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    • 11. 发明授权
    • Detecting cross-talk on processor links
    • 检测处理器链路上的串扰
    • US09020779B2
    • 2015-04-28
    • US13281097
    • 2011-10-25
    • Robert W. Berry, Jr.Anand HaridassPrasanna Jayaraman
    • Robert W. Berry, Jr.Anand HaridassPrasanna Jayaraman
    • G06F11/263G06F9/30G06F11/34
    • G06F9/30145G06F9/30G06F11/3409G06F11/3414G06F11/3466G06F11/349
    • A first of a plurality of data lanes of a first of a plurality of processor links is determined to have a weakest of base performance measurements for the plurality of data lanes. A switching data pattern is transmitted via a first set of the remainder processor links and a quiet data pattern is transmitted via a second set of the remainder processor links. If performance of the first data lane increases vis-à-vis the corresponding base performance measurement, the first set of remainder processor links is eliminated from the remainder processor links. If performance of the first data lanes decreases vis-à-vis the corresponding base performance measurement, the second set of remainder processor links is eliminated from the remainder processor links. The above operations are repeatedly executed until an aggressor processor link that is determined to decrease performance of the first of the plurality of data lanes is identified.
    • 多个处理器链路中的第一个处理器链路的多个数据通路中的第一个被确定为对于多个数据通道具有最弱的基本性能测量。 经由剩余处理器链路的第一组发送切换数据模式,并且经由剩余处理器链路的第二组发送安静数据模式。 如果第一数据线的性能相对于相应的基本性能测量增加,则剩余处理器链路的第一组从剩余处理器链路中消除。 如果第一数据通道的性能相对于相应的基本性能测量值降低,则剩余处理器链路的第二组从剩余处理器链路中消除。 重复执行上述操作,直到识别出被确定为降低多个数据通道中的第一个数据通道的性能的攻击者处理器链路。
    • 15. 发明授权
    • Pattern generator for memory burn-in and test
    • 图形发生器用于内存老化和测试
    • US6006345A
    • 1999-12-21
    • US853597
    • 1997-05-09
    • Robert W. Berry, Jr.
    • Robert W. Berry, Jr.
    • G11C29/20G11C29/36G11C29/38G06F11/00
    • G11C29/36G11C29/20G11C29/38
    • A system and method for testing of a memory during burn-in is disclosed. In one aspect, the method and system include an address generator. The address generator includes a shift register means. The shift register includes n bit positions. The n bit positions are for storing n bits. The n bits are capable of being in a plurality of patterns. The address generator further includes a counter coupled to the shift register means. The counter includes a value that is incremented in response to a particular pattern of the plurality of patterns. The address generator has a complement mechanism coupled to the shift register and the counter which provides a complement of at least a portion of the n bits stored in the n bit positions in response to the value in the counter. In another aspect, the method and system comprise the address generator previously discussed coupled to the memory undergoing testing. In this aspect, the method and system further have a data generator coupled to the address generator and the memory and compare circuitry coupled to the memory and the data generator. In this aspect, a fail is detected when data from the data generator does not match data stored in the memory.
    • 公开了一种用于在老化期间测试存储器的系统和方法。 一方面,该方法和系统包括地址生成器。 地址发生器包括移位寄存器装置。 移位寄存器包括n位位置。 n位位置用于存储n位。 n位能够处于多个模式。 地址发生器还包括耦合到移位寄存器装置的计数器。 计数器包括响应于多个模式的特定模式而递增的值。 地址发生器具有耦合到移位寄存器和计数器的补码机制,该计数器响应于计数器中的值提供存储在n位位置中的n位的至少一部分的补码。 在另一方面,该方法和系统包括先前讨论的地址生成器,其耦合到正在进行测试的存储器。 在这方面,该方法和系统还具有耦合到地址发生器和存储器的数据发生器,以及耦合到存储器和数据发生器的比较电路。 在这方面,当来自数据发生器的数据与存储在存储器中的数据不匹配时,检测到故障。