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    • 21. 发明授权
    • System for detecting double-feed flat items
    • 用于检测双馈平板物品的系统
    • US09488587B2
    • 2016-11-08
    • US14606620
    • 2015-01-27
    • NEOPOST TECHNOLOGIES
    • David Audeon
    • G01N21/86B65H7/12B65H43/04B65H43/08
    • G01N21/86B65H7/125B65H43/04B65H43/08B65H2511/13B65H2511/30B65H2553/414B65H2557/51B65H2701/1916G01N2201/02G01N2201/06113B65H2220/03B65H2220/01
    • A system for detecting double-feed flat item conveyed in a mail processing machine, including a detection for directing a beam of radiant energy toward the moving flat items, scanning them with the beam and receiving at least a portion of the beam of radiation reflected from them. The detector includes a triangulation sensor for providing an output proportional to the position at which the reflected portion of the beam is received, and means for determining from the output, the distance (d) between the radiation source and the point of reflection of the beam on the moving flat items, and providing a signal (S) representative of said distance; and a controller configured to receive the signal (S) and generate an output signal (V) indicative of a flat item profile and a double-feed condition when it detects a significant break point or slope change of the signal from a first direction to a second direction.
    • 一种用于检测在邮件处理机中传送的双重送料扁平物品的系统,包括用于将辐射能束照射到移动的平坦物品的检测,用光束扫描它们,并接收从该光束反射的辐射束的至少一部分 他们。 检测器包括三角测量传感器,用于提供与波束的反射部分被接收的位置成比例的输出,以及用于从输出端确定辐射源与光束的反射点之间的距离(d)的装置 并且提供代表所述距离的信号(S); 以及控制器,被配置为当其检测到信号从第一方向到第二方向的显着断点或斜率变化时,接收信号(S)并产生指示平坦项目轮廓的输出信号(V)和双进给状态 第二个方向
    • 22. 发明授权
    • Method and device for measuring the flatness of a metal product
    • 用于测量金属制品的平整度的方法和装置
    • US09488473B2
    • 2016-11-08
    • US14390821
    • 2013-04-03
    • PRIMETALS TECHNOLOGIES AUSTRIA GMBH
    • Laurent Dorel
    • G01N21/86G01N21/892G01B11/30G01B11/25G01N21/89
    • G01B11/303G01B11/2522G01B11/306G01N21/86G01N21/8901G01N21/8914G01N21/892G01N2021/8918G01N2201/02G01N2201/06113
    • A method measures the flatness of a metal product and an associated device. The method applies to a metal product, in the form of either a strip or a plate from a metallurgical processing line. The product to be measured being, by default, free of external traction. The method contains the following steps: a) illuminating a portion of a face of the product under uniform intensity; b) capturing an image of a light line of the illuminated portion; c) relatively moving the illuminated portion and the light line in a defined direction in relation to the product; d) repeating steps a), b), c); and e) collecting the images of lines in a two-dimensional distribution of intensities and selecting a strand direction of the product in which, if at least one wave of intensities is detected, a local amplitude variation of the wave delivers a local strand flatness defect value.
    • 一种方法测量金属制品和相关装置的平整度。 该方法适用于来自冶金加工生产线的带状或板状的金属制品。 要测量的产品,默认情况下,没有外部牵引力。 该方法包括以下步骤:a)以均匀的强度照射产品的一部分面部; b)拍摄照明部分的光线的图像; c)相对于产品沿着规定的方向相对移动照明部分和光线; d)重复步骤a),b),c); 以及e)以强度的二维分布收集线的图像并选择产品的股线方向,其中如果检测到至少一个强度波,则波的局部振幅变化传递局部股线平坦度缺陷 值。
    • 24. 发明授权
    • Apparatus and method for measuring optical component
    • US09429469B2
    • 2016-08-30
    • US14407050
    • 2013-06-07
    • Labrox Oy
    • Pauli SalmelainenAntero Yli-Koski
    • G01J1/04G01J1/42G01N21/64
    • G01J1/4228G01J1/0444G01N21/645G01N21/6452G01N2021/6471G01N2201/02
    • An apparatus for measuring an optical component (160, 170, 190) of the apparatus, the apparatus comprising a radiation source (130) configured to form a measuring beam in a measuring channel (140), wherein the measured optical component configured to be in a first position outside the measuring channel and in a second position in the measuring channel; a first detector (110) configured to receive beams in the measuring channel; a second detector (150) configured to receive beams in the measuring channel; at least one processor; and at least one memory including computer program code. The at least one memory and the computer program code are configured to, with the at least one processor, cause the apparatus at least to select at least one of the first detector and the second detector to receive beams in the measuring channel, the measuring channel (140) being integrated to a photometer or a fluorescence channel of the apparatus; receive a first beam, using the selected detector, in the measuring channel, wherein the measured optical component is in the first position; receive a second beam, using the selected detector, in the measuring channel, wherein the measured optical component is in the second position; and determine the characteristics of the optical component based on the first beam and the second beam.