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    • 91. 发明授权
    • Mass spectrometer
    • 质谱仪
    • US07064319B2
    • 2006-06-20
    • US10401944
    • 2003-03-31
    • Yuichiro HashimotoIzumi WakiKiyomi YoshinariYasushi TeruiTsukasa ShishikaMarvin L. Vestal
    • Yuichiro HashimotoIzumi WakiKiyomi YoshinariYasushi TeruiTsukasa ShishikaMarvin L. Vestal
    • H01J49/42
    • H01J49/4205H01J49/004H01J49/0481H01J49/063H01J49/40
    • A mass spectrometer according to the present invention has an ionization source for generating ions; an ion trap for accumulating the ions; a time-of-flight mass spectrometer for performing mass spectrometry analysis on the ions by use of a flight time; a collision damping chamber disposed between the ion trap and the time-of-flight mass spectrometer and having a plurality of electrodes therein, which produce a multi-pole electric field, wherein a gas is introduced into the collision damping chamber to reduce kinetic energy of the ions ejected from the ion trap; and an ion transmission adjusting mechanism disposed between the ion trap and the collision damping chamber to allow or prevent injection of the ions from the ion trap to the collision damping chamber. The mass spectrometer provides greatly enhanced qualitative and quantitative analysis capabilities, as compared with conventional techniques.
    • 根据本发明的质谱仪具有用于产生离子的电离源; 用于积聚离子的离子阱; 飞行时间质谱仪,用于通过使用飞行时间对离子进行质谱分析; 设置在离子阱和飞行时间质谱仪之间并且具有多个电极的碰撞阻尼室,其产生多极电场,其中气体被引入到碰撞阻尼室中以降低动能 从离子阱排出的离子; 以及设置在所述离子阱和所述碰撞阻尼室之间的离子透射调节机构,以允许或防止离子从所述离子阱向所述碰撞阻尼室注入。 与常规技术相比,质谱仪提供了大大提高的定性和定量分析能力。
    • 92. 发明授权
    • Method for mass calibration
    • 质量校准方法
    • US06194716B1
    • 2001-02-27
    • US09143399
    • 1998-08-28
    • Yasuaki TakadaTakayuki NabeshimaMinoru SakairiYuichiro Hashimoto
    • Yasuaki TakadaTakayuki NabeshimaMinoru SakairiYuichiro Hashimoto
    • B01D5944
    • H01J49/424H01J49/0009H01J49/428
    • A method for performing a mass calibration under an application of a desired ion peak position of mass spectrum attained by a mass scanning of ions of substance having a known value of m/z and the known value of m/z is added with a step for ejecting an amount of unnecessary ions not contributing to the aforesaid mass calibration accumulated in the aforesaid ion trap type mass analysis region prior to the aforesaid mass scanning operation. An accumulation of a large amount of unnecessary ions in the ion trap type mass analysis region is restricted, a disturbance of electric field in the ion trap mass analysis region generated under an influence of a spatial charge caused by accumulation of the unnecessary ions can be prevented and the aforesaid mass calibration can be performed in an easy and accurate manner.
    • 在通过具有已知m / z值的物质的离子的质量扫描和已知的m /​​ z值获得的质谱所需离子峰位置的施加下进行质量校准的方法添加了用于 在上述质量扫描操作之前,排出在上述离子阱型质量分析区域中累积的对上述质量校准无贡献的不需要的离子的量。 离子阱型质量分析区域中的大量不需要的离子的积聚受到限制,可以防止在由不需要的离子的积聚引起的空间电荷的影响下产生的离子阱质量分析区域中的电场的扰动 并且可以容易且准确地进行上述质量校准。
    • 93. 发明申请
    • FLUID SYSTEM
    • 流体系统
    • US20120006425A1
    • 2012-01-12
    • US13181301
    • 2011-07-12
    • Tatsuya HayashiTakashi KanamaruYuichiro Hashimoto
    • Tatsuya HayashiTakashi KanamaruYuichiro Hashimoto
    • F16L3/00
    • F16L23/08F16L3/1066Y10T137/6851
    • In order to simplify a configuration of a fluid system without increasing the number of parts of an intermediate support body while using a common intermediate support body, the fluid system includes a fluid circuit device configured by connecting a plurality of fluid units for controlling or measuring a state of fluid using pipes and pipe joints and a holding mechanism for holding the fluid circuit device, wherein the holding mechanism includes a base member and the intermediate support body interposed between the fluid circuit device and the base member so as to couple the fluid circuit device and the base member, and wherein one end of the intermediate support body is attached to a respective pipe joint and the other end thereof is attached to the base member so that each of the pipe joints is connected to the base member.
