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    • 22. 发明申请
    • SYSTEM FOR TESTING INTEGRATED CIRCUIT
    • 用于测试集成电路的系统
    • US20150346272A1
    • 2015-12-03
    • US14288358
    • 2014-05-27
    • Kumar AbhishekKushal KamalVandana Sapra
    • Kumar AbhishekKushal KamalVandana Sapra
    • G01R31/28
    • G01R31/2856H03M1/1245H03M1/38H03M1/40H03M1/42H03M1/466
    • An integrated circuit (IC) is connected to an automated test equipment (ATE) with pogo pins. The IC includes an analog-to-digital converter (ADC), a voltage controlled oscillator (VCO), and a compensation circuit. The ATE provides reference voltage signals to the ADC by way of the pogo pins. A potential drop across a pogo pin introduces an error in a reference voltage signal that is reflected in a digital signal generated by the ADC. The VCO generates reference frequency signals corresponding to the reference voltage signals. The compensation circuit receives the reference frequency signals and the digital signal and generates a compensation factor signal. The compensation circuit multiplies the compensation factor signal and the digital signal to generate a compensated digital signal to compensate for the error introduced by the potential drop across the pogo pins.
    • 集成电路(IC)连接到具有弹簧针的自动测试设备(ATE)。 该IC包括模数转换器(ADC),压控振荡器(VCO)和补偿电路。 ATE通过弹簧引脚向ADC提供参考电压信号。 在pogo引脚上的电压降引起在ADC产生的数字信号中反映的参考电压信号中的误差。 VCO产生对应于参考电压信号的参考频率信号。 补偿电路接收参考频率信号和数字信号,并产生补偿因子信号。 补偿电路将补偿因子信号和数字信号相乘以产生补偿数字信号,以补偿由pogo引脚上的电位降引入的误差。
    • 23. 发明授权
    • Lock detection circuit for phase locked loop
    • 锁相环锁定检测电路
    • US08076979B2
    • 2011-12-13
    • US12416933
    • 2009-04-02
    • Manan KathuriaKumar AbhishekSuhas ChakravartySuri Roopak
    • Manan KathuriaKumar AbhishekSuhas ChakravartySuri Roopak
    • H03J7/04H03L7/02
    • H03L7/095Y10S331/02
    • A lock detector circuit for detecting a lock condition between a reference signal and a feedback signal includes a first counter for outputting a first counter value indicative of a number of clock cycles of the reference signal, and a second counter for outputting a second counter value indicative of a number of clock cycles of the feedback signal. An asynchronous comparator receives the first and second counter values and provides an output signal having a pulse width that is proportional to the difference between the first and second counter values. A pulse width detector receives the comparator output signal and produces an output signal that is indicative of the relationship between the pulse width of the comparator output signal and a predetermined threshold value. A state machine controls the state of at least one lock indication signal according to the pulse width detector output signal.
    • 用于检测参考信号和反馈信号之间的锁定状态的锁定检测器电路包括用于输出指示参考信号的时钟周期数的第一计数器值的第一计数器和用于输出指示的第二计数器值的第二计数器 的反馈信号的多个时钟周期。 异步比较器接收第一和第二计数器值,并提供具有与第一和第二计数器值之间的差成比例的脉冲宽度的输出信号。 脉冲宽度检测器接收比较器输出信号并产生指示比较器输出信号的脉冲宽度与预定阈值之间的关系的输出信号。 状态机根据脉冲宽度检测器输出信号控制至少一个锁定指示信号的状态。
    • 25. 发明申请
    • LOCK DETECTION CIRCUIT FOR PHASE LOCKED LOOP
    • 锁相环锁定检测电路
    • US20090251226A1
    • 2009-10-08
    • US12416933
    • 2009-04-02
    • Manan KathuriaKumar AbhishekSuhas ChakravartySuri Roopak
    • Manan KathuriaKumar AbhishekSuhas ChakravartySuri Roopak
    • H03L7/095
    • H03L7/095Y10S331/02
    • A lock detector circuit for detecting a lock condition between a reference signal and a feedback signal includes a first counter for outputting a first counter value indicative of a number of clock cycles of the reference signal, and a second counter for outputting a second counter value indicative of a number of clock cycles of the feedback signal. An asynchronous comparator receives the first and second counter values and provides an output signal having a pulse width that is proportional to the difference between the first and second counter values. A pulse width detector receives the comparator output signal and produces an output signal that is indicative of the relationship between the pulse width of the comparator output signal and a predetermined threshold value. A state machine controls the state of at least one lock indication signal according to the pulse width detector output signal.
    • 用于检测参考信号和反馈信号之间的锁定状态的锁定检测器电路包括用于输出指示参考信号的时钟周期数的第一计数器值的第一计数器和用于输出指示的第二计数器值的第二计数器 的反馈信号的多个时钟周期。 异步比较器接收第一和第二计数器值,并提供具有与第一和第二计数器值之间的差成比例的脉冲宽度的输出信号。 脉冲宽度检测器接收比较器输出信号并产生指示比较器输出信号的脉冲宽度与预定阈值之间的关系的输出信号。 状态机根据脉冲宽度检测器输出信号控制至少一个锁定指示信号的状态。
    • 26. 发明申请
    • Control signal synchronization of a scannable storage circuit
    • 可扫描存储电路的控制信号同步
    • US20070255987A1
    • 2007-11-01
    • US11412532
    • 2006-04-27
    • Kumar Abhishek
    • Kumar Abhishek
    • G01R31/28
    • G01R31/318594G01R31/31726
    • A method and/or a system of control signal synchronization of a scannable storage circuit is disclosed. In one embodiment, a digital system includes any number of storage circuits interconnected together with logic circuitry to form at least a portion of a functional circuit. Each of the storage circuits may include an input transmission gate to apply any one of a data input and a scan input to a storage element of the storage circuit based on an input circuitry that considers the state of the scan enable signal and a timing signal of a clock associated with the storage element. In addition, a control signal in a master latch of the storage element may synchronously close a hold loop in the master latch when the input transmission gate is opened upon the timing signal of the clock transitioning to a different state.
    • 公开了一种可扫描存储电路的控制信号同步的方法和/或系统。 在一个实施例中,数字系统包括与逻辑电路互连在一起的任何数量的存储电路,以形成功能电路的至少一部分。 每个存储电路可以包括输入传输门,用于基于考虑扫描使能信号的状态的输入电路和数据输入和扫描输入的定时信号,将数据输入和扫描输入中的任一个应用于存储电路的存储元件 与存储元件相关联的时钟。 此外,当时钟转换到不同状态的定时信号打开输入传输门时,存储元件的主锁存器中的控制信号可以同步地闭合主锁存器中的保持环路。