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    • 22. 发明授权
    • Laser lithography quality alarm system
    • 激光光刻质量报警系统
    • US06408260B1
    • 2002-06-18
    • US09505233
    • 2000-02-16
    • Michael P. C. WattsTom A. Watson
    • Michael P. C. WattsTom A. Watson
    • G06F1500
    • G03F7/70025G03F7/70525G03F7/70591G05B19/00G05B2219/31205G05B2219/31485G07C3/005Y02P90/86
    • An electric discharge laser with an associated programmable controller which (1) will permit an operator to specify beam quality parameters based on historical data (2) will monitor those parameters and (3) will provide a notification signal to the operator informing him when the beam quality is adequate for integrated circuit fabrication. The controller is programmed to indicate an out-of-control condition when one or more quality parameters exhibit certain specified non-random behavior such as two out of three quality measurements deviating by more than 4 standard deviations and/or three out of four quality measurements deviating by more three standard deviations. In a preferred embodiment the program is designed to detect poor quality by looking for these “runs” of bad quantity data and to produce false indication of system out of control, on the average, no more than once each two months.
    • 具有相关可编程控制器的放电激光器(1)将允许操作者基于历史数据(2)指定光束质量参数将监视这些参数,并且(3)将向操作者提供通知信号,以便当光束 质量足以用于集成电路制造。 控制器被编程为当一个或多个质量参数表现出特定的非随机行为时指示失控状态,例如偏离超过4个标准偏差的三个质量测量中的两个和/或四个质量测量中的三分之一 偏离更多的三个标准偏差。 在优选实施例中,该程序旨在通过查找这些“数量”数据的错误来检测质量差,并且每两个月平均不超过一次产生系统失控的虚假指示。
    • 23. 发明授权
    • Low-K dielectric functional imprinting materials
    • 低K电介质功能压印材料
    • US08889332B2
    • 2014-11-18
    • US13172350
    • 2011-06-29
    • Frank Y. XuJun Sung ChunMichael P. C. Watts
    • Frank Y. XuJun Sung ChunMichael P. C. Watts
    • G03F7/028G03F7/038G03F7/075
    • G03F7/0002B82Y10/00B82Y40/00H01L21/76817H01L21/7682H01L2221/1047Y10T428/24545Y10T428/24612
    • A polymerizable composition includes an organic modified silicate selected from the group consisting of silsesquioxanes having the composition RSiO1.5, partially condensed alkoxysilanes, organically modified silicates having the composition RSiO3 and R2SiO2, and partially condensed orthosilicates having the composition SiOR4, where R is an organic substituent; a decomposable organic compound; a photoinitiator; and a release agent. The composition polymerizes upon exposure to UV radiation to form an inorganic silica network, and the decomposable organic compound decomposes upon exposure to heat to form pores in the inorganic silica network. The composition may be used to form a patterned dielectric layer in an integrated circuit device. A metallic film may be disposed on the patterned dielectric layer and then planarized.
    • 可聚合组合物包括选自组成为RSiO 1.5的倍半硅氧烷,部分缩合的烷氧基硅烷,具有组成为RSiO 3和R 2 SiO 2的有机改性硅酸盐和具有组成SiOR 4的部分缩合的原硅酸盐的有机改性硅酸盐,其中R是有机 取代基; 可分解的有机化合物; 光引发剂; 和脱模剂。 组合物在暴露于UV辐射下聚合以形成无机二氧化硅网络,并且可分解有机化合物在暴露于热量时分解,以在无机二氧化硅网络中形成孔隙。 组合物可以用于在集成电路器件中形成图案化的介电层。 金属膜可以设置在图案化的介电层上,然后平坦化。
    • 27. 发明授权
    • Method for film thickness and refractive index determination
    • 薄膜厚度和折射率测定方法
    • US4909631A
    • 1990-03-20
    • US134638
    • 1987-12-18
    • Raul Y. TanDavid W. MyersRobert G. OzarskiJohn F. SchipperMichael P. C. Watts
    • Raul Y. TanDavid W. MyersRobert G. OzarskiJohn F. SchipperMichael P. C. Watts
    • G01B11/06G01N21/41
    • G01N21/41G01B11/065G01N2021/4126
    • Two methods for determination of thickness of a film of known material that is mounted on one face of a solid substrate of known material are disclosed, using: (1) inversion of an optical beam reflectivity equation; or (2) determination of the film thickness that minimizes the variance of the optical beam reflectivity, computed at each of a predetermined sequence of optical beam wavelengths. Four methods for determination of the (real) refractive index of a film of known thickness mounted on a face of a solid substrate of known material are disclosed, using: (1) minimization of absolute differences of computed and measured optical beam reflectivity, summed over a sequence of known film thicknesses, for assumed values of the refractive index; (2 and 3) two iterative techniques of promote convergence of an estimate of the index to a final value of the refractive index; or (4) solution of a quadratic equation whose coefficients are slowly varying functions of the solution variable.
    • 公开了两种用于确定安装在已知材料的固体基板的一个面上的已知材料的膜的厚度的方法:(1)反射光束反射率方程; 或(2)确定在预定的光束波长序列中计算出的光束反射率的方差最小化的膜厚度。 公开了用于确定安装在已知材料的固体基板的表面上的已知厚度的膜的(实际)折射率的四种方法,其使用:(1)最小化计算和测量的光束反射率的绝对差, 已知膜厚度序列,用于折射率的假设值; (2和3)两种迭代技术来促进指数估计与折射率的最终值的收敛; 或(4)二次方程的解,其系数是解变量的缓慢变化函数。