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    • 31. 发明公开
    • 결합된 물체 캡처 시스템과 디스플레이 장치 및 관련 방법
    • 组合对象捕获系统和显示设备及相关方法
    • KR1020100074254A
    • 2010-07-01
    • KR1020107009979
    • 2008-10-02
    • 아르텍 그룹, 아이엔씨.
    • 라파,얀,엔.
    • G06T17/00G06T15/00
    • G01B11/25
    • An combined object capturing system and display device and associated method are provided for capturing and measuring an object near a display device. The object capturing system may include at least one projection device for projecting a structured light pattern onto a surface of the object, at least one detection device for capturing at least one image of the structured light pattern acting on the surface of the object, and a computing device for determining a measurement relating to the captured image. The display device may provide a position for the object to assume with respect to the object capturing system. The object capturing system may be combined with, attached to or otherwise positioned alongside the display device. The measurement may be processed constantly and may determine a level of use of the display device, a computer connected to the display device or any device connected to the display device.
    • 提供组合对象捕获系统和显示装置及相关联的方法用于捕获和测量显示装置附近的物体。 物体捕获系统可以包括用于将结构化光图案投射到物体的表面上的至少一个投影装置,用于捕获作用在物体表面上的结构化光图案的至少一个图像的至少一个检测装置,以及 用于确定与所捕获图像有关的测量的计算装置。 显示装置可以提供对象相对于对象捕获系统采取的位置。 对象捕获系统可以与显示装置组合,附接或以其他方式定位在显示装置旁边。 测量可以不断地处理,并且可以确定显示设备,连接到显示设备的计算机或连接到显示设备的任何设备的使用水平。
    • 34. 发明公开
    • THREE-DIMENSIONAL IMAGE MEASURING APPARATUS USING SHADOW MOIRE
    • 三维图像测量装置使用阴影
    • KR20080097165A
    • 2008-11-04
    • KR20080099590
    • 2008-10-10
    • KOH YOUNG TECH INC
    • JEON MOON YOUNGYUN SANG KYU
    • G01B11/24G01B11/00G01B11/25
    • G01B11/25G01B11/2433G02B27/60
    • A three dimensional shape measurement system using the shadow moire can three dimensional shape of the measurement object regardless of the shape by switching on/off a plurality of lighting units selectively. A three dimensional shape measurement system using the shadow moire comprises a lattice(110), a lattice transport unit(120), a beam splitter(130), an auxiliary lighting unit(140), an imaging unit(150), a plurality of lighting units, and a controller(170). The lattice is installed on the upper side of a work stage(101) transferring a measurement object(102) to the measurement position. The lattice transport unit is loaded with the lattice and transfers the loaded lattice. The beam splitter irradiates a first illumination to the lattice or transmits the reflection image of the measurement object reflected through the lattice. The auxiliary lighting unit irradiates the first illumination to the beam splitter. The imaging unit takes the reflection image penetrating the beam splitter. The lighting units are inclined about the imaging unit in order to be located in the upper of lattice and arranged at regular angle intervals, and irradiate a second illumination to the lattice. The controller controls the lattice transport unit, the auxiliary lighting unit, the imaging unit and the lighting units. In particular, the controller receives the reflection image from the imaging unit and measures three dimensional shape of the measurement object, and controls on/off of the lighting units according to the shape of the measurement object.
    • 使用阴影波纹的三维形状测量系统可以通过选择性地接通/关闭多个照明单元而与测量对象的三维形状无关地形状。 使用阴影波纹的三维形状测量系统包括格子(110),格子输送单元(120),分束器(130),辅助照明单元(140),成像单元(150),多个 照明单元和控制器(170)。 格子安装在将测量对象(102)传送到测量位置的工作台(101)的上侧。 晶格传输单元装载有晶格并传送加载的晶格。 分束器将第一照明照射到格子,或透射通过格子反射的测量对象的反射图像。 辅助照明单元将第一照明照射到分束器。 成像单元将穿透分束器的反射图像。 照明单元围绕成像单元倾斜以便位于格子的上部并以规则的角度间隔布置,并且将第二照明照射到格子上。 控制器控制晶格传输单元,辅助照明单元,成像单元和照明单元。 特别地,控制器从成像单元接收反射图像并测量测量对象的三维形状,并且根据测量对象的形状控制照明单元的开/关。
    • 35. 发明公开
    • 입체 형상 검사 장치 및 그를 이용한 입체 형상 검사 방법
    • 检查三维形状的装置及其检测方法
    • KR1020080088946A
    • 2008-10-06
    • KR1020070031863
    • 2007-03-30
    • (주) 인텍플러스
    • 임쌍근이상윤강민구
    • G01B11/24G01B11/25G01N21/88
    • G01B11/25
    • An apparatus for inspecting a three-dimensional shape and an inspecting method using the same are provided to enhance reliability and accuracy of inspection by adjusting the reflectivity of each pixel. An apparatus for inspecting a three-dimensional shape comprises a light source(100), a grid pattern forming unit(110), and an imaging unit(120). The grid pattern forming unit generates a grid pattern on the surface of an object(P) to be inspected by changing the light generated from the light source. The imaging unit captures an image reflected from the surface. The three-dimensional shape of the object is measured from the captured image to detect whether the object has defects. The grid pattern forming unit includes a display control unit(111) in each pixel to form a predetermined grid pattern by controlling the brightness in each pixel according to the surface reflectivity of the object to be inspected.
