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    • 4. 发明授权
    • Method and apparatus for reducing wafer to wafer deposition variation
    • 用于减小晶片到晶片沉积变化的方法和装置
    • US06417014B1
    • 2002-07-09
    • US09421184
    • 1999-10-19
    • Kin-Sang LamSey-Ping Sun
    • Kin-Sang LamSey-Ping Sun
    • G01R3126
    • H01L22/20Y10S414/135
    • A processing line includes a processing tool and an automatic process controller. The processing tool is adapted to deposit a layer of material on a semiconductor wafer based on an operating recipe. The automatic process controller is adapted to identify a post-idle set of wafers to be processed in the processing tool after an idle period, determine deposition times for wafers in the set of post-idle wafers, and modify the operating recipe of the processing tool for each of the wafers in the post-idle set based on the deposition times. A method for reducing wafer to wafer deposition variation includes designating a set of post-idle wafers; determining a deposition time for each of the wafers in the post-idle set, at least two of the deposition times being different; and depositing a layer on the wafers in the post-idle set based on the deposition times determined.
    • 处理线包括处理工具和自动过程控制器。 该处理工具适于基于操作配方在半导体晶片上沉积材料层。 自动过程控制器适于在空闲时段之后识别在处理工具中待处理的待处理晶片组,确定在一组后空闲晶片中的晶片的沉积时间,并修改处理工具的操作配方 基于沉积时间对后置怠速组中的每个晶片进行。 一种用于减少晶片到晶片沉积变化的方法包括指定一组后空闲晶片; 确定后置怠速组中每个晶片的沉积时间,至少两个沉积时间不同; 以及基于所确定的沉积时间,在后置怠速组中的晶片上沉积一层。