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    • 1. 发明公开
    • 관통 레지스트 금속 도금을 위한 웨팅 전처리의 방법들 및 장치
    • 用于通过金属镀层浸润预处理的方法和装置
    • KR1020130105465A
    • 2013-09-25
    • KR1020130026323
    • 2013-03-12
    • 노벨러스 시스템즈, 인코포레이티드
    • 버클류브라이언엘메이어스티븐티폰누스와미토마스에이레쉬로버트블랙맨브라이언히글리더그
    • H01L21/302H01L21/288
    • H01L21/67028
    • PURPOSE: Wetting pretreatment methods for through resist metal plating and an apparatus thereof are provided to easily manufacture an integrated circuit by pre-wetting a semiconductor wafer. CONSTITUTION: A wafer substrate has features (1605). A degasser degases pre-wetting fluid (1615). A vacuum port forms a subatmospheric pressure within a process chamber. A wafer holder rotates the wafer substrate (1620). The process chamber includes a fluid inlet. [Reference numerals] (1605) Wafer substrate with a set of features recessed in a process chamber is provided; (1610) Pressure of the process chamber is reduced below the atmospheric pressure; (1615) Degasser degases pre-wetting fluid; (1620) Wafer holder rotates the wafer substrate; (1625) Below the atmospheric pressure, the wafer substrate rotating at a certain speed comes into contact with the degased pre-wetting fluid at a flow rate which is sufficient to remove particles of the recessed features; (AA) Start; (BB) End
    • 目的:通过抗蚀剂金属电镀的润湿预处理方法及其装置被提供以通过预浸湿半导体晶片容易地制造集成电路。 构成:晶片衬底具有特征(1605)。 脱气器脱湿预润湿流体(1615)。 真空端口在处理室内形成低于大气压的压力。 晶片保持器旋转晶片衬底(1620)。 处理室包括流体入口。 (1605)提供具有凹陷在处理室中的一组特征的晶片基板; (1610)处理室的压力降低到大气压以下; (1615)脱气机使预润湿液体脱模; (1620)晶片支架旋转晶片基板; (1625)低于大气压力,以一定速度旋转的晶片基板以与足够去除凹陷特征的颗粒的流速相接触脱模的预润湿流体; (AA)开始; (BB)结束
    • 2. 发明公开
    • 합금 도금 시스템에서 패시베이션으로부터 애노드 보호
    • 保护阳极从合金镀层系统的钝化
    • KR1020130136941A
    • 2013-12-13
    • KR1020130064985
    • 2013-06-05
    • 노벨러스 시스템즈, 인코포레이티드
    • 추아리펑메이어스티븐티포터데이비드더블유폰누스와미토마스에이
    • C25D17/00C25D17/10
    • C25D21/18C25D3/60C25D5/00C25D17/001C25D17/002C25D17/10C25D21/06
    • An apparatus for continuously and simultaneously plating two kinds of metal having standard electronic potentials (e.g. for depositing Sn-Ag alloys) comprises: an anode chamber for housing an anode liquid which includes the ions of less precious first metal (e. g. Sn), but does not include more precious metal (e. g. Ag) and active anodes; a cathode chamber for housing an cathode liquid, which includes the ions of first metal (e. g. Sn) and of more precious metal (e. g. Ag), and a substrate; a separation structure, which is a separation structure arranged between the anode chamber and the cathode chamber, actually preventing the more precious metal from being transferred from the cathode liquid to the anode liquid; and fluid features and a control unit related to the fluid features which are coupled to the apparatus, formed to continuously perform electronic plating and to actually maintain the constant concentration of the components of a plating bath during the extended period of use. [Reference numerals] (AA) Vent;(BB) And;(CC) New anode liquid: H^+, Sn^2+, H_2O
    • 用于连续并同时镀覆具有标准电位(例如用于沉积Sn-Ag合金)的两种金属的装置包括:阳极室,用于容纳包含较不贵的第一金属(例如Sn)的离子的阳极液体,但是 不含贵金属(如Ag)和活性阳极; 用于容纳阴极液体的阴极室,其包括第一金属(例如Sn)和更贵金属(例如Ag)的离子和基底; 分离结构,其是布置在阳极室和阴极室之间的分离结构,实际上防止了更多的贵金属从阴极液体转移到阳极液体; 以及流体特征和与流体特征有关的控制单元,其耦合到装置,形成为连续执行电子电镀,并且在长时间使用期间实际上保持电镀液的组分的恒定浓度。 (AA)通风口(BB)和(CC)新型阳极液体:H +,Sn - 2 +,H_2O