    • 提供一种用于检查三维形状的装置和使用其的检查方法,以通过调整每个像素的反射率来提高检查的可靠性和准确性。 用于检查三维形状的装置包括光源(100),网格图案形成单元(110)和成像单元(120)。 网格图案形成单元通过改变从光源产生的光来在要检查的物体(P)的表面上产生网格图案。 成像单元捕获从表面反射的图像。 从拍摄图像中测量对象的三维形状,以检测对象是否具有缺陷。 栅格图案形成单元包括每个像素中的显示控制单元(111),以通过根据待检查对象的表面反射率控制每个像素中的亮度来形成预定的栅格图案。
    • 37. 发明授权
    • 실내 환경의 환경맵 생성 장치 및 방법
    • 用于创建室内电路电路图的装置和方法
    • KR100757751B1
    • 2007-09-11
    • KR1020060049572
    • 2006-06-01
    • 한국과학기술연구원한국전자통신연구원
    • 권용무조상우
    • G06T17/00G06T15/00
    • G06T17/05G01B11/25G01B2210/146G06T7/13
    • An apparatus and a method for generating an indoor environment map are provided to convert geometry data acquired from indoor environment into line-based geometry data of a little quantity and generate the environment map by using the line-based geometry data. A geometry data acquiring unit(210) acquires geometry data indicating structure information of indoor environment. An image acquiring unit(220) acquires image data indicating image information of the indoor environment. A position information acquiring unit(230) acquires position information of the geometry data acquiring unit(210) and the image acquiring unit(220). A processor(250) converts the geometry data into line-based geometry data. A 2D environment map generating unit(260) generates a 2D environment map by using the line-based geometry data. A 3D mixes the line-based geometry data with the image data on the basis of the position information, and generates a 3D environment map. A data storing unit(240) stores the geometry data, the image data, the position information, and the line-based geometry data.
    • 提供了一种用于产生室内环境地图的装置和方法,用于将从室内环境获取的几何数据转换为少量的基于线的几何数据,并通过使用基于线的几何数据生成环境地图。 几何数据获取单元(210)获取表示室内环境的结构信息的几何数据。 图像获取单元(220)获取指示室内环境的图像信息的图像数据。 位置信息获取单元(230)获取几何数据获取单元(210)和图像获取单元(220)的位置信息。 处理器(250)将几何数据转换成基于线的几何数据。 2D环境地图生成单元(260)通过使用基于行的几何数据来生成2D环境地图。 基于位置信息,3D将基于线的几何数据与图像数据进行混合,并生成3D环境图。 数据存储单元(240)存储几何数据,图像数据,位置信息和基于线的几何数据。
    • 39. 发明授权
    • 다중광속을 이용한 곡률 측정 장치와 방법
    • 使用阵列多光束测量曲率的装置和方法
    • KR100669040B1
    • 2007-01-16
    • KR1020060052025
    • 2006-06-09
    • 주식회사 나노트론
    • 기봉윤의준
    • G01B11/24G01L1/24
    • G01B11/25
    • An apparatus for measuring curvature using arrayed multiple beams and a method thereof are provided to project the vertical incidence angle by using the view port and to reduce size by using the VCSEL or LD array. An apparatus(T1) for measuring curvature is composed of an m x n light source array(10) for generating the m x n multiple beam; a single collimating lens unit making the m x n multiple beam generated from the m x n light source array into an m x n non-parallel beam(C2) and projecting the m x n non-parallel beam on the sample surface; and a detector(40) for measuring the interval change between the m x n spot arrays of the m x n multiple beam reflected from the sample surface.
    • 提供一种使用阵列多光束测量曲率的装置及其方法,以通过使用视口来投影垂直入射角,并通过使用VCSEL或LD阵列来减小尺寸。 用于测量曲率的装置(T1)由用于产生m×n多光束的m×n光源阵列(10)组成; 使得从m×n光源阵列产生的m×n多光束成为m×n个非平行光束(C2)并将m×n个非平行光束投影在样品表面上的单个准直透镜单元; 以及用于测量从样品表面反射的m×n多光束的m×n光点阵列之间的间隔变化的检测器(40)。