    • 为了简化流体系统的构造而不增加中间支撑体的部件的数量,流体系​​统包括流体回路装置,该流体回路装置通过连接多个流体单元来控制或测量 使用管和管接头的流体状态和用于保持流体回路装置的保持机构,其中保持机构包括基部构件和插入在流体回路装置和基部构件之间的中间支撑体,以便连接流体回路装置 和基部构件,并且其中中间支撑体的一端附接到相应的管接头,并且其另一端附接到基座构件,使得每个管接头连接到基座构件。
    • 94. 发明授权
    • Mass spectrometer
    • 质谱仪
    • US08044349B2
    • 2011-10-25
    • US12173328
    • 2008-07-15
    • Hiroyuki SatakeYuichiro HashimotoYasuaki Takada
    • Hiroyuki SatakeYuichiro HashimotoYasuaki Takada
    • H01J49/00
    • H01J49/004H01J49/422H01J49/4255H01J49/427
    • A mass spectrometer includes a linear multipole electrode, an auxiliary electrode that applies a DC potential on the center axis of the linear multipole electrode, and a DC power supply that supplies a DC power to the auxiliary electrode. The DC potential slope formed on the center axis of the multipole electrode is changed according to the measuring condition. The ejection time of ions can be adjusted optimally by adjusting the potential slope so as to satisfy the measuring condition. If the ejection time of ions is shortened, confusion of different ion information items that might otherwise occur on a spectrum can be avoided. If the ejection time of ions is lengthened, detection limit exceeding can be avoided and ions can be measured efficiently, thereby highly efficient ion measurements are always assured.
    • 质谱仪包括线性多极电极,在线性多极电极的中心轴上施加直流电位的辅助电极和向辅助电极提供直流电力的直流电源。 根据测量条件改变在多极电极的中心轴上形成的直流电位斜率。 通过调整电位斜率以满足测量条件,可以最佳地调节离子的喷射时间。 如果离子的喷射时间缩短,则可以避免在光谱上可能发生的不同离子信息项的混淆。 如果离子的喷射时间延长,则可以避免超过检测极限,有效测量离子,从而确保高效的离子测量。
    • 95. 发明授权
    • Microscopic illumination apparatus
    • 显微照明装置
    • US07800821B2
    • 2010-09-21
    • US12284547
    • 2008-09-22
    • Kentaro YamazakiYuichiro Hashimoto
    • Kentaro YamazakiYuichiro Hashimoto
    • G02B21/06G02B27/10
    • G02B21/082G02B21/084
    • An illumination optical system includes a light source section for emitting a beam of substantially parallel rays, a field lens for collecting the beam of substantially parallel rays, a condenser lens for introducing the beam of rays collected by the field lens onto an illumination target surface, and an aperture stop disposed at an entrance-side focal position of the condenser lens. The aperture stop and the light source are in conjugate positional relationship via the collector lens and the field lens. An optical element having different characteristics between the central region and the outer region is arranged in a path of the substantially parallel rays at a position satisfying the condition: 0.03
    • 照明光学系统包括用于发射基本上平行的光束的光源部分,用于收集基本上平行的光束的场透镜,用于将由场透镜收集的光线引入照射目标表面的聚光透镜, 以及设置在聚光透镜的入射侧聚焦位置处的孔径光阑。 孔径光阑和光源通过集光透镜和场透镜呈共轭位置关系。 在中心区域和外部区域之间具有不同特性的光学元件被布置在满足条件:0.03 <| L / fCD | <0.4的位置处的基本上平行的光线的路径中,其中FCD是聚光透镜的焦距 并且L是从照明目标表面到被放置光学元件的位置的最靠近照明目标表面的位置的距离。
    • 96. 发明授权
    • Battery charger with backup charging circuit
    • 电池充电器带备用充电电路
    • US07474079B2
    • 2009-01-06
    • US11680760
    • 2007-03-01
    • Yuichiro Hashimoto
    • Yuichiro Hashimoto
    • H02J7/00H02J7/04H02J7/06
    • H02J7/022H02J7/045
    • A charger capable of safely charging an apparatus even when the current limit value of an external power supply is less than the maximum charging current of the charger or when the battery voltage is low. Charger 100 has backup charging circuit 160 that performs charging using a current that is less than the charging current of charging control section 120. Control circuit 170 performs control so that charging control circuit 123 of charging control section 120 fixes charging control transistor 121 to OFF, makes backup charging circuit 160 operate, and performs backup charging using minute current Ichsub when battery voltage Vb is lower than predetermined value Vbx1, and fixes control transistor 111 of DC/DC converter 110 to ON when supply voltage Vc is less than a first supply voltage value.
