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    • 102. 发明授权
    • Backside structure for BSI image sensor
    • BSI图像传感器的背面结构
    • US09356058B2
    • 2016-05-31
    • US13597007
    • 2012-08-28
    • Chun-Chieh ChuangDun-Nian YaungJen-Cheng LiuWen-De WangKeng-Yu ChouShuang-Ji TsaiMin-Feng Kao
    • Chun-Chieh ChuangDun-Nian YaungJen-Cheng LiuWen-De WangKeng-Yu ChouShuang-Ji TsaiMin-Feng Kao
    • H01L21/311H01L27/146
    • H01L27/1462H01L27/1464H01L27/14685
    • An embodiment method for forming an image sensor includes forming an anti-reflective coating over a surface of a semiconductor supporting a photodiode, forming an etching stop layer over the anti-reflective coating, forming a buffer oxide over the etching stop layer, and selectively removing a portion of the buffer oxide through etching, the etching stop layer protecting the anti-reflective coating during the etching. An embodiment image sensor includes a semiconductor disposed in an array region and in a periphery region, the semiconductor supporting a photodiode in the array region, an anti-reflective coating disposed over a surface of the semiconductor, an etching stop layer disposed over the anti-reflective coating, a thickness of the etching stop layer over the photodiode in the array region less than a thickness of the etching stop layer in the periphery region, and a buffer oxide disposed over the etching stop layer in the periphery region.
    • 用于形成图像传感器的实施例方法包括在支撑光电二极管的半导体的表面上形成抗反射涂层,在抗反射涂层上形成蚀刻停止层,在蚀刻停止层上形成缓冲氧化物,并且选择性地去除 通过蚀刻的缓冲氧化物的一部分,在蚀刻期间保护抗反射涂层的蚀刻停止层。 一种实施方式的图像传感器包括:配置在阵列区域和外围区域中的半导体,支撑阵列区域中的光电二极管的半导体,设置在半导体表面上的抗反射涂层, 在阵列区域中的光电二极管上的蚀刻停止层的厚度小于周边区域中的蚀刻停止层的厚度,以及设置在周边区域的蚀刻停止层上的缓冲氧化物。
    • 107. 发明授权
    • CMOS image sensor chips with stacked scheme and methods for forming the same
    • 具有堆叠方案的CMOS图像传感器芯片及其形成方法
    • US08957358B2
    • 2015-02-17
    • US13571184
    • 2012-08-09
    • Meng-Hsun WanSzu-Ying ChenDun-Nian YaungJen-Cheng Liu
    • Meng-Hsun WanSzu-Ying ChenDun-Nian YaungJen-Cheng Liu
    • H01L27/146
    • H01L27/14634H01L27/14609H01L27/14636H01L27/1464H01L27/1469
    • A device includes an image sensor chip including an image sensor therein. A read-out chip is underlying and bonded to the image sensor chip. The read-out chip includes a logic device selected from the group consisting essentially of a reset transistor, a source follower, a row selector, and combinations thereof therein. The logic device and the image sensor are electrically coupled to each other, and are parts of a same pixel unit. A peripheral circuit chip is underlying and bonded to the read-out chip. The peripheral circuit chip includes a logic circuit, a through via penetrating through a semiconductor substrate of the peripheral circuit chip, and an electrical connector at a bottom surface of the peripheral circuit chip. The electrical connector is electrically coupled to the logic circuit in the peripheral circuit chip through the through via.
    • 一种设备包括其中包括图像传感器的图像传感器芯片。 一个读出的芯片是底层的,并粘贴到图像传感器芯片上。 读出芯片包括从基本上由复位晶体管,源极跟随器,行选择器及其组合组成的组中选择的逻辑器件。 逻辑器件和图像传感器彼此电耦合,并且是相同像素单元的部分。 外围电路芯片是底层的,并与读出的芯片结合。 外围电路芯片包括逻辑电路,穿透外围电路芯片的半导体衬底的贯通孔以及外围电路芯片底面的电连接器。 电连接器通过通孔电耦合到外围电路芯片中的逻辑电路。