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    • 26. 发明授权
    • Metal-insulator-metal capacitor and method of fabricating same
    • 金属绝缘体金属电容器及其制造方法
    • US06964908B2
    • 2005-11-15
    • US10643307
    • 2003-08-19
    • Louis L. HsuRajiv V. JoshiChun-Yung Sung
    • Louis L. HsuRajiv V. JoshiChun-Yung Sung
    • H01L21/02H01L21/768H01L23/522H01L21/28H01L21/308
    • H01G4/228H01G4/33H01L21/768H01L23/5223H01L28/60H01L2924/0002Y10S438/957H01L2924/00
    • A metal-insulator-metal (MIM) capacitor including a metal layer, an insulating layer formed on the metal layer, at least a first opening and at least a second opening formed in the first insulating layer, a dielectric layer formed in the first opening, a conductive material deposited in the first and second openings, and a first metal plate formed over the first opening and a second metal plate formed over the second opening. A method for fabricating the MIM capacitor, includes forming the first metal layer, forming the insulating layer on the first metal layer, forming at least the first opening and at least the second opening in the first insulating layer, depositing a mask over the second opening, forming the dielectric layer in the first opening, removing the mask, depositing the conductive material in the first and second openings, and depositing a second metal layer over the first and second openings. MIM capacitors and methods of fabricating same are described, wherein the MIM capacitors are formed simultaneously with the BEOL interconnect and large density MIM capacitors are fabricated at low cost.
    • 一种金属绝缘体金属(MIM)电容器,包括金属层,形成在金属层上的绝缘层,至少第一开口和形成在第一绝缘层中的至少第二开口,形成在第一开口中的电介质层 沉积在第一和第二开口中的导电材料和形成在第一开口上的第一金属板和形成在第二开口上的第二金属板。 一种制造MIM电容器的方法,包括形成第一金属层,在第一金属层上形成绝缘层,至少形成第一开口和至少第一绝缘层中的第二开口,在第二开口上沉积掩模 在第一开口中形成电介质层,去除掩模,在第一和第二开口中沉积导电材料,并在第一和第二开口上沉积第二金属层。 描述MIM电容器及其制造方法,其中MIM电容器与BEOL互连同时形成,并且以低成本制造大密度MIM电容器。