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    • 95. 发明授权
    • Test apparatus and method therewith
    • 测试装置及方法
    • US07594444B1
    • 2009-09-29
    • US12258548
    • 2008-10-27
    • Lei LiPing ChenChun-Ying WangShu-Zhen ZhangXiao-Hong HuangChen-Jing Cao
    • Lei LiPing ChenChun-Ying WangShu-Zhen ZhangXiao-Hong HuangChen-Jing Cao
    • G01L5/00
    • G01M99/005
    • A test apparatus for testing a separation force between a housing (92) and a subsidiary element (94) of a portable electronic device (100). The housing defines a plurality of through holes. The subsidiary element is attached to the housing, and covers the through holes. The test apparatus includes: a positioning apparatus (50), a push mechanism (60) and a test machine (70). The positioning apparatus positions the housing with the subsidiary element therein. The push mechanism includes a support board (62) and a plurality of rods (64). The rods are mounted in the support board. The rods pass through the through holes and resisting the subsidiary element. The test machine provides a driven force to press the support board to separate the subsidiary element from the housing.
    • 一种用于测试便携式电子设备(100)的壳体(92)和辅助元件(94)之间的分离力的测试装置。 壳体限定多个通孔。 辅助元件附接到壳体并覆盖通孔。 测试装置包括:定位装置(50),推动机构(60)和测试机(70)。 定位装置将壳体与辅助元件定位在其中。 推动机构包括支撑板(62)和多个杆(64)。 杆安装在支撑板上。 杆穿过通孔并抵抗辅助元件。 测试机提供驱动力以按压支撑板以将辅助元件与壳体分离。
    • 96. 发明申请
    • Optical coherent receiver, frequency offset estimating apparatus and method for optical coherent receiver
    • 光学相干接收机,用于光学相干接收机的频偏估计装置和方法
    • US20090129787A1
    • 2009-05-21
    • US12289072
    • 2008-10-20
    • Lei LiZhenning TaoHisao Nakashima
    • Lei LiZhenning TaoHisao Nakashima
    • H04B10/06
    • H04B10/6164H04B10/61H04B10/613H04B10/6161H04B10/6162H04B10/6165H04B10/63
    • The present invention discloses an optical coherent receiver, and a frequency offset estimating apparatus and a frequency offset estimating method for use in the optical coherent receiver. The optical coherent receiver includes a front end processing section for changing an optical signal into a base band digital electric signal. The frequency offset estimating apparatus comprises a phase offset calculating section, for calculating a phase offset in said base band digital electric signal; a phase offset change calculating section, for calculating a change of said phase offset, namely a phase offset change, in accordance with the phase offset calculated by said phase offset calculating section; an ambiguity deciding section, for deciding whether there is ambiguity in said phase offset change calculated by said phase offset change calculating section, and outputting the phase offset change having no ambiguity; and a loop filtering section, for acquiring a weighted average of the phase offset change outputted by said ambiguity deciding section.
    • 本发明公开了一种光学相干接收机,以及用于光学相干接收机中的频率偏移估计装置和频率偏移估计方法。 光相干接收机包括用于将光信号改变为基带数字电信号的前端处理部分。 所述频偏估计装置包括:相位偏移计算部,用于计算所述基带数字电信号中的相位偏移; 相位偏移改变计算部分,用于根据由所述相位偏移计算部分计算的相位偏移来计算所述相位偏移的变化,即相位偏移改变; 模糊判定部,用于判定由所述相位偏移变化计算部计算出的所述相位偏移变化是否存在歧义,并输出没有模糊性的相位偏移变化; 以及环路滤波部分,用于获取由所述模糊判定部分输出的相位偏移改变的加权平均值。
    • 97. 发明授权
    • Testing system for flatness and parallelism
    • 测量系统的平直度和平行度
    • US07428783B2
    • 2008-09-30
    • US11615896
    • 2006-12-22
    • Lei LiZhi ChengPing ChenAi-Ge SunXue-Liang ZhaiChang-Fa Sun
    • Lei LiZhi ChengPing ChenAi-Ge SunXue-Liang ZhaiChang-Fa Sun
    • G01B5/20G01B7/28
    • G01B5/207G01B5/25G01B5/285
    • A testing system for testing flatness of a surface of a workpiece includes a testing apparatus (10) and a processor (20). The testing apparatus includes a testing box (12) and a measuring apparatus (14). The testing box includes a plurality of holders (122); the holders define a datum plane. The measuring apparatus comprises a plurality of movable testing poles (142) extending out of the testing box and a plurality of gauges (141) configured for measuring distance of the testing poles retracting into the testing box. Ends (1421) of the testing poles away from the testing box are located at the datum plane and configured for supporting the surface of the workpiece thereon to allow the gauges measuring retracting distance of the testing poles under the pressure of the workpiece. The retracting distance of the testing poles is equal to distances between testing points on the surface of the workpieces and the datum plane. The processor is connected to the testing apparatus for receiving and processing testing data that are converted from the retracting distance of the testing poles measured by the gauges.
    • 用于测试工件表面的平整度的测试系统包括测试装置(10)和处理器(20)。 测试装置包括测试箱(12)和测量装置(14)。 测试箱包括多个保持器(122); 支架定义基准平面。 测量装置包括从测试箱延伸出来的多个可动测试极(142)和多个量测器(141),其被配置用于测量测试极回缩到测试箱中的距离。 远离测试箱的测试极的端部(1421)位于基准平面上并且被配置为支撑其上的工件的表面,以允许测量仪在工件的压力下测量测试极的回缩距离。 测试极的回缩距离等于工件表面和基准平面上的测试点之间的距离。 处理器连接到测试装置,用于接收和处理从由量规测量的测试极的回缩距离转换的测试数据。