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    • 14. 发明授权
    • Functionality based package design for integrated circuit blocks
    • 基于功能的集成电路块封装设计
    • US07024637B2
    • 2006-04-04
    • US10673721
    • 2003-09-29
    • Jeffrey A. HallAritharan Thurairajaratnam
    • Jeffrey A. HallAritharan Thurairajaratnam
    • G06F17/50
    • G06F17/5068H01L2224/73204
    • A method of designing a packaged circuit, including a substrate and a circuit. The circuit is designed with a plurality of standardized functional blocks. Each of the functional blocks has a known function and a known contact pattern. The circuit is designed by selecting desired functional blocks according to functions desired for the circuit. The substrate is designed with a plurality of standardized functional blocks. Each of the functional blocks has a known contact pattern, a known signal trace routing layer pattern, a known ground plane layer pattern, and a known power plane layer pattern. A given one of the substrate functional blocks is associated with a given one of the circuit functional blocks. The substrate is designed by selecting substrate functional blocks associated with the desired ones of the circuit functional blocks.
    • 一种设计包括基板和电路的封装电路的方法。 电路设计有多个标准化的功能块。 每个功能块具有已知的功能和已知的接触图案。 该电路根据电路所需的功能选择所需的功能块来设计。 基板设计有多个标准化的功能块。 每个功能块具有已知的接触图案,已知的信号迹线路由层图案,已知的接地平面图案图案和已知的功率平面图案图案。 给定的一个基板功能块与给定的一个电路功能块相关联。 通过选择与期望的电路功能块相关联的衬底功能块来设计衬底。
    • 17. 发明授权
    • Substrate impedance measurement
    • 基板阻抗测量
    • US06717423B1
    • 2004-04-06
    • US10267814
    • 2002-10-09
    • Aritharan ThurairajaratnamMohan R. Nagar
    • Aritharan ThurairajaratnamMohan R. Nagar
    • G01R3102
    • G01R31/2805G01R1/07314G01R27/04
    • A probe structure with a connector connecting the probe structure to a time domain reflectometry tester, where the connector has a signal conductor and a ground conductor. A back side layer is connected to the connector. A probe side layer with contacts is sandwiched with the back side layer in a layered substrate. The probe side layer has a centrally disposed signal contact and surrounding ground contacts. A conductive layer is disposed between the back side layer and the probe side layer. The conductive layer is connected to the ground conductor of the connector and to the ground contacts of the probe side layer contacts. A via extends from the back side layer to the probe side layer. The via is connected to the signal conductor of the connector, and is also connected to the centrally disposed signal contact of the probe side layer contacts. The via does not make connection with the conductive layer. A first of pins is connected to the signal contact, for making a connection with a structure to be tested on the package substrate. Others of the pins are connected to the ground contacts, for making connections with structures on the package substrate that surround the structure to be tested.
    • 探针结构,其具有将探针结构连接到时域反射测试仪的连接器,其中连接器具有信号导体和接地导体。 背面层连接到连接器。 具有触点的探针侧层与层叠基板中的背面层夹持。 探头侧层具有中心设置的信号触点和周围的接地触点。 导电层设置在背侧层和探针侧层之间。 导电层连接到连接器的接地导体和探头侧层触点的接地触头。 通孔从背侧层延伸到探针侧层。 通孔连接到连接器的信号导体,并且还连接到探头侧层触点的中心布置的信号触点。 通孔不与导电层连接。 第一个引脚连接到信号触点,用于与封装衬底上要测试的结构进行连接。 其他引脚连接到接地触点,用于与围绕待测结构的封装基板上的结构进行连接。
    • 18. 发明授权
    • Integrated circuit package via
    • 集成电路封装通过
    • US06555914B1
    • 2003-04-29
    • US09975871
    • 2001-10-12
    • Aritharan ThurairajaratnamPradip D. PatelManickam ThavarajahHong T. Lim
    • Aritharan ThurairajaratnamPradip D. PatelManickam ThavarajahHong T. Lim
    • H01L2352
    • H05K1/116H01L21/486H01L23/49827H01L2924/0002H05K3/429H05K2201/09545H05K2201/09718H01L2924/00
    • A method of forming a via in a circuit, such that parasitic capacitance is reduced. The surface layers of the circuit are identified, to which continuity with the via is desired, and secondary layers of the circuit are also identified. Via lands are formed only on the surface layers and not on the secondary layers. The via lands are formed in first portions of the surface layers, where the via is to pass through the surface layers. Nonconductive cut outs are formed in second portions of the secondary layers where the via is to pass through the secondary layers. The surface layers and the secondary layers of the circuit are laminated together. The first portions of the surface layers are aligned with the second portions of the secondary layers. A through hole is formed through the via lands formed in the surface layers, and also through the cut outs formed in the secondary layers. The via is formed in the through hole. The parasitic capacitance of the via is reduced by not having via lands on the secondary layers.
    • 一种在电路中形成通孔的方法,使得寄生电容减小。 识别电路的表面层,对通孔的连续性是期望的,并且还识别电路的次级层。 通常的焊盘只形成在表面层上,而不是在次级层上形成。 通孔焊盘形成在表面层的第一部分中,其中通孔将通过表面层。 在第二层的第二部分中形成非导电切口,其中通孔将通过次级层。 电路的表面层和次级层叠在一起。 表层的第一部分与第二层的第二部分对准。 通过形成在表面层中的通孔接合区以及通过形成在次级层中的切口形成通孔。 通孔形成在通孔中。 通过在二级层上没有通孔焊盘来减小通孔的寄生电容。
    • 19. 发明授权
    • Integrated circuit test vehicle
    • 集成电路测试车
    • US06534968B1
    • 2003-03-18
    • US09928071
    • 2001-08-10
    • Leah M. MillerAnand GovindZafer KutluChao-Wen ChungAritharan Thurairajaratnam
    • Leah M. MillerAnand GovindZafer KutluChao-Wen ChungAritharan Thurairajaratnam
    • G01R3100
    • G01R31/04G01R31/2853G01R31/31716H05K1/0268H05K3/3436
    • An apparatus for detecting failures in electrical connections between an integrated circuit package substrate and a circuit board. The substrate has substrate electrical contacts that are electrically connected one to another in first sets in a first region of the substrate. The circuit board has circuit board electrical contacts that are electrically connected one to another in second sets in a second region of the circuit board. The substrate electrical contacts align with and make electrical contact with the circuit board electrical contacts. The first region of the substrate aligns with the second region of the circuit board when the substrate electrical contacts make electrical contact with the circuit board electrical contacts. The first sets of substrate electrical contacts form chains of electrical contacts with the second sets of circuit board electrical contacts. The chains of electrical contacts loop back and forth electrically between the substrate and the circuit board.
    • 一种用于检测集成电路封装衬底和电路板之间的电连接故障的装置。 衬底具有在衬底的第一区域中的第一组中彼此电连接的衬底电触点。 电路板具有在电路板的第二区域中在第二组中彼此电连接的电路板电触点。 基板电触点与电路板电触点对齐并与之电接触。 当基板电触头与电路板电触点电接触时,基板的第一区域与电路板的第二区域对齐。 第一组基板电触点与第二组电路板电触点形成电触点链。 电触头链在基板和电路板之间电连接。