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2. 发明申请

US20150177060A1 Apparatus and method for measuring optical component 有权
标题翻译：光学元件测量装置及方法
公开(公告)号：US20150177060A1
公开(公告)日：2015-06-25
申请号：US14407050
申请日：2013-06-07
申请人： Labrox Oy
发明人： Pauli Salmelainen , Antero Yli-Koski
IPC分类号： G01J1/42 , G01J1/04 , G01N21/64
CPC分类号： G01J1/4228 , G01J1/0444 , G01N21/645 , G01N21/6452 , G01N2021/6471 , G01N2201/02
摘要： An apparatus for measuring an optical component (160, 170, 190) of the apparatus, the apparatus comprising a radiation source (130) configured to form a measuring beam in a measuring channel (140), wherein the measured optical component configured to be in a first position outside the measuring channel and in a second position in the measuring channel; a first detector (110) configured to receive beams in the measuring channel; a second detector (150) configured to receive beams in the measuring channel; at least one processor; and at least one memory including computer program code. The at least one memory and the computer program code are configured to, with the at least one processor, cause the apparatus at least to select at least one of the first detector and the second detector to receive beams in the measuring channel, the measuring channel (140) being integrated to a photometer or a fluorescence channel of the apparatus; receive a first beam, using the selected detector, in the measuring channel, wherein the measured optical component is in the first position; receive a second beam, using the selected detector, in the measuring channel, wherein the measured optical component is in the second position; and determine the characteristics of the optical component based on the first beam and the second beam.
摘要翻译：一种用于测量装置的光学部件（160,170,190）的装置，该装置包括被配置成在测量通道（140）中形成测量光束的辐射源（130），其中被测量的光学部件配置成测量通道外的第一位置和测量通道中的第二位置; 被配置为在所述测量通道中接收波束的第一检测器（110）被配置为在所述测量通道中接收波束的第二检测器（150）至少一个处理器; 以及包括计算机程序代码的至少一个存储器。所述至少一个存储器和所述计算机程序代码被配置为与所述至少一个处理器一起使所述设备至少选择所述第一检测器和所述第二检测器中的至少一个以接收所述测量通道中的波束，所述测量通道（140）被集成到所述装置的光度计或荧光通道中; 在测量通道中接收使用所选择的检测器的第一光束，其中所测量的光学部件处于第一位置; 在测量通道中接收使用所选择的检测器的第二光束，其中所测量的光学部件处于第二位置; 并基于第一光束和第二光束确定光学部件的特性。

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