陷检查计算机程序产品
公开(公告)号：US07821628B2
公开(公告)日：2010-10-26
申请号：US11980640
申请日：2007-10-31
申请人： Shinji Yamaguchi , Soichi Inoue , Satoshi Tanaka , Mari Inoue
发明人： Shinji Yamaguchi , Soichi Inoue , Satoshi Tanaka , Mari Inoue
IPC分类号： G01N21/00
CPC分类号： G03F1/84
摘要： A mask defect inspecting method comprises preparing detection sensitivities of defects on a plurality of portions of a mask pattern on a photomask, the detection sensitivities being determined according to influences of the defects upon a wafer, and inspecting defects on the plurality of portions based on the detection sensitivities.
摘要翻译：掩模缺陷检查方法包括：对光掩模上的掩模图案的多个部分上的缺陷的检测灵敏度进行准备，检测灵敏度根据晶片上的缺陷的影响确定，并且基于所述多个部分检查多个部分的缺陷检测灵敏度。

39. 发明授权

US07673281B2 Pattern evaluation method and evaluation apparatus and pattern evaluation program 失效
标题翻译：模式评估方法和评估装置及模式评价程序
公开(公告)号：US07673281B2
公开(公告)日：2010-03-02
申请号：US11878018
申请日：2007-07-20
申请人： Eiji Yamanaka , Masamitsu Itoh , Mitsuyo Asano , Shinji Yamaguchi
发明人： Eiji Yamanaka , Masamitsu Itoh , Mitsuyo Asano , Shinji Yamaguchi
IPC分类号： G06F17/50
CPC分类号： G03F1/84
摘要： A pattern evaluation method for evaluating a mask pattern includes generating desired wafer pattern data corresponding to the evaluation position of a mask pattern, generating mask pattern contour data based on an image of the mask pattern, and performing a lithography/simulation process based on the mask pattern contour data and generating predicted wafer pattern data when the mask pattern is transferred to a wafer. Further, it includes deriving positional offset between the mask pattern contour data and mask pattern data, correcting a positional error between the desired wafer pattern data and the predicted wafer pattern data based on the positional offset, and comparing the desired wafer pattern data with the predicted wafer pattern data with the positional error corrected.
摘要翻译：用于评估掩模图案的图案评估方法包括生成与掩模图案的评估位置相对应的期望的晶片图形数据，基于掩模图案的图像生成掩模图案轮廓数据，以及基于掩模执行光刻/模拟处理图案轮廓数据，并且当掩模图案被转印到晶片时产生预测的晶片图形数据。此外，其包括导出掩模图案轮廓数据和掩模图案数据之间的位置偏移，基于位置偏移校正期望的晶片图案数据和预测的晶片图案数据之间的位置误差，并将期望的晶片图案数据与预测的晶片图案数据进行比较具有校正位置误差的晶片图形数据。

40. 发明授权

US07393233B2 Electrical connector having locking mechanism for locking connector housings 有权
标题翻译：具有锁定连接器壳体的锁定机构的电连接器
公开(公告)号：US07393233B2
公开(公告)日：2008-07-01
申请号：US10541519
申请日：2003-09-04
申请人： Yukifumi Machida , Shinji Yamaguchi , Yoshikazu Tanaka , Makoto Enari , Tetsu Hirose
发明人： Yukifumi Machida , Shinji Yamaguchi , Yoshikazu Tanaka , Makoto Enari , Tetsu Hirose
IPC分类号： H01R13/627
CPC分类号： H01R13/4223 , H01R13/6272
摘要： In an electrical connector assembly, housings are locked with each other by locking a rear holder provided in a first connector with a cooperating second connector. In a rear holder main body 52 of a rear holder 51 there are formed a plurality of resilient clamping lances 53 which clamp connection terminals 67 inserted into respective terminal receiving holes 62 formed in a housing main body 61. At a middle upper portion of the rear holder 51 there is provided a resilient locking arm 54, and a locking claw 55 is formed on the locking arm. When the housing main body 61 is inserted into a housing main body 71 of a cooperating connector, connection terminals 67 and 72 are coupled with each other. The locking claw 55 provided on the locking arm 54 of the rear holder 51 is engaged with a locking portion 73 of the housing main body 71 of the cooperating second connector.
摘要翻译：在电连接器组件中，壳体通过将设置在第一连接器中的后保持器与配合的第二连接器锁定而彼此锁定。在后保持器51的后保持器主体52中形成有多个弹性夹持矛杆53，夹紧连接端子67插入到形成在壳体主体61中的各个端子容纳孔62中。在后保持器51的中间上部设置有弹性锁定臂54，并且锁定爪55形成在锁定臂上。当壳体主体61插入到协作连接器的壳体主体71中时，连接端子67和72彼此连接。设置在后保持器51的锁定臂54上的锁定爪55与配合的第二连接器的壳体主体71的锁定部73接合。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式