    • 即使当外部电源的电流限制值小于充电器的最大充电电流或电池电压低时,也能够对设备进行安全充电的充电器。 充电器100具有使用小于充电控制部分120的充电电流的电流进行充电的备用充电电路160.控制电路170执行控制,使得充电控制部分120的充电控制电路123将充电控制晶体管121固定为OFF, 使备用充电电路160工作,并且当电池电压Vb低于预定值Vbx1时,使用微小电流Ichsub执行备用充电,并且当电源电压Vc小于第一电源电压时,将DC / DC转换器110的控制晶体管111固定为ON 值。
    • 98. 发明授权
    • Microscope and a controlling method thereof
    • 显微镜及其控制方法
    • US07542202B2
    • 2009-06-02
    • US11397981
    • 2006-04-05
    • Yuichiro HashimotoHideyuki Kawanabe
    • Yuichiro HashimotoHideyuki Kawanabe
    • G02B21/00
    • G02B21/241G02B21/248
    • A microscope includes a switching mechanism which has a plurality of lens units, and which inserts a selected lens unit of the plurality of lens units into an observation light path and disposes the non-selected other lens units outside the observation light path. A control unit controls a movement speed of a stage, onto which a sample is placed, in an optical axis direction according to an observation power of the selected lens unit inserted into the observation light path. The plurality of lens units include: (i) a plurality of fixed-power lens units which are lens units including a combination of imaging lenses and objective lenses, and whose observation powers when observing the sample mutually differ, and (ii) a zoom lens unit which has a continuously changeable observation power.
    • 显微镜包括具有多个透镜单元的切换机构,并且将多个透镜单元的所选择的透镜单元插入到观察光路中,并将未选择的其它透镜单元配置在观察光路的外部。 控制单元根据插入观察光路中的所选择的透镜单元的观察功率,在光轴方向上控制放置有样品的载物台的移动速度。 多个透镜单元包括:(i)多个固定功率透镜单元,其是包括成像透镜和物镜的组合的透镜单元,并且其在观察样本时的观察功率相互不同,以及(ii)变焦透镜 具有不断变化的观察功率的单元。
    • 99. 发明授权
    • Microscopic illumination apparatus
    • 显微照明装置
    • US07443578B2
    • 2008-10-28
    • US11491084
    • 2006-07-24
    • Kentaro YamazakiYuichiro Hashimoto
    • Kentaro YamazakiYuichiro Hashimoto
    • G02B21/06G02B27/10
    • G02B21/082G02B21/084
    • An illumination optical system includes a light source section for emitting a beam of substantially parallel rays, a field lens for collecting the beam of substantially parallel rays, a condenser lens for introducing the beam of rays collected by the field lens onto an illumination target surface, and an aperture stop disposed at an entrance-side focal position of the condenser lens. The aperture stop and the light source are in conjugate positional relationship via the collector lens and the field lens. An optical element having different characteristics between the central region and the outer region is arranged in a path of the substantially parallel rays at a position satisfying the condition: 0.03
    • 照明光学系统包括用于发射基本上平行的光束的光源部分,用于收集基本上平行的光束的场透镜,用于将由场透镜收集的光线引入照射目标表面的聚光透镜, 以及设置在聚光透镜的入射侧聚焦位置处的孔径光阑。 孔径光阑和光源通过集光透镜和场透镜呈共轭位置关系。 在中心区域和外部区域之间具有不同特性的光学元件被布置在基本上平行的光线的路径中,满足以下条件的位置:<?in-line-formula description =“In-line Formulas”end =“lead “>> 0.03 <| L / f <0.4 <?in-line-formula description =”In-line Formulas“end =”tail“?>其中F < SUB>是聚光透镜的焦距,L是从照明目标表面到位于其上投射光学元件的位置的距离最接近照明目标表面的距离。
    • 100. 发明申请
    • Mass spectrometer
    • 质谱仪
    • US20080185516A1
    • 2008-08-07
    • US12078523
    • 2008-04-01
    • Takashi BabaYuichiro Hashimoto
    • Takashi BabaYuichiro Hashimoto
    • H01J49/00
    • H01J49/4225H01J49/0054H01J49/422
    • The present invention provides a mass spectrometry capable of high-efficiency and high-throughput ECD. An electron source and a two-dimensional combined ion trap in which a magnetic field along and generally parallel to a central axis is applied are used, thereby to achieve the foregoing object. First, precursor ions are trapped. By adopting the two-dimensional combined ion trap, it is possible to obtain a high ion trapping efficiency upon being injected and trapping. Subsequently, electrons are made incident thereon in such a manner as to be wound along the central axis to which no radio frequency is applied by using a magnetic field. For this reason, it is possible to allow energy-controlled electrons to reach the precursor ions. It is possible to implement a mass spectrometer capable of avoiding heating due to a radio frequency electric field, and effecting high-throughput/high-efficiency ECD.
    • 本发明提供能够实现高效率和高通量ECD的质谱。 使用其中施加沿着并且大致平行于中心轴的磁场的电子源和二维组合离子阱,从而实现上述目的。 首先,前体离子被捕获。 通过采用二维组合离子阱,可以在注入和捕获时获得高离子捕获效率。 随后,使电子以这样的方式入射,即沿着不通过使用磁场施加射频的中心轴缠绕。 因此,可以使能量控制的电子达到前体离子。 可以实现能够避免由于射频电场引起的加热并且实现高通量/高效率ECD的质谱